학술논문
'학술논문'
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Morais, Ivair J.; Ferreira, Yanca F. M.; Nakasu, Erich Y. T.; Nagata, Tatsuya; Inoue-Nagata, Alice K.
Plant-Virus Interactions. 11/22/2023. 2724:65-70
Academic Journal
IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 66(5):1556-1566 Oct, 2024
Academic Journal
IEEE Solid-State Circuits Magazine IEEE Solid-State Circuits Mag. Solid-State Circuits Magazine, IEEE. 13(3):55-56 Jan, 2021
Academic Journal
O’Connor, Carolyn; Brown, Shannon; Nagata, Jason M.; Testa, Alexander; Mishna, Faye; Ganson, Kyle T.
The Canadian Journal of Human Sexuality. 34(1):17-30
Academic Journal
IEEE Open Journal of the Solid-State Circuits Society IEEE Open J. Solid-State Circuits Soc. Solid-State Circuits Society, IEEE Open Journal of the. 4:365-375 2024
Academic Journal
Watanabe, K.; Sakai, R.; Tanaka, S.; Nagata, M.; Osaka, H.; Nakamura, A.; Wu, I.; Matsumoto, Y.; Gotoh, K.
IEEE Access Access, IEEE. 12:11642-11652 2024
Academic Journal
IEEE Solid-State Circuits Magazine IEEE Solid-State Circuits Mag. Solid-State Circuits Magazine, IEEE. 15(1):25-31 Jan, 2023
Academic Journal
In: Respiratory Care ; (New Rochelle, New York) Aug2017; v.62 n.8, 1118-1120. (3p)
Conference
2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2021 13th International Workshop on the. :25-28 Mar, 2022
Conference
Shibahara, K.; Mifuji, N.; Kawabata, K.; Kugimiya, T.; Furumoto, H.; Tauno, M.; Yokoyama, S.; Nagata, M.; Miyazaki, S.; Hirose, M.
International Electron Devices Meeting. Technical Digest Electron devices Electron Devices Meeting, 1996. IEDM '96., International. :579-582 1996
Academic Journal
IEEE Letters on Electromagnetic Compatibility Practice and Applications IEEE Lett. on Electromagn. Compat. Pract. and Appl. Electromagnetic Compatibility Practice and Applications, IEEE Letters on. 4(4):92-96 Dec, 2022
Academic Journal
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 39(5):79-87 Oct, 2022
Academic Journal
Sonoda, H.; Kasai, R.; Tanaka, D.; Murakami, Y.; Mihara, K.; Araga, Y.; Watanabe, N.; Shimamoto, H.; Kikuchi, K.; Miki, T.; Nagata, M.
IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 12(7):1140-1149 Jul, 2022
Academic Journal
Knol, MJ; Poot, RA; Evans, TE; Satizabal, CL; Mishra, A; Sargurupremraj, M; van der Auwera, S; Duperron, MG; Jian, X; Hostettler, IC; van Dam-Nolen, DHK; Lamballais, S; Pawlak, MA; Lewis, CE; Carrion-Castillo, A; van Erp, TGM; Reinbold, CS; Shin, J; Scholz, M; Håberg, AK; Kämpe, A; Li, GHY; Avinun, R; Atkins, JR; Hsu, FC; Amod, AR; Lam, M; Tsuchida, A; Teunissen, MWA; Aygün, N; Patel, Y; Liang, D; Beiser, AS; Beyer, F; Bis, JC; Bos, D; Bryan, RN; Bülow, R; Caspers, S; Catheline, G; Cecil, CAM; Dalvie, S; Dartigues, JF; DeCarli, C; Enlund-Cerullo, M; Ford, JM; Franke, B; Freedman, BI; Friedrich, N; Green, MJ; Haworth, S; Helmer, C; Hoffmann, P; Homuth, G; Ikram, MK; Jack, CR; Jahanshad, N; Jockwitz, C; Kamatani, Y; Knodt, AR; Li, S; Lim, K; Longstreth, WT; Macciardi, F; Mäkitie, O; Mazoyer, B; Medland, SE; Miyamoto, S; Moebus, S; Mosley, TH; Muetzel, R; Mühleisen, TW; Nagata, M; Nakahara, S; Palmer, ND; Pausova, Z; Preda, A; Quidé, Y; Reay, WR; Roshchupkin, GV; Schmidt, R; Schreiner, PJ; Setoh, K; Shapland, CY; Sidney, S; St Pourcain, B; Stein, JL; Tabara, Y; Teumer, A; Uhlmann, A; van der Lugt, A; Vernooij, MW; Werring, DJ; Windham, BG; Witte, AV; Wittfeld, K; Yang, Q; Yoshida, K; Brunner, HG; Le Grand, Q; Sim, K; Stein, DJ; Bowden, DW; Cairns, MJ; Hariri, AR; Cheung, CL; Andersson, S; Villringer, A; Paus, T; Cichon, S; Calhoun, VD; Crivello, F; Launer, LJ; White, T; Koudstaal, PJ; Houlden, H; Fornage, M; Matsuda, F; Grabe, HJ; Ikram, MA; Debette, S; Thompson, PM; Seshadri, S; Adams, HHH
Cell reports. Medicine. 5(5):101529
Academic Journal
Kyle T. Ganson (ORCID 0000-0003-3889-3716 ); Alexander Testa; Rachel F. Rodgers; Dylan B. Jackson; Jason M. Nagata
Academic Journal
Academic Journal
Monta, K.; Sonoda, H.; Okidono, T.; Araga, Y.; Watanabe, N.; Shimamoto, H.; Kikuchi, K.; Miura, N.; Miki, T.; Nagata, M.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(4):2077-2082 Apr, 2021
Academic Journal
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 58(7):1823-1824 Jul, 2023
Academic Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(1):5-14 Jan, 2022
Academic Journal
Miki, T.; Nagata, M.; Sonoda, H.; Miura, N.; Okidono, T.; Araga, Y.; Watanabe, N.; Shimamoto, H.; Kikuchi, K.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 55(10):2747-2755 Oct, 2020
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