부산대학교 도서관

柳政勲 / Ryu Jeong-hoon

일본연구. Aug 31, 2021 36:159

柳政勲; ( Ryu, Jeong-hoon)

일본연구 36. (2021): 159-180.

Kelway, John J.; Brock, Anke M.; Guitton, Pascal; Millet, Aurélie; Nakata, Yasushi

Proceedings of the 20th International ACM SIGACCESS Conference on Computers and Accessibility. :52-56

The Simons Observatory Collaboration; Abril-Cabezas, I.; Adachi, S.; Ade, P.; Adler, A. E.; Agrawal, P.; Aguirre, J.; Aiola, S.; Alford, T.; Ali, A.; Alonso, D.; Alvarez, M. A.; An, R.; Aravena, M.; Arnold, K.; Ashton, P.; Astori, F.; Atkins, Z.; Austermann, J.; Azzoni, S.; Baccigalupi, C.; Baker, D.; Balafendiev, R.; Lizancos, A. Baleato; Barron, D.; Barry, P.; Bartlett, J.; Basyrov, A.; Battaglia, N.; Battistelli, E. S.; Battye, R.; Bayer, A.; Bazarko, A.; Beall, J. A.; Bean, R.; Beck, D.; Beckman, S.; Begin, J.; Beheshti, A.; Beringue, B.; Bhandarkar, T.; Bhimani, S.; Bianchini, F.; Biermann, E.; Billi, M.; Biquard, S.; Bixler, B.; Bizzarri, L.; Boada, S.; Boettger, D.; Bolliet, B.; Bond, J. R.; Borrill, J.; Borrow, J.; Braithwaite, C.; Brien, T. L. R.; Brown, M. L.; Bruno, S. M.; Bryan, S.; Bustos, R.; Cai, H.; Calabrese, E.; Calafut, V.; Carl, F. M.; Carones, A.; Carron, J.; Challinor, A.; Chamberlain, E.; Chanial, P.; Chen, N.; Cheung, K.; Chiang, B.; Chinone, Y.; Chluba, J.; Cho, H. S.; Choi, S. K.; Chu, M.; Clancy, J.; Clark, S. E.; Clarke, P.; Cleary, J.; Clements, D. L.; Connors, J.; Contaldi, C.; Coppi, G.; Corbett, L.; Cothard, N. F.; Coulton, W.; Crichton, D.; Crowley, K. D.; Crowley, K. T.; Cukierman, A.; D'Ewart, J. M.; Dachlythra, K.; Darwish, O.; Datta, R.; Day-Weiss, S.; de Haan, T.; Desai, S.; Devlin, M.; Di Mascolo, L.; Dicker, S.; Ding, K.; Doux, C.; Dow, P.; Doyle, S.; Duell, C. J.; Duff, S. M.; Duivenvoorden, A. J.; Dunkley, J.; Duparc, M.; Dutcher, D.; Dünner, R.; Edenton, M.; Bouhargani, H. El; Villagra, C. Embil; Errard, J.; Fabbian, G.; Fanfani, V.; Khouzani, F. Farhadi; Farren, G. S.; Fergusson, J.; Ferraro, S.; Flauger, R.; Forconi, M.; Foster, A.; Freese, K.; Frisch, J. C.; Frolov, A.; Fuller, G.; Galitzki, N.; Gallardo, P. A.; Galloni, G.; Ghersi, J. T. Galvez; Ganga, K.; Garrido, X.; Gawiser, E.; Gerbino, M.; Gerras, R.; Giardiello, S.; Gill, A.; Gilles, V.; Giri, U.; Gleave