부산대학교 도서관

Quackenbush, NF; Wangoh, L; Scanlon, DO; Zhang, R; Chung, Y; Chen, Z; Wen, B; Lin, Y; Woicik, JC; Chernova, NA; Ong, SP; Whittingham, MS; Piper, LFJ

Chemistry of Materials. 27(24)

Quackenbush, NF; Wangoh, L; Scanlon, DO; Zhang, R; Chung, Y; Chen, Z; Wen, B; Lin, Y; Woicik, JC; Chernova, NA; Ong, SP; Whittingham, MS; Piper, LFJ

Chemistry of Materials. 27(24)

Tan, Zhengquan; Budnick, JI; Bouldin, CE; Woicik, JC; Cheong, S-W; Cooper, AS; Espinosa, GP; Fisk, Z

Physical Review B. 42(1)

Shirley EL; Sensor Science Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA. eric.shirley@nist.gov.; Woicik JC; Materials Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA. joseph.woicik@nist.gov.

Publisher: Royal Society of Chemistry Country of Publication: England NLM ID: 100888160 Publication Model: Electronic Cited Medium: Internet ISSN: 1463-9084 (Electronic) Linking ISSN: 14639076 NLM ISO Abbreviation: Phys Chem Chem Phys Subsets: PubMed not MEDLINE; MEDLINE

Shirley EL; Sensor Science Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899.; Weiland C; Materials Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899.; Woicik JC; Materials Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899.

Publisher: American Physical Society Country of Publication: United States NLM ID: 101677937 Publication Model: Print Cited Medium: Print ISSN: 2469-9950 (Print) NLM ISO Abbreviation: Phys Rev B Subsets: PubMed not MEDLINE

Tkach A; Department of Materials and Ceramic Engineering, CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.; Almeida A; Department of Physics of Science Faculty, IFIMUP, University of Porto, 4169-007 Porto, Portugal.; Levin I; Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Woicik JC; Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Vilarinho PM; Department of Materials and Ceramic Engineering, CICECO-Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.

Publisher: MDPI Country of Publication: Switzerland NLM ID: 101555929 Publication Model: Electronic Cited Medium: Print ISSN: 1996-1944 (Print) Linking ISSN: 19961944 NLM ISO Abbreviation: Materials (Basel) Subsets: PubMed not MEDLINE

Jenkins MA; School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, Oregon 97330, United States.; Holden KEK; School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, Oregon 97330, United States.; Smith SW; Sandia National Laboratories, Albuquerque, New Mexico 87185, United States.; Brumbach MT; Sandia National Laboratories, Albuquerque, New Mexico 87185, United States.; Henry MD; Sandia National Laboratories, Albuquerque, New Mexico 87185, United States.; Weiland C; Materials Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.; Woicik JC; Materials Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.; Jaszewski ST; Department of Materials Science and Engineering, University of Virginia, Charlottesville, Virginia 22904, United States.; Ihlefeld JF; Department of Materials Science and Engineering, University of Virginia, Charlottesville, Virginia 22904, United States.; Charles L. Brown Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, Virginia 22904, United States.; Conley JF Jr; School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, Oregon 97330, United States.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: PubMed not MEDLINE; MEDLINE

Woicik JC; Materials Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Weiland C; Materials Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Jaye C; Materials Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Fischer DA; Materials Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Rumaiz AK; National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA.; Shirley EL; Sensor Science Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Kas JJ; Department of Physics, University of Washington, Seattle, Washington 98195, USA.; Rehr JJ; Department of Physics, University of Washington, Seattle, Washington 98195, USA.

Publisher: American Physical Society Country of Publication: United States NLM ID: 101677937 Publication Model: Print Cited Medium: Print ISSN: 2469-9950 (Print) NLM ISO Abbreviation: Phys Rev B Subsets: PubMed not MEDLINE

Woicik JC; Material Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Weiland C; Material Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Rumaiz AK; National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA.; Brumbach MT; Materials Characterization Department, Sandia National Laboratories, Albuquerque, New Mexico 87185, USA.; Ablett JM; Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin, 91192 Gif-sur-Yvette Cedex, France.; Shirley EL; Sensor Science Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Kas JJ; Department of Physics, University of Washington, Seattle, Washington 98195, USA.; Rehr JJ; Department of Physics, University of Washington, Seattle, Washington 98195, USA.

Publisher: American Physical Society Country of Publication: United States NLM ID: 101677937 Publication Model: Print Cited Medium: Print ISSN: 2469-9950 (Print) NLM ISO Abbreviation: Phys Rev B Subsets: PubMed not MEDLINE

Prakash A; Department of Chemical Engineering and Materials Science , University of Minnesota , Minneapolis , Minnesota 55414 , United States.; Quackenbush NF; Materials Measurement Science Division, Material Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.; Yun H; Department of Chemical Engineering and Materials Science , University of Minnesota , Minneapolis , Minnesota 55414 , United States.; Held J; Department of Chemical Engineering and Materials Science , University of Minnesota , Minneapolis , Minnesota 55414 , United States.; Wang T; Department of Chemical Engineering and Materials Science , University of Minnesota , Minneapolis , Minnesota 55414 , United States.; Truttmann T; Department of Chemical Engineering and Materials Science , University of Minnesota , Minneapolis , Minnesota 55414 , United States.; Ablett JM; Synchrotron SOLEIL , L'Orme des Merisiers, Boîte Postale 48 , St. Aubin 91192 Gif sur Yvette , France.; Weiland C; Materials Measurement Science Division, Material Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.; Lee TL; Diamond Light Source, Ltd. , Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE , United Kingdom.; Woicik JC; Materials Measurement Science Division, Material Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.; Mkhoyan KA; Department of Chemical Engineering and Materials Science , University of Minnesota , Minneapolis , Minnesota 55414 , United States.; Jalan B; Department of Chemical Engineering and Materials Science , University of Minnesota , Minneapolis , Minnesota 55414 , United States.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 101088070 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1530-6992 (Electronic) Linking ISSN: 15306984 NLM ISO Abbreviation: Nano Lett Subsets: PubMed not MEDLINE; MEDLINE