학술논문
'학술논문'
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1~10
Conference
Bastos, J. P.; O'Sullivan, B. J.; Higashi, Y.; Chasin, A.; Franco, J.; Arimura, H.; Ganguly, J.; Capogreco, E.; Spessot, A.; Horiguchi, N.
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P36.PI-1-P36.PI-7 Apr, 2024
Conference
Tyaginov, S.E.; Bury, E.; Grill, A.; Yu, Z.; Makarov, A.; De Keersgieter, A.; Vexler, M.I.; Vandemaele, M.; Wang, R.; Spessot, A.; Chasin, A.; Kaczer, B.
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2023 7th IEEE. :1-3 Mar, 2023
Conference
Spessot, Alessio; Salahuddin, Shairfe Muhammad; Escobar, Ricardo; Ritzenthaler, Romain; Xiang, Yang; Budhwani, Rahul; Litta, Eugenio Dentoni; Capogreco, Elena; Bastos, Joao; Chen, Yangyin; Naoto, Horiguchi
2022 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2022 IEEE International. :1-4 May, 2022
Academic Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(11):1757-1769 Nov, 2022
Conference
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022. :616-621 Mar, 2022
Conference
Bastos, J. P.; O'Sullivan, B. J.; Franco, J.; Tyaginov, S.; Truijen, B.; Chasin, A.; Degraeve, R.; Kaczer, B.; Ritzenthaler, R.; Capogreco, E.; Litta, E. D.; Spessot, A.; Higashi, Y.; Yoon, Y.; Machkaoutsan, V.; Fazan, P.; Horiguchi, N.
2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :1-6 Mar, 2022
Academic Journal
Nibhanupudi, S.S.T.; Prasad, D.; Das, S.; Zografos, O.; Robinson, A.; Gupta, A.; Spessot, A.; Debacker, P.; Verkest, D.; Ryckaert, J.; Hellings, G.; Myers, J.; Cline, B.; Kulkarni, J.P.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(8):4453-4459 Aug, 2022
Conference
Ragnarsson, L-A; Bardon, M. Garcia; Wuytens, P.; Mirabelli, G.; Jang, D.; Willems, G.; Mallik, A.; Spessot, A.; Ryckaert, J.; Parvais, B.
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2022 6th IEEE. :82-84 Mar, 2022
Academic Journal
Biomimetics. April, 2024, Vol. 9 Issue 4
Academic Journal
Tyaginov S; Imec, Kapeldreef 75, 3001 Leuven, Belgium.; Bury E; Imec, Kapeldreef 75, 3001 Leuven, Belgium.; Grill A; Imec, Kapeldreef 75, 3001 Leuven, Belgium.; Yu Z; Institute of Microelectronics, Peking University, Beijing 100871, China.; Makarov A; Imec, Kapeldreef 75, 3001 Leuven, Belgium.; De Keersgieter A; Imec, Kapeldreef 75, 3001 Leuven, Belgium.; Vexler M; A.F. Ioffe Institute, Polytechnicheskaya 26, 194021 St.-Petersburg, Russia.; Vandemaele M; Imec, Kapeldreef 75, 3001 Leuven, Belgium.; Wang R; Institute of Microelectronics, Peking University, Beijing 100871, China.; Spessot A; Imec, Kapeldreef 75, 3001 Leuven, Belgium.; Chasin A; Imec, Kapeldreef 75, 3001 Leuven, Belgium.; Kaczer B; Imec, Kapeldreef 75, 3001 Leuven, Belgium.
Publisher: MDPI Country of Publication: Switzerland NLM ID: 101640903 Publication Model: Electronic Cited Medium: Print ISSN: 2072-666X (Print) Linking ISSN: 2072666X NLM ISO Abbreviation: Micromachines (Basel) Subsets: PubMed not MEDLINE
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[검색어] Spessot, A.
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