, E.; Gluscevic, V.; Goeckner-Wald, N.; Goldstein, S.; Golec, J. E.; Gordon, S.; Gralla, M.; Gratton, S.; Green, D.; Groh, J. C.; Groppi, C.; Grubb, S.; Guan, Y.; Gupta, N.; Guðmundsson, J. E.; Hadzhiyska, B.; Hagstotz, S.; Hargrave, P.; Haridas, S.; Harrington, K.; Harrison, I.; Hasegawa, M.; Hasselfield, M.; Haynes, V.; Hazumi, M.; He, A.; Healy, E.; Henderson, S. W.; Hensley, B. S.; Hertig, E.; Hervías-Caimapo, C.; Higuchi, M.; Hill, C. A.; Hill, J. C.; Hilton, M.; Hincks, A. D.; Hinshaw, G.; Hložek, R.; Ho, A. Y. Q.; Ho, S.; Ho, S. P.; Hoang, T. D.; Hoh, J.; Holder, J.; Hood, J.; Hornecker, E.; Hornsby, A. L.; Hotinli, S. C.; Huang, Z.; Huber, Z. B.; Hubmayr, J.; Huffenberger, K.; Hughes, A.; Hughes, J. P.; Lonappan, A. Idicherian; Ikape, M.; Inaba, K.; Irwin, K.; Iuliano, J.; Jaffe, A. H.; Jain, B.; Jain, D.; Jense, H. T.; Jeong, O.; Johnson, A.; Johnson, B. R.; Johnson, M.; Jones, M. E.; Joshi, N.; Jost, B.; Kabalan, W.; Kabra, V.; Kaneko, D.; Kania, J.; Karpel, E. D.; Kasai, Y.; Katayama, N.; Keating, B.; Keller, B.; Keskitalo, R.; Khatua, A. A.; Kim, J.; Kisner, T.; Kiuchi, K.; Knowles, K.; Kofman, A. M.; Koizumi, Y.; Koopman, B. J.; Kosowsky, A.; Kou, R.; Krachmalnicoff, N.; Kramer, D.; Krishak, A.; Krolewski, A.; Kusaka, A.; Kusiak, A.; Kvasiuk, Y.; La Plante, P.; La Posta, A.; Laguë, A.; Lai, A.; Lashner, J.; Lattanzi, M.; Lee, A.; Lee, E.; Leech, J.; Legrand, L.; Lessler, C.; Leung, J. S.; Lewis, A.; Li, Y.; Li, Z.; Limon, M.; Lin, L.; Linder, E.; Link, M.; Liu, J.; Liu, Y.; Lloyd, J.; Lonergan, J.; Louis, T.; Lucas, T.; Ludlam, M.; Lungu, M.; Lyons, M.; MacCrann, N.; MacInnis, A.; Madhavacheril, M.; Mak, D.; Maldonado, F.; Mallaby-Kay, M.; Manduca, A.; Mangu, A.; Mani, H.; Maniyar, A. S.; Marques, G. A.; Masson, P.; Mates, J.; Mathewson, J.; Matsumura, T.; Mauskopf, P.; May, A.; McCallum, N.; McCarrick, H.; McCarthy, F.; McCulloch, M.; McMahon, J.; Meerburg, P. D.; Mehta, Y.; Melin, J.; Meulbroek, E.; Meyers, J.; Middleton, A.; Miki, Y.; Miller, A.; Mirmelstein, M.; Mizozoe, Y.; Mohammadian, B.; Montefalcone, G.; Moodley, K.; Moore, J.; Morris, T.; Morshed, M.; Morton, T.; Moser, E.; Mroczkowski, T.; Murata, M.; Myers, J.; Münchmeyer, M.; Naess, S.; Nakata, H.; Namikawa, T.; Nashimoto