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News
Nanotechnology Weekly. March 18, 2024, p146.
Conference
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2023 IEEE 73rd. :350-355 May, 2023
Academic Journal
Dicko A; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Ouedraogo JB; Institut des Sciences et Techniques-Institut de Recherche en Sciences de la Santé, Bobo-Dioulasso, Burkina Faso.; Zongo I; Institut des Sciences et Techniques-Institut de Recherche en Sciences de la Santé, Bobo-Dioulasso, Burkina Faso.; Sagara I; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Cairns M; Department of Infectious Disease Epidemiology, London School of Hygiene & Tropical Medicine, London, UK.; Yerbanga RS; Institut des Sciences et Techniques-Institut de Recherche en Sciences de la Santé, Bobo-Dioulasso, Burkina Faso.; Issiaka D; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Zoungrana C; Institut des Sciences et Techniques-Institut de Recherche en Sciences de la Santé, Bobo-Dioulasso, Burkina Faso.; Sidibe Y; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Tapily A; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Nikièma F; Institut des Sciences et Techniques-Institut de Recherche en Sciences de la Santé, Bobo-Dioulasso, Burkina Faso.; Sompougdou F; Institut des Sciences et Techniques-Institut de Recherche en Sciences de la Santé, Bobo-Dioulasso, Burkina Faso.; Sanogo K; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Kaya M; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Yalcouye H; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Dicko OM; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Diarra M; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Diarra K; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Thera I; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Haro A; Institut des Sciences et Techniques-Institut de Recherche en Sciences de la Santé, Bobo-Dioulasso, Burkina Faso.; Sienou AA; Institut des Sciences et Techniques-Institut de Recherche en Sciences de la Santé, Bobo-Dioulasso, Burkina Faso.; Traore S; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Mahamar A; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Dolo A; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Kuepfer I; Department of Disease Control, London School of Hygiene & Tropical Medicine, London, UK.; Snell P; Department of Infectious Disease Epidemiology, London School of Hygiene & Tropical Medicine, London, UK.; Grant J; Department of Disease Control, London School of Hygiene & Tropical Medicine, London, UK.; Webster J; Department of Disease Control, London School of Hygiene & Tropical Medicine, London, UK.; Milligan P; Department of Infectious Disease Epidemiology, London School of Hygiene & Tropical Medicine, London, UK.; Lee C; PATH, Seattle, USA.; Ockenhouse C; PATH, Seattle, USA.; Ofori-Anyinam O; GSK, Wavre, Belgium.; Tinto H; Institut des Sciences et Techniques-Institut de Recherche en Sciences de la Santé, Bobo-Dioulasso, Burkina Faso.; Djimde A; The Malaria Research and Training Center, University of Science, Technology and Techniques of Bamako, Bamako, Mali.; Chandramohan D; Department of Disease Control, London School of Hygiene & Tropical Medicine, London, UK.; Greenwood B; Department of Disease Control, London School of Hygiene & Tropical Medicine, London, UK. Electronic address: brian.greenwood@lshtm.ac.uk.
