학술논문
'학술논문'
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1~10
Academic Journal
Sheng, Yuqiu (PRC-BHU-SM) AMS Author Profile; Liu, Wende (PRC-HTU-SMS) AMS Author Profile; Miao, Xingxue (PRC-DUT-SM) AMS Author Profile
Academic Journal
Schliep, Karen C; Shaaban, C Elizabeth; Meeks, Huong; Fraser, Alison; Smith, Ken R; Majersik, Jennifer J; Foster, Norman L; Wactawski‐Wende, Jean; Østbye, Truls; Tschanz, JoAnn; Padbury, James F; Sharma, Surrendra; Zhang, Yue; Facelli, Julio C; Abdelrahman, C Samir; Theilen, Lauren; Varner, Michael W
Alzheimer's & Dementia Diagnosis Assessment & Disease Monitoring. 15(2)
Report
Lojewski, Tobias; Elhanoty, Mohamed F.; Guyader, Loïc Le; Grånäs, Oscar; Agarwal, Naman; Boeglin, Christine; Carley, Robert; Castoldi, Andrea; David, Christian; Deiter, Carsten; Döring, Florian; Engel, Robin Y.; Erdinger, Florian; Fangohr, Hans; Fiorini, Carlo; Fischer, Peter; Gerasimova, Natalia; Gort, Rafael; de Groot, Frank; Hansen, Karsten; Hauf, Steffen; Hickin, David; Izquierdo, Manuel; Van Kuiken, Benjamin E.; Kvashnin, Yaroslav; Lambert, Charles-Henri; Lomidze, David; Maffessanti, Stefano; Mercadier, Laurent; Mercurio, Giuseppe; Miedema, Piter S.; Ollefs, Katharina; Pace, Matthias; Porro, Matteo; Rezvani, Javad; Rösner, Benedikt; Rothenbach, Nico; Samartsev, Andrey; Scherz, Andreas; Schlappa, Justina; Stamm, Christian; Teichmann, Martin; Thunstrom, Patrik; Turcato, Monica; Yaroslavtsev, Alexander; Zhu, Jun; Beye, Martin; Wende, Heiko; Bovensiepen, Uwe; Eriksson, Olle; Eschenlohr, Andrea
Academic Journal
IEEE Access Access, IEEE. 10:101276-101291 2022
Academic Journal
Walsh, N; Zhang, H; Hyland, PL; Yang, Q; Mocci, E; Zhang, MF; Childs, EJ; Collins, I; Wang, ZM; Arslan, AA; Beane-Freeman, L; Bracci, PM; Brennan, P; Canzian, F; Duell, EJ; Gallinger, S; Giles, GG; Goggins, M; Goodman, GE; Goodman, PJ; Hung, RJ; Kooperberg, C; Kurtz, RC; Malats, N; LeMarchand, L; Neale, RE; Olson, SH; Scelo, G; Shu, XO; Van den Eeden, SK; Visvanathan, K; White, E; Zheng, W; Albanes, D; Andreotti, G; Babic, A; Bamlet, WR; Berndt, SI; Borgida, A; Boutron-Ruault, MC; Brais, L; Bueno-de-Mesquita, B; Buring, J; Chaffee, KG; Chanock, S; Cleary, S; Cotterchio, M; Foretova, L; Fuchs, C; Gaziano, JMM; Giovannucci, E; Hackert, T; Haiman, C; Hartge, P; Hasan, M; Helzlsouer, KJ; Herman, J; Holcatova, I; Holly, EA; Hoover, R; Janout, V; Klein, EA; Laheru, D; Lee, IM; Lu, LG; Mannisto, S; Milne, RL; Oberg, AL; Orlow, I; Patel, AV; Peters, U; Porta, M; Real, FX; Rothman, N; Sesso, HD; Severi, G; Silverman, D; Strobel, O; Sund, M; Thornquist, MD; Tobias, GS; Wactawski-Wende, J; Wareham, N; Weiderpass, E; Wentzensen, N; Wheeler, W; Yu, H; Zeleniuch-Jacquotte, A; Kraft, P; Li, DH; Jacobs, EJ; Petersen, GM; Wolpin, BM; Risch, HA; Amundadottir, LT; Yu, K; Klein, AP; Stolzenberg-Solomon, RZ
Journal of the National Cancer Institute. 111(6):557-567
Conference
2022 IEEE 5th International Conference on Electronic Information and Communication Technology (ICEICT) Electronic Information and Communication Technology (ICEICT), 2022 IEEE 5th International Conference on. :984-986 Aug, 2022
Lojewski, Tobias; Elhanoty, Mohamed F.; Le Guyader, Loic; Granaes, Oscar; Agarwal, Naman; Boeglin, Christine; Carley, Robert; Castoldi, Andrea; David, Christian; Deiter, Carsten; Doering, Florian; Engel, RobinY; Erdinger, Florian; Fangohr, Hans; Fiorini, Carlo; Fischer, Peter; Gerasimova, Natalia; Gort, Rafael; deGroot, Frank; Hansen, Karsten; Hauf, Steffen; Hickin, David; Izquierdo, Manuel; Van Kuiken, Benjamin E.; Kvashnin, Yaroslav; Lambert, Charles-Henri; Lomidze, David; Maffessanti, Stefano; Mercadier, Laurent; Mercurio, Giuseppe; Miedema, Piter S.; Ollefs, Katharina; Pace, Matthias; Porro, Matteo; Rezvani, Javad; Roesner, Benedikt; Rothenbach, Nico; Samartsev, Andrey; Scherz, Andreas; Schlappa, Justina; Stamm, Christian; Teichmann, Martin; Thunström, Patrik, 1981; Turcato, Monica; Yaroslavtsev, Alexander; Zhu, Jun; Beye, Martin; Wende, Heiko; Bovensiepen, Uwe; Eriksson, Olle; Eschenlohr, Andrea
Materials Research Letters. 11(8):655-661
Academic Journal
Aubert, A.; Skokov, K.; Gomez, G.; Chirkova, A.; Radulov, I.; Wilhelm, F.; Rogalev, A.; Wende, H.; Gutfleisch, O.; Ollefs, K.
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 71:1-9 2022
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[검색어] Wende, F.
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