학술논문
'학술논문'
에서 검색결과 49건 | 목록
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Academic Journal
Tan, H.T.; Gao, Y.; Syaranamual, G.J.; Sasangka, W.A.; Foo, S.C.; Lee, K.H.; Arulkumaran, S.; Ng, G.I.; Thompson, C.V.; Gan, C.L.
In Microelectronics Reliability November 2023 150
Academic Journal
In Microelectronics Reliability September 2019 100-101
Academic Journal
In Microelectronics Reliability September 2018 88-90:393-396
Academic Journal
Made, R.I; Gao, Yu; Syaranamual, G.J.; Sasangka, W.A.; Zhang, L.; Nguyen, Xuan Sang; Tay, Y.Y.; Herrin, J.S.; Thompson, C.V.; Gan, C.L.
In Microelectronics Reliability September 2017 76-77:561-565
Academic Journal
In Microelectronics Reliability September 2017 76-77:287-291
Academic Journal
Syaranamual, G.J.; Sasangka, W.A.; Made, R.I.; Arulkumaran, S.; Ng, G.I.; Foo, S.C.; Gan, C.L.; Thompson, C.V.
In Microelectronics Reliability September 2016 64:589-593
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(11):4435-4441 Nov, 2017
Conference
18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the. :1-6 Jul, 2011
Academic Journal
Seah, G.L.; Wang, L.; Tan, L.F.; Tipjanrawee, C.; Sasangka, W.A.; Tan, K.W.; Usadi, A.K.; McConnachie, J.M.
In: ACS Applied Materials and Interfaces . (ACS Applied Materials and Interfaces, 4 August 2021, 13(30):36117-36129)
Academic Journal
Lee, K.H.; Wang, Y.; Wang, B.; Zhang, L.; Sasangka, W.A.; Goh, S.C.; Bao, S.; Lee, K.E.; Fitzgerald, E.A.; Tan, C.S.
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 6:571-578 2018
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[AR] Sasangka, W.A.
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