학술논문
Neighbor selection for variance reduction in I/sub DDQ/ and other parametric data
Document Type
Conference
Author
Source
Proceedings. International Test Conference International test conference Test Conference, 2002. Proceedings. International. :1240-1248 2002
Subject
Language
ISSN
1089-3539
Abstract
The subject of this paper is variance reduction and nearest neighbor residual estimates for I/sub DDQ/ and other continuous-valued test measurements. The key, new concept introduced is data-driven neighborhood identification about a die to reduce the variance of good and faulty I/sub DDQ/ distributions. Using LSI Logic production data, neighborhood selection techniques are demonstrated. The main contribution of the paper is variance reduction by the systematic use of the die location and wafer- or lot-level patterns and improved identification of die outliers of continuous-valued test data such as I/sub DDQ/.