, M.; Nati, F.; Natoli, P.; Negrello, M.; Nerval, S. K.; Newburgh, L.; Nguyen, D. V.; Nicola, A.; Niemack, M. D.; Nishino, H.; Nishinomiya, Y.; Novelli, A.; O'Neill, S.; Okumoto, N.; Orlando, A.; Orlowski-Scherer, J.; Pagano, L.; Page, L. A.; Pandey, S.; Papageorgiou, A.; Paraskevakos, I.; Partridge, B.; Patel, D.; Patki, R.; Korte, S. Paulino; Peel, M.; Sarmiento, K. Perez; Perrotta, F.; Phakathi, P.; Piccirillo, L.; Pierpaoli, E.; Pinsonneault-Marotte, T.; Pisano, G.; Pitocco, J.; Poletti, D.; Popik, C.; Prasad, B.; Puddu, R.; Puglisi, G.; Qu, F. J.; Rahman, F.; Randall, M. J.; Ranucci, C.; Raum, C.; Reeves, R.; Reichardt, C. L.; Remazeilles, M.; Ren, X.; Rephaeli, Y.; Riechers, D.; Guachalla, B. Reid; Rizzieri, A.; Robe, J.; Robertson, M. F.; Robertson, N.; Rogers, K.; Rojas, F.; Romero, A.; Rosenberg, E.; Rotti, A.; Rowe, S.; Roy, A.; Sadeh, S.; Sailer, N.; Sakaguri, K.; Sakuma, T.; Sakurai, Y.; Salatino, M.; Sanders, G. H.; Sasaki, D.; Rao, M. Sathyanarayana; Satterthwaite, T. P.; Saunders, L.; Scalcinati, L.; Schaan, E.; Schmitt, B.; Schmittfull, M.; Sehgal, N.; Seibert, J.; Seino, Y.; Seljak, U.; Shaikh, S.; Shaw, E.; Shellard, P.; Sherwin, B.; Shimon, M.; Shroyer, J. E.; Sierra, C.; Sievers, J.; Sifón, C.; Sikhosana, P.; Silva-Feaver, M.; Simon, S. M.; Sinclair, A.; Smith, K.; Sohn, W.; Song, X.; Sonka, R. F.; Souverin, T.; Spisak, J.; Staggs, S. T.; Stein, G.; Stevens, J. R.; Stompor, R.; Storer, E.; Sudiwala, R.; Sueno, Y.; Sugiyama, J.; Suman, P.; Surrao, K. M.; Sutariya, S.; Suzuki, A.; Suzuki, J.; Tajima, O.; Takaku, R.; Takakura, S.; Takeuchi, A.; Tansieri, I.; Taylor, A. C.; Teply, G.; Terasaki, T.; Thomas, A.; Thomas, D. B.; Thornton, R.; Timbie, P.; Trac, H.; Tsan, T.; Sang, E. Tsang King; Tucker, C.; Ullom, J.; Vacher, L.; Vale, L.; van Engelen, A.; Van Lanen, J.; van Marrewijk, J.; Van Winkle, D. D.; Vargas, C.; Vavagiakis, E. M.; Veenendaal, I.; Vergès, C.; Aguilar, A. Villarrubia; Vissers, M.; Viña, M.; Wagoner, K.; Walker, S.; Walters, L.; Wang, Y.; Westbrook, B.; Williams, J.; Williams, P.; Wilson, J.; Winch, H.; Wollack, E. J.; Wolz, K.; Wong, J.; Xu, Z.; Yamada, K.; Young, E.; Yu, B.; Yu, C.; Zagatti, G.; Zannoni, M.; Zhang, W.; Zheng, K.; Zhu, N.; Zonca, A.; Zubeldia, I.

