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Conference
Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) International test conference Test Conference, 1998. Proceedings., International. :872-881 1998
Conference
Proceedings on Bipolar Circuits and Technology Meeting Bipolar Circuits and Technology Meeting, 1990., Proceedings of the 1990. :110-113 1990
Conference
Proceedings of IEEE International Electron Devices Meeting Electron devices Electron Devices Meeting, 1993. IEDM '93. Technical Digest., International. :251-254 1993
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 11(4):149-152 Apr, 1990
Academic Journal
Henriquez, Dacia D. C. A.Gillissen, AdaSmith, Sharissa M.Cramer, Roos A.van den Akker, ThomasZwart, Joost J.van Roosmalen, Jos J. M.Bloemenkamp, Kitty W. M.van der Bom, Johanna G.Adriaanse, H.J.van den Akker, E.S.A.Baas, M.I.Bank, C.M.C.van Beek, E.de Boer, B.A.de Boer, K.van der Borden, D.M.R.Bremer, H.A.Brons, J.T.J.Burggraaff, J.M.Ceelie, H.Chon, H.Cikot, J.L.M.Delemarre, F.M.C.Diris, J.H.C.Kleffens, M. Doesburg- Vanvan Dooren, I.M.A.van Duijnhoven, J.L.P.van Dunné, F.M.Duvekot, J.J.Engbers, P.Hulst, M. J. W. Van Etten-VanFeitsma, H.Fouraux, M.A.Franssen, M.T.M.Frasa, M.A.M.van Gammeren, A.J.van Gemund, N.van der Graaf, F.de Groot, C.J.M.Hackeng, C.M.van der Ham, D.P.Hanssen, M.J.C.P.Hasaart, T.H.M.Hendriks, H.A.Henskens, Y.M.C.Hermsen, B.B.J.Hogenboom, S.Hooker, A.Hudig, F.Huijssoon, A.M.G.Huisjes, A.J.M.Jonker, N.Kabel, P.J.van Kampen, C.de Keijzer, M.H.van de Kerkhof, D.H.Keuren, J. F. W.Kleiverda, G.Klinkspoor, J.H.Koehorst, S.G.A.Kok, M.Kok, R.D.de Kok, J.B.Koops, A.Kortlandt, W.Langenveld, J.Leers, M.P.G.Leyte, A.de Mare, A.Martens, G.D.M.Meekers, J.H.van Meir, C.A.Metz, G.C.H.Michielse, E.C.H.J.Mostert, L. J.Bijvank, S. W. H. NijOostenveld, E.Osmanovic, N.Oudijk, M.A.Pagano Mirani-Oostdijk, C.van Pampus, E.C.M.Papatsonis, D.N.M.Peters, R.H.M.Ponjee, G.A.E.Pontesilli, M.Porath, M.M.Post, M.S.Pouwels, J.G.J.Prinzen, L.Roelofsen, J.M.T.Rondeel, J.J.M.van der Salm, P.C.M.Scheepers, H.C.J.Schippers, D.H.Schuitemaker, N.W.E.Sikkema, J.M.Slomp, J.Smit, J.W.Lange, Y. S. Snuif-devan der Stappen, J.W.J.Steures, P.Tax, G. H. M.Treskes, M.Ulenkate, H.J.L.M.van Unnik, G.A.van der Veen, B.S.Verhagen, T.E.M.Versendaal, J.Visschers, B.Visser, O.Visser, H.de Vooght, K.M.K.de Vries, M.J.de Waard, H.Weerkamp, F.Weinans, M.J.N.de Wet, H.van Wijnen, M.van Wijngaarden, W.J.de Wit, A.C.Woiski, M.D.
BMC Pregnancy and Childbirth. October 17, 2019, Vol. 19 Issue 1
Conference
Proceedings of the Bipolar Circuits and Technology Meeting Bipolar Circuits and Technology Meeting, 1989., Proceedings of the 1989. :160-163 1989
Conference
Proceedings of the 1988 Bipolar Circuits and Technology Meeting, Bipolar Circuits and Technology Meeting, 1988., Proceedings of the 1988. :91-94 1988
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 12(2):81-82 Feb, 1991
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[검색어] van Wijnen, P.J.
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