학술논문
'학술논문'
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Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(4):2565-2569 Apr, 2024
Conference
Ercolano, F.; Balestra, L.; Krause, S.; Leone, S.; Streicher, I.; Waltereit, P.; Dammann, M.; Reggiani, S.
2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-7 Oct, 2023
Academic Journal
Reggiani, S.; Balestra, L.; Gnudi, A.; Gnani, E.; Baccarani, G.; Dobrzynska, J.; Vobecký, J.; Tosi, C.
In Microelectronics Reliability September 2018 88-90:1094-1097
Academic Journal
IEEE Access Access, IEEE. 11:6293-6298 2023
Academic Journal
Reggiani, S.; Balestra, L.; Gnudi, A.; Gnani, E.; Baccarani, G.; Dobrzynska, J.; Vobecky, J.; Tosi, C.
IEEE Journal of Emerging and Selected Topics in Power Electronics IEEE J. Emerg. Sel. Topics Power Electron. Emerging and Selected Topics in Power Electronics, IEEE Journal of. 9(2):2155-2162 Apr, 2021
Academic Journal
Balestra, L.; Cirioni, L.; Cavallini, A.; Reggiani, S.; Rossetti, M.; Gallo, M.; Guarnera, S.; Depetro, R.
In: Solid-State Electronics . (Solid-State Electronics, October 2023, 208)
Academic Journal
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 9:431-440 2021
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(11):4645-4648 Nov, 2020
Academic Journal
In: Journal of Applied Physics . (Journal of Applied Physics, 7 December 2022, 132(21))
Academic Journal
In: Solid-State Electronics . (Solid-State Electronics, August 2022, 194)
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[AR] Balestra, L.
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