학술논문
'학술논문'
에서 검색결과 49건 | 목록
1~10
Academic Journal
Tan, H.T.; Gao, Y.; Syaranamual, G.J.; Sasangka, W.A.; Foo, S.C.; Lee, K.H.; Arulkumaran, S.; Ng, G.I.; Thompson, C.V.; Gan, C.L.
In Microelectronics Reliability November 2023 150
Academic Journal
In Microelectronics Reliability September 2019 100-101
Academic Journal
In Microelectronics Reliability September 2018 88-90:393-396
Academic Journal
Made, R.I; Gao, Yu; Syaranamual, G.J.; Sasangka, W.A.; Zhang, L.; Nguyen, Xuan Sang; Tay, Y.Y.; Herrin, J.S.; Thompson, C.V.; Gan, C.L.
In Microelectronics Reliability September 2017 76-77:561-565
Academic Journal
In Microelectronics Reliability September 2017 76-77:287-291
Academic Journal
Syaranamual, G.J.; Sasangka, W.A.; Made, R.I.; Arulkumaran, S.; Ng, G.I.; Foo, S.C.; Gan, C.L.; Thompson, C.V.
In Microelectronics Reliability September 2016 64:589-593
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(11):4435-4441 Nov, 2017
Academic Journal
Seah, G.L.; Wang, L.; Tan, L.F.; Tipjanrawee, C.; Sasangka, W.A.; Tan, K.W.; Usadi, A.K.; McConnachie, J.M.
In: ACS Applied Materials and Interfaces . (ACS Applied Materials and Interfaces, 4 August 2021, 13(30):36117-36129)
Conference
18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the. :1-6 Jul, 2011
Academic Journal
In: Langmuir . (Langmuir, 15 September 2020, 36(36):10803-10810)
검색 결과 제한하기
제한된 항목
[AR] Sasangka, W.A.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어