학술논문
'학술논문'
에서 검색결과 679건 | 목록
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Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(4):2565-2569 Apr, 2024
Academic Journal
In Solid State Electronics November 2021 185
Conference
Ercolano, F.; Balestra, L.; Krause, S.; Leone, S.; Streicher, I.; Waltereit, P.; Dammann, M.; Reggiani, S.
2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-7 Oct, 2023
Academic Journal
In Solid State Electronics June 2020 168
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(9):4953-4957 Sep, 2023
Academic Journal
In Solid State Electronics September 2019 159:38-42
Academic Journal
Reggiani, S.; Rossetti, M.; Gnudi, A.; Tallarico, A.N.; Molfese, A.; Manzini, S.; Depetro, R.; Croce, G.; Sangiorgi, E.; Fiegna, C.
In Microelectronics Reliability September 2018 88-90:1090-1093
Academic Journal
Cornigli, D.; Reggiani, S.; Gnudi, A.; Gnani, E.; Baccarani, G.; Fabiani, D.; Varghese, D.; Tuncer, E.; Krishnan, S.; Nguyen, L.
In Microelectronics Reliability September 2018 88-90:752-755
Academic Journal
Reggiani, S.; Balestra, L.; Gnudi, A.; Gnani, E.; Baccarani, G.; Dobrzynska, J.; Vobecký, J.; Tosi, C.
In Microelectronics Reliability September 2018 88-90:1094-1097
Academic Journal
Tallarico, A.N.; Reggiani, S.; Magnone, P.; Croce, G.; Depetro, R.; Gattari, P.; Sangiorgi, E.; Fiegna, C.
In Microelectronics Reliability September 2017 76-77:475-479
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[AR] Reggiani, S.
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