학술논문
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Academic Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 43(4):1079-1092 Apr, 2024
Conference
Digest of Papers. 2004 International Microprocesses and Nanotechnology Conference, 2004. Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International. :72-73 2004
Academic Journal
Teng, J.W.; Nergui, D.; Parameswaran, H.; Sepulveda-Ramos, N.E.; Tzintzarov, G.N.; Mensah, Y.; Cheon, C.D.; Rao, S.G.; Ringel, B.; Gorchichko, M.; Li, K.; Ying, H.; Ildefonso, A.; Dodds, N.A.; Nowlin, R.N.; Zhang, E.X.; Fleetwood, D.M.; Cressler, J.D.
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(3):282-289 Mar, 2022
Conference
Harris, H.R.; Choi, R.; Lee, B.H.; Young, C.D.; Sim, J.H.; Mathews, K.; Zeitzoff, P.; Majhi, P.; Bersuker, G.
IEEE International Integrated Reliability Workshop Final Report, 2004 Integrated reliability workshop Integrated Reliability Workshop Final Report, 2004 IEEE International. :132-135 2004
Conference
2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070) Electronic components and technology Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th. :989-996 2000
Academic Journal
Young, C.D.; Heh, D.; Nadkarni, S.V.; Rino Choi; Peterson, J.J.; Barnett, J.; Byoung Hun Lee; Bersuker, G.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 6(2):123-131 Jun, 2006
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 48(4):679-684 Apr, 2001
Conference
Young, C.D.; Bersuker, G.; Zhu, F.; Matthews, K.; Choi, R.; Song, S.C.; Park, H.K.; Lee, J.C.; Lee, B.H.
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual Reliability physics symposium, 2007. proceedings. 45th annual. ieee international. :67-70 Apr, 2007
Academic Journal
Allegorico, E.; Bosso, G.; Pagano, A.; Porta, G.; Serra, C.; Minerva, V.; Vicario, F.D.; Altruda, C.; Arbo, P.; Russo, T.; Ruffa, G.; Mormile, C.; Numis, F.; Buonerba, C.; Cannavacciuolo, F.; Dolce, P.; Mercurio, V.; Gervasio, G.; Costanzo, G.D.; Ragozzino, A.; Sio, C.D.; Franco, N.; Facchini, G.; Scafuri, L.
In: Future Science OA . (Future Science OA, January 2021, 7(1))
Academic Journal
Sheu, T.; Garden, A.S.; Fuller, C.D.; Gunn, G.B.; Nguyen, T.; Beadle, B.M.; Morrison, W.H.; Sio, T.T.W.; Takiar, V.; Zafereo, M.; Rosenthal, D.I.; Frank, S.J.; Phan, J.
In International Journal of Radiation Oncology, Biology, Physics 1 October 2016 96(2) Supplement:E331-E331
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[검색어] Sio, C.D.
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