학술논문
Single Event Effect Similarities between Heavy Ions and LASER tests in Advanced CMOS Image Sensors
Document Type
Conference
Source
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2019 19th European Conference on. :1-4 Sep, 2019
Subject
Language
ISSN
1609-0438
Abstract
This paper focuses on the similarities between heavy ions and LASER tests to evaluate single event effect in front-side and back-side illuminated CMOS image sensors using last generation imaging process. The results highlight the sensitivity to these devices to single event and combined results provide information related to layout architecture sensitivity.