Publisher: Elsevier Science Country of Publication: United States NLM ID: 101130150 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1474-4457 (Electronic) Linking ISSN: 14733099 NLM ISO Abbreviation: Lancet Infect Dis Subsets: MEDLINE
Academic Journal
Tasneem, N.; Islam, M.M.; Wang, Z.; Zhao, Z.; Upadhyay, N.; Lombardo, S.F.; Chen, H.; Hur, J.; Triyoso, D.; Consiglio, S.; Tapily, K.; Clark, R.; Leusink, G.; Kurinec, S.; Datta, S.; Yu, S.; Ni, K.; Passlack, M.; Chern, W.; Khan, A.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(3):1568-1574 Mar, 2022
Academic Journal
Tasneem, N.; Islam, M.M.; Wang, Z.; Chen, H.; Hur, J.; Triyoso, D.; Consiglio, S.; Tapily, K.; Clark, R.; Leusink, G.; Yu, S.; Chern, W.; Khan, A.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 42(8):1156-1159 Aug, 2021
Conference
Triyoso, Dina H.; Clark, Robert D.; Consiglio, Steven; Tapily, Kandabara; Higuchi, Hisashi; Hakamata, Takahiro; Newman, Danny; Rogalskyj, Sophia; Cole, Christopher; Raley, Angelique; Wajda, Cory; Leusink, Gert
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2020 4th IEEE. :1-4 Apr, 2020
Academic Journal
Kim, Y.; Seo, S.; Consiglio, S.; Jamison, P.; Higuchi, H.; Rasch, M.; Wu, E.Y.; Kong, D.; Saraf, I.; Catano, C.; Muralidhar, R.; Nguyen, S.; DeVries, S.; Van der Straten, O.; Sankarapandian, M.; Pujari, R.N.; Gasasira, A.; Mcdermott, S.M.; Miyazoe, H.; Koty, D.; Yang, Q.; Yan, H.; Clark, R.; Tapily, K.; Engelmann, S.; Robison, R.R.; Wajda, C.; Mosden, A.; Tsunomura, T.; Soave, R.; Saulnier, N.; Haensch, W.; Leusink, G.; Biolsi, P.; Narayanan, V.; Ando, T.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 42(5):759-762 May, 2021
Conference
Gong, N.; Rasch, M.J.; Seo, S.-C.; Gasasira, A.; Solomon, P.; Bragaglia, V.; Consiglio, S.; Higuchi, H.; Park, C.; Brew, K.; Jamison, P.; Catano, C.; Saraf, I.; Athena, F.F.; Silvestre, C.; Liu, X.; Khan, B.; Jain, N.; Mcdermott, S.; Johnson, R.; Estrada-Raygoza, I.; Li, J.; Gokmen, T.; Li, N.; Pujari, R.; Carta, F.; Miyazoe, H.; Frank, M.M.; Koty, D.; Yang, Q.; Clark, R.; Tapily, K.; Wajda, C.; Mosden, A.; Shearer, J.; Metz, A.; Teehan, S.; Saulnier, N.; Offrein, B. J.; Tsunomura, T.; Leusink, G.; Narayanan, V.; Ando, T.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :33.7.1-33.7.4 Dec, 2022
Academic Journal
Fabia Farlin Athena; Omobayode Fagbohungbe; Nanbo Gong; Malte J. Rasch; Jimmy Penaloza; SoonCheon Seo; Arthur Gasasira; Paul Solomon; Valeria Bragaglia; Steven Consiglio; Hisashi Higuchi; Chanro Park; Kevin Brew; Paul Jamison; Christopher Catano; Iqbal Saraf; Claire Silvestre; Xuefeng Liu; Babar Khan; Nikhil Jain; Steven McDermott; Rick Johnson; I. Estrada-Raygoza; Juntao Li; Tayfun Gokmen; Ning Li; Ruturaj Pujari; Fabio Carta; Hiroyuki Miyazoe; Martin M. Frank; Antonio La Porta; Devi Koty; Qingyun Yang; Robert D. Clark; Kandabara Tapily; Cory Wajda; Aelan Mosden; Jeff Shearer; Andrew Metz; Sean Teehan; Nicole Saulnier; Bert Offrein; Takaaki Tsunomura; Gert Leusink; Vijay Narayanan; Takashi Ando
Frontiers in Electronics, Vol 4 (2024)
Academic Journal
Hoffmann, Michael; Wang, Zheng; Tasneem, Nujhat; Zubair, Ahmad; Ravindran, Prasanna Venkatesan; Tian, Mengkun; Gaskell, Anthony Arthur; Triyoso, Dina; Consiglio, Steven; Tapily, Kandabara; Clark, Robert; Hur, Jae; Pentapati, Sai Surya Kiran; Lim, Sung Kyu; Dopita, Milan; Yu, Shimeng; Chern, Winston; Kacher, Josh; Reyes-Lillo, Sebastian E; Antoniadis, Dimitri; Ravichandran, Jayakanth; Slesazeck, Stefan; Mikolajick, Thomas; Khan, Asif Islam
Nature Communications. 13(1)
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