Nakata, Hironobu; Adachi, Shunsuke; Yamada, Kyohei; Randall, Michael; Kasai, Yutaro; Arnold, Kam; Bixler, Bryce; Chinone, Yuji; Crowley, Kevin T.; Dachlythra, Nadia; Day-Weiss, Samuel; Galitzki, Nicholas; Giardiello, Serena; Johnson, Bradley R.; Keating, Brian; Koopman, Brian J.; Kusaka, Akito; Lashner, Jack; Nati, Federico; Page, Lyman; Sasaki, Daichi; Sueno, Yoshinori; Suzuki, Junya; Tajima, Osamu; Tsan, Tran

Nakata, Wataru; Seki, Kentaro; Yanaka, Hitomi; Saito, Yuki; Takamichi, Shinnosuke; Saruwatari, Hiroshi

Saha, N.C.; Irie, Y.; Seki, Y.; Hoshino, Y.; Nakata, J.; Kim, S.; Oishi, T.; Kasu, M.

IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 44(2):293-296 Feb, 2023

The Simons Observatory Collaboration; Abitbol, M.; Abril-Cabezas, I.; Adachi, S.; Ade, P.; Adler, A. E.; Agrawal, P.; Aguirre, J.; Ahmed, Z.; Aiola, S.; Alford, T.; Ali, A.; Alonso, D.; Alvarez, M. A.; An, R.; Arnold, K.; Ashton, P.; Atkins, Z.; Austermann, J.; Azzoni, S.; Baccigalupi, C.; Lizancos, A. Baleato; Barron, D.; Barry, P.; Bartlett, J.; Battaglia, N.; Battye, R.; Baxter, E.; Bazarko, A.; Beall, J. A.; Bean, R.; Beck, D.; Beckman, S.; Begin, J.; Beheshti, A.; Beringue, B.; Bhandarkar, T.; Bhimani, S.; Bianchini, F.; Biermann, E.; Biquard, S.; Bixler, B.; Boada, S.; Boettger, D.; Bolliet, B.; Bond, J. R.; Borrill, J.; Borrow, J.; Braithwaite, C.; Brien, T. L. R.; Brown, M. L.; Bruno, S. M.; Bryan, S.; Bustos, R.; Cai, H.; Calabrese, E.; Calafut, V.; Carl, F. M.; Carones, A.; Carron, J.; Challinor, A.; Chanial, P.; Chen, N.; Cheung, K.; Chiang, B.; Chinone, Y.; Chluba, J.; Cho, H. S.; Choi, S. K.; Chu, M.; Clancy, J.; Clark, S. E.; Clarke, P.; Cleary, J.; Clements, D. L.; Connors, J.; Contaldi, C.; Coppi, G.; Corbett, L.; Cothard, N. F.; Coulton, W.; Crowley, K. D.; Crowley, K. T.; Cukierman, A.; D'Ewart, J. M.; Dachlythra, K.; Datta, R.; Day-Weiss, S.; de Haan, T.; Devlin, M.; Di Mascolo, L.; Dicker, S.; Dober, B.; Doux, C.; Dow, P.; Doyle, S.; Duell, C. J.; Duff, S. M.; Duivenvoorden, A. J.; Dunkley, J.; Dutcher, D.; Dünner, R.; Edenton, M.; Bouhargani, H. El; Errard, J.; Fabbian, G.; Fanfani, V.; Farren, G. S.; Fergusson, J.; Ferraro, S.; Flauger, R.; Foster, A.; Freese, K.; Frisch, J. C.; Frolov, A.; Fuller, G.; Galitzki, N.; Gallardo, P. A.; Ghersi, J. T. Galvez; Ganga, K.; Gao, J.; Garrido, X.; Gawiser, E.; Gerbino, M.; Gerras, R.; Giardiello, S.; Gill, A.; Gilles, V.; Giri, U.; Gleave, E.; Gluscevic, V.; Goeckner-Wald, N.; Golec, J. E.; Gordon, S.; Gralla, M.; Gratton, S.; Green, D.; Groh, J. C.; Groppi, C.; Guan, Y.; Gupta, N.; Guðmundsson, J. E.; Hagstotz, S.; Hargrave, P.; Haridas, S.; Harrington, K.; Harrison, I.; Hasegawa, M.; Hasselfield, M.; Haynes, V.; Hazumi, M.; He, A.; Healy, E.; Henderson, S. W.; Hensley, B. S.; Hertig, E.; Hervías-Caimapo, C.; Higuchi, M.; Hill, C. A.; Hill, J. C.; Hilton, G.; Hilton, M.; Hincks, A. D.; Hinshaw, G.; Hložek, R.; Ho, A. Y. Q.; Ho, S.; Ho, S. P.; Hoang, T. D.; Hoh, J.; Hornecker, E.; Hornsby, A. L.; Hotinli, S. C.; Huang, Z.; Huber, Z. B.; Hubmayr, J.; Huffenberger, K.; Hughes, J. P.; Lonappan, A. Idicherian; Ikape, M.; Irwin, K.; Iuliano, J.; Jaffe, A. H.; Jain, B.; Jense, H. T.; Jeong, O.; Johnson, A.; Johnson, B. R.; Johnson, M.; Jones, M.; Jost, B.; Kaneko, D.; Karpel, E. D.; Kasai, Y.; Katayama, N.; Keating, B.; Keller, B.; Keskitalo, R.; Kim, J.; Kisner, T.; Kiuchi, K.; Klein, J.; Knowles, K.; Kofman, A. M.; Koopman, B. J.; Kosowsky, A.; Kou, R.; Krachmalnicoff, N.; Kramer, D.; Krishak, A.; Krolewski, A.; Kusaka, A.; Kusiak, A.; La Plante, P.; La Posta, A.; Laguë, A.; Lashner, J.; Lattanzi, M.; Lee, A.; Lee, E.; Leech, J.; Lessler, C.; Leung, J. S.; Lewis, A.; Li, Y.; Li, Z.; Limon, M.; Lin, L.; Link, M.; Liu, J.; Liu, Y.; Lonergan, J.; Louis, T.; Lucas, T.; Ludlam, M.; Lungu, M.; Lyons, M.; MacCrann, N.; MacInnis, A.; Madhavacheril, M.; Mak, D.; Maldonado, F.; Mallaby-Kay, M.; Manduca, A.; Mangu, A.; Mani, H.; Maniyar, A. S.; Marques, G. A.; Mates, J.; Matsumura, T.; Mauskopf, P.; May, A.; McCallum, N.; McCarrick, H.; McCarthy, F.; McCulloch, M.; McMahon, J.; Meerburg, P. D.; Mehta, Y.; Melin, J.; Meyers, J.; Middleton, A.; Miller, A.; Mirmelstein, M.; Moodley, K.; Moore, J.; Morshed, M.; Morton, T.; Moser, E.; Mroczkowski, T.; Murata, M.; Münchmeyer, M.; Naess, S.; Nakata, H.; Namikawa, T.; Nashimoto, M.; Nati, F.; Natoli, P.; Negrello, M.; Nerval, S. K.; Newburgh, L.; Nguyen, D. V.; Nicola, A.; Niemack, M. D.; Nishino, H.; Nishinomiya, Y.; Orlando, A.; Orlowski-Scherer, J.; Pagano, L.; Page, L. A.; Pandey, S.; Papageorgiou, A.; Paraskevakos, I.; Partridge, B.; Patki, R.; Peel, M.; Sarmiento, K. Perez; Perrotta, F.; Phakathi, P.; Piccirillo, L.; Pierpaoli, E.; Pinsonneault-Marotte, T.; Pisano, G.; Poletti, D.; Puddu, R.; Puglisi, G.; Qu, F. J.; Randall, M. J.; Ranucci, C.; Raum, C.; Reeves, R.; Reichardt, C. L.; Remazeilles, M.; Rephaeli, Y.; Riechers, D.; Robe, J.; Robertson, M. F.; Robertson, N.; Rogers, K.; Rojas, F.; Romero, A.; Rosenberg, E.; Rotti, A.; Rowe, S.; Roy, A.; Sadeh, S.; Sailer, N.; Sakaguri, K.; Sakuma, T.; Sakurai, Y.; Salatino, M.; Sanders, G. H.; Sasaki, D.; Rao, M. Sathyanarayana; Satterthwaite, T. P.; Saunders, L.; Scalcinati, L.; Schaan, E.; Schmitt, B.; Schmittfull, M.; Sehgal, N.; Seibert, J.; Seino, Y.; Seljak, U.; Shaikh, S.; Shaw, E.; Shellard, P.; Sherwin, B.; Shimon, M.; Shroyer, J. E.; Sierra, C.; Sievers, J.; Sifón, C.; Sikhosana, P.; Silva-Feaver, M.; Simon, S. M.; Sinclair, A.; Smith, K.; Sohn, W.; Song, X.; Sonka, R. F.; Spergel, D.; Spisak, J.; Staggs, S. T.; Stein, G.; Stevens, J. R.; Stompor, R.; Storer, E.; Sudiwala, R.; Sugiyama, J.; Surrao, K. M.; Sutariya, S.; Suzuki, A.; Suzuki, J.; Tajima, O.; Takakura, S.; Takeuchi, A.; Tansieri, I.; Taylor, A. C.; Teply, G.; Terasaki, T.; Thomas, A.; Thomas, D. B.; Thornton, R.; Trac, H.; Tsan, T.; Sang, E. Tsang King; Tucker, C.; Ullom, J.; Vacher, L.; Vale, L.; van Engelen, A.; Van Lanen, J.; van Marrewijk, J.; Van Winkle, D. D.; Vargas, C.; Vavagiakis, E. M.; Veenendaal, I.; Vergès, C.; Vissers, M.; Viña, M.; Wagoner, K.; Walker, S.; Walters, L.; Wang, Y.; Westbrook, B.; Williams, J.; Williams, P.; Winch, H.; Wollack, E. J.; Wolz, K.; Wong, J.; Xu, Z.; Yamada, K.; Young, E.; Yu, B.; Yu, C.; Zannoni, M.; Zheng, K.; Zhu, N.; Zonca, A.; Zubeldia, I.

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Kobayashi, Takahiro; Toichi, Yuichiro; Yaji, Koichiro; Nakata, Yoshitaka; Yaoita, Yuchi; Iwaoka, Mutsuki; Koga, Mariko; Zhang, Yituo; Fujii, J.; Ono, Shimpei; Sassa, Yasmine, 1981; Yoshida, Yasuo; Hasegawa, Yukio; Komori, Fumio; Shin, Shik; Ichinokura, Satoru; Akiyama, Ryota; Hasegawa, Shuji; Shishidou, Tatsuya; Weinert, Michael; Sakamoto, Kazuyuki

Framtidens Lågdimensionella Skyrmion Material Nano Letters. 23(16):7675-7682