부산대학교 도서관

Kim, Jae-Jun; Kurial, Simone N. T.; Choksi, Pervinder K.; Nunez, Miguel; Lunow-Luke, Tyler; Bartel, Jan; Driscoll, Julia; Her, Chris L.; Dhillon, Simaron; Yue, William; Murti, Abhishek; Mao, Tin; Ramos, Julian N.; Tiyaboonchai, Amita; Grompe, Markus; Mattis, Aras N.; Syed, Shareef M.; Wang, Bruce M.; Maher, Jacquelyn J.; Roll, Garrett R.; Willenbring, Holger

Nature Biotechnology: The Science and Business of Biotechnology. 43(12):1966-1978

Shi, Meng; Liu, Cheng; Yan, Haitao; Mao, Haiyang; Han, Baodong; Xia, Guangmei

2019 China Semiconductor Technology International Conference (CSTIC) China Semiconductor Technology International Conference (CSTIC), 2019. :1-3 Mar, 2019

Feng X; Key Laboratory of Precision and Intelligent Chemistry, National Synchrotron Radiation Laboratory, Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China.; Zhang K; Key Laboratory of Precision and Intelligent Chemistry, National Synchrotron Radiation Laboratory, Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China.; Zhang J; Key Laboratory of Precision and Intelligent Chemistry, National Synchrotron Radiation Laboratory, Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China.; Mao K; Key Laboratory of Precision and Intelligent Chemistry, National Synchrotron Radiation Laboratory, Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China.; Zhu Z; Key Laboratory of Precision and Intelligent Chemistry, National Synchrotron Radiation Laboratory, Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China.; Cai F; Key Laboratory of Precision and Intelligent Chemistry, National Synchrotron Radiation Laboratory, Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China.; Huang R; i-Lab, Vacuum Interconnected Nanotech Workstation, Suzhou Institute of Nano-Tech and NanoBionics, Chinese Academy of Sciences, Suzhou 215123, China.; Cui Y; i-Lab, Vacuum Interconnected Nanotech Workstation, Suzhou Institute of Nano-Tech and NanoBionics, Chinese Academy of Sciences, Suzhou 215123, China.; Wu X; Key Laboratory of Precision and Intelligent Chemistry, National Synchrotron Radiation Laboratory, Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China.; Xu J; Key Laboratory of Precision and Intelligent Chemistry, National Synchrotron Radiation Laboratory, Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 9918574281706676 Publication Model: eCollection Cited Medium: Internet ISSN: 2771-9316 (Electronic) Linking ISSN: 27719316 NLM ISO Abbreviation: Precis Chem Subsets: PubMed not MEDLINE

Yuan C; School of Microelectronics, University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230026, China.; Wang J; School of Microelectronics, University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230026, China.; School of Optoelectronics, Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, No. 19, Yuquan Road, Beijing, 100049, China.; Yang Y; School of Microelectronics, University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230026, China.; Ma X; School of Microelectronics, University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230026, China.; Zhao Z; School of Microelectronics, University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230026, China.; Sun M; School of Microelectronics, University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230026, China.; Xu H; School of Microelectronics, University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230026, China.; Pan Y; School of Optoelectronics, Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, No. 19, Yuquan Road, Beijing, 100049, China.; Hu J; Department of Physics, Center for Optoelectronics Engineering Research, Yunnan University, South Section, East Outer Ring Road, Chenggong District, Kunming, 650500, China.; Mao K; Hefei National Research Center for Physical Sciences at the Microscale, CAS Key Laboratory of Materials for Energy Conversion, Department of Materials Science and Engineering, University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230026, China.; Li Y; National Synchrotron Radiation Laboratory (NSRL), University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230029, China.; Ding H; National Synchrotron Radiation Laboratory (NSRL), University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230029, China.; Luo D; International Institute for Interdisciplinary and Frontiers, Beihang University, No. 238, North Fourth Ring Middle Road, Beijing, 100191, China.; Yang Y; School of Microelectronics, Fudan University, No. 825, Zhangheng Road, Pudong District, Shanghai, 200433, China.; Zhu J; National Synchrotron Radiation Laboratory (NSRL), University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230029, China.; Abate A; Helmholtz-Zentrum Berlin für Materialien und Energie (HZB), Hahn-Meitner-Platz 1, 14109, Berlin, Germany.; Xu J; Hefei National Research Center for Physical Sciences at the Microscale, CAS Key Laboratory of Materials for Energy Conversion, Department of Materials Science and Engineering, University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230026, China.; Lu Z; Department of Physics, Center for Optoelectronics Engineering Research, Yunnan University, South Section, East Outer Ring Road, Chenggong District, Kunming, 650500, China.; Meng X; School of Optoelectronics, Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, No. 19, Yuquan Road, Beijing, 100049, China.; Jen AK; Department of Materials Science and Engineering, Hong Kong Institute for Clean Energy, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong SAR, China.; Hu Q; School of Microelectronics, University of Science and Technology of China, No. 96, Jinzhai Road, Hefei, Anhui, 230026, China.

Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 101235338 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1613-6829 (Electronic) Linking ISSN: 16136810 NLM ISO Abbreviation: Small Subsets: MEDLINE; PubMed not MEDLINE

Mao, Jianhua; Ye, Ling

2010 International Conference on Audio, Language and Image Processing Audio Language and Image Processing (ICALIP), 2010 International Conference on. :1557-1560 Nov, 2010

Akiyama, Kazunori; Alberdi, Antxon; Alef, Walter; Algaba, Juan-Carlos; Anantua, Richard; Asada, Keiichi; Azulay, Rebecca; Bach, Uwe; Baczko, Anne-Kathrin, 1988; Ball, David; Balokovic, Mislav; Barrett, John; Baubock, Michi; Benson, Bradford A.; Bintley, Dan; Blackburn, Lindy; Blundell, Raymond; Bouman, Katherine L.; Bower, Geoffrey C.; Boyce, Hope; Bremer, Michael; Brinkerink, Christiaan D.; Brissenden, Roger; Britzen, Silke; Broderick, Avery E.; Broguiere, Dominique; Bronzwaer, Thomas; Bustamante, Sandra; Byun, Do-Young; Carlstrom, John E.; Ceccobello, Chiara, 1984; Chael, Andrew; Chan, Chi-kwan; Chatterjee, Koushik; Chatterjee, Shami; Chen, Ming-Tang; Chen, Yongjun; Cheng, Xiaopeng; Cho, Ilje; Christian, Pierre; Conroy, Nicholas S.; Conway, John, 1963; Cordes, James M.; Crawford, Thomas M.; Crew, Geoffrey B.; Cruz-Osorio, Alejandro; Cui, Yuzhu; Davelaar, Jordy; De Laurentis, Mariafelicia; Deane, Roger; Dempsey, Jessica; Desvignes, Gregory; Dexter, Jason; Dhruv, Vedant; Doeleman, Sheperd S.; Dougal, Sean; Dzib, Sergio A.; Eatough, Ralph P.; Emami, Razieh; Falcke, Heino; Farah, Joseph; Fish, Vincent L.; Fomalont, Ed; Ford, H. Alyson; Fraga-Encinas, Raquel; Freeman, William T.; Friberg, Per; Fromm, Christian M.; Fuentes, Antonio; Galison, Peter; Gammie, Charles F.; Garcia, Roberto; Gentaz, Olivier; Georgiev, Boris; Goddi, Ciriaco; Gold, R.; Gomez-Ruiz; Gomez, Jose L.; Gu, Minfeng; Gurwell, Mark; Hada, Kazuhiro; Haggard, Daryl; Haworth, Kari; Hecht, Michael H.; Hesper, Ronald; Heumann, Dirk; Ho, Luis C.; Ho, Paul; Honma, Mareki; Huang, Chih-Wei L.; Huang, Lei; Hughes, David H.; Ikeda, Shiro; Impellizzeri, C. M. Violette; Inoue, Makoto; Issaoun, Sara; James, David J.; Jannuzi, Buell T.; Janssen, Michael; Jeter, Britton; Jiang, Wu; Jimenez-Rosales, Alejandra; Johnson, Michael D.; Jorstad, Svetlana; Joshi; Jung, Taehyun; Karami, Mansour; Karuppusamy, Ramesh; Kawashima, Tomohisa; Keating, Garrett K.; Kettenis, Mark; Kim, Dong-Jin; Kim, Jae-Young; Kim, Jongsoo; Kim, Junhan; Kino, Motoki; Koay, Jun Yi; Kocherlakota, Prashant; Kofuji, Yutaro; Koch, Patrick M.; Koyama, Shoko; Kramer, Carsten; Kramer, Michael; Krichbaum, Thomas P.; Kuo, Cheng-Yu; La Bella, Noemi; Lauer, Tod R.; Lee, Daeyoung; Lee, Sang-Sung; Leung, Po Kin; Levis, Aviad; Li, Zhiyuan; Lico, Rocco; Lindahl, Greg; Lindqvist, Michael, 1960; Lisakov, Mikhail; Liu, Jun; Liu, Kuo; Liuzzo, Elisabetta; Lo, Wen-Ping; Lobanov, Andrei P.; Loinard, Laurent; Lonsdale, Colin J.; Lu, Ru-Sen; Mao, Jirong; Marchili, Nicola; Markoff, Sera; Marrone, Daniel P.; Marscher, Alan P.; Marti-Vidal, Ivan; Matsushita, Satoki; Matthews, Lynn D.; Medeiros, Lia; Menten, Karl M.; Michalik, Daniel; Mizuno, Izumi; Mizuno, Yosuke; Moran, James M.; Moriyama, Kotaro; Moscibrodzka, Monika; Mueller, Cornelia; Mus, Alejandro; Musoke, Gibwa; Myserlis, Ioannis; Nadolski, Andrew; Nagai, Hiroshi; Nagar, Neil M.; Nakamura, Masanori; Narayan, Ramesh; Narayanan, Gopal; Natarajan, Iniyan; Nathanail, Antonios; