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Sturm, E.; Davies, R.; Alves, J.; Clénet, Y.; Kotilainen, J.; Monna, A.; Nicklas, H.; Pott, J. -U.; Tolstoy, E.; Vulcani, B.; Achren, J.; Annadevara, S.; Anwand-Heerwart, H.; Arcidiacono, C.; Barboza, S.; Barl, L.; Baudoz, P.; Bender, R.; Bezawada, N.; Biondi, F.; Bizenberger, P.; Blin, A.; Boné, A.; Bonifacio, P.; Borgo, B.; Born, J. van den; Buey, T.; Cao, Y.; Chapron, F.; Chauvin, G.; Chemla, F.; Cloiseau, K.; Cohen, M.; Collin, C.; Czoske, O.; Dette, J. -O.; Deysenroth, M.; Dijkstra, E.; Dreizler, S.; Dupuis, O.; van Egmond, G.; Eisenhauer, F.; Elswijk, E.; Emslander, A.; Fabricius, M.; Fasola, G.; Ferreira, F.; Schreiber, N. M. Förster; Fontana, A.; Gaudemard, J.; Gautherot, N.; Gendron, E.; Gennet, C.; Genzel, R.; Ghouchou, L.; Gillessen, S.; Gratadour, D.; Grazian, A.; Grupp, F.; Guieu, S.; Gullieuszik, M.; de Haan, M.; Hartke, J.; Hartl, M.; Haussmann, F.; Helin, T.; Hess, H. -J.; Hofferbert, R.; Huber, H.; Huby, E.; Huet, J. -M.; Ives, D.; Janssen, A.; Jaufmann, P.; Jilg, T.; Jodlbauer, D.; Jost, J.; Kausch, W.; Kellermann, H.; Kerber, F.; Kravcar, H.; Kravchenko, K.; Kulcsár, C.; Kunkarayakti, H.; Kunst, P.; Kwast, S.; Lang, F.; Lange, J.; Lapeyrere, V.; Ruyet, B. Le; Leschinski, K.; Locatelli, H.; Massari, D.; Mattila, S.; Mei, S.; Merlin, F.; Meyer, E.; Michel, C.; Mohr, L.; Montargès, M.; Müller, F.; Münch, N.; Navarro, R.; Neumann, U.; Neumayer, N.; Neumeier, L.; Pedichini, F.; Pflüger, A.; Piazzesi, R.; Pinard, L.; Porras, J.; Portaluri, E.; Przybilla, N.; Rabien, S.; Raffard, J.; Raggazoni, R.; Ramlau, R.; Ramos, J.; Ramsay, S.; Raynaud, H. -F.; Rhode, P.; Richter, A.; Rix, H. -W.; Rodenhuis, M.; Rohloff, R. -R.; Romp, R.; Rousselot, P.; Sabha, N.; Sassolas, B.; Schlichter, J.; Schuil, M.; Schweitzer, M.; Seemann, U.; Sevin, A.; Simioni, M.; Spallek, L.; Sönmez, A.; Suuronen, J.; Taburet, S.; Thomas, J.; Tisserand, E.; Vaccari, P.; Valenti, E.; Kleijn, G. Verdoes; Verdugo, M.; Vidal, F.; Wagner, R.; Wegner, M.; van Winden, D.; Witschel, J.; Zanella, A.; Zeilinger, W.; Ziegleder, J.; Ziegler, B.
Academic Journal
IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(14):16080-16091 Jul, 2023
Academic Journal
Biosensors. August, 2024, Vol. 14 Issue 8
Academic Journal
IEEE Transactions on Green Communications and Networking IEEE Trans. on Green Commun. Netw. Green Communications and Networking, IEEE Transactions on. 6(1):132-147 Mar, 2022
Report
Davies, R.; Schubert, J.; Hartl, M.; Alves, J.; Clénet, Y.; Lang-Bardl, F.; Nicklas, H.; Pott, J. -U.; Ragazzoni, R.; Tolstoy, E.; Agocs, T.; Anwand-Heerwart, H.; Barboza, S.; Baudoz, P.; Bender, R.; Bizenberger, P.; Boccaletti, A.; Boland, W.; Bonifacio, P.; Briegel, F.; Buey, T.; Chapron, F.; Cohen, M.; Czoske, O.; Dreizler, S.; Falomo, R.; Feautrier, P.; Schreiber, N. Förster; Gendron, E.; Genzel, R.; Glück, M.; Gratadour, D.; Greimel, R.; Grupp, F.; Häuser, M.; Haug, M.; Hennawi, J.; Hess, H. -J.; Hörmann, V.; Hofferbert, R.; Hopp, U.; Hubert, Z.; Ives, D.; Kausch, W.; Kerber, F.; Kravcar, H.; Kuijken, K.; Leitzinger, M.; Leschinski, K.; Massari, D.; Mei, S.; Merlin, F.; Mohr, L.; Monna, A.; Müller, F.; Navarro, R.; Plattner, M.; Przybilla, N.; Ramlau, R.; Ramsay, S.; Ratzka, T.; Rhode, P.; Richter, J.; Rix, H. -W.; Rodeghiero, G.; Rohloff, R. -R.; Rousset, G.; Ruddenklau, R.; Schaffenroth, V.; Schlichter, J.; Sevin, A.; Stuik, R.; Sturm, E.; Thomas, J.; Tromp, N.; Turatto, M.; Verdoes-Kleijn, G.; Vidal, F.; Wagner, R.; Wegner, M.; Zeilinger, W.; Ziegler, B.; Zins, G.
Electronic Resource
Electronic Resource
Conference
Hacker, B.A.; Wankerl, T.; Kiselev, A.; Huang, H.H.; Merckel, L.; Okada, S.; Schlichter, J.; Abdikkev, N.; Nishida, T.
2009 10th International Conference on Telecommunications Telecommunications, 2009. ConTEL 2009. 10th International Conference on. :163-170 Jun, 2009
Academic Journal
Ziegler K; Organic Chemistry Institute and Center for Soft Nanoscience, University of Münster, Corrensstraße 40, 48149 Münster, Germany.; Schlichter L; Organic Chemistry Institute and Center for Soft Nanoscience, University of Münster, Corrensstraße 40, 48149 Münster, Germany.; Post Y; Organic Chemistry Institute and Center for Soft Nanoscience, University of Münster, Corrensstraße 40, 48149 Münster, Germany.; Gröschel AH; Bavarian Center for Battery Technology (BayBatt) and Bavarian Polymer Institute (BPI), University of Bayreuth, Universitätsstraße 30, 95448 Bayreuth, Germany.; Ravoo BJ; Organic Chemistry Institute and Center for Soft Nanoscience, University of Münster, Corrensstraße 40, 48149 Münster, Germany.
Publisher: American Chemical Society Country of Publication: United States NLM ID: 101574672 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2161-1653 (Electronic) Linking ISSN: 21611653 NLM ISO Abbreviation: ACS Macro Lett Subsets: PubMed not MEDLINE; MEDLINE
Academic Journal
Schlichter L; Center for Soft Nanoscience and Organic Chemistry Institute, University of Münster, Busso-Peus-Straße 10, 48149 Münster, Germany.; Jersch J; Institute of Applied Physics, University of Münster, Corrensstraße 2, 48149 Münster, Germany.; Demokritov SO; Institute of Applied Physics, University of Münster, Corrensstraße 2, 48149 Münster, Germany.; Ravoo BJ; Center for Soft Nanoscience and Organic Chemistry Institute, University of Münster, Busso-Peus-Straße 10, 48149 Münster, Germany.
Publisher: American Chemical Society Country of Publication: United States NLM ID: 9882736 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1520-5827 (Electronic) Linking ISSN: 07437463 NLM ISO Abbreviation: Langmuir Subsets: PubMed not MEDLINE; MEDLINE
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[검색어] Schlichter, L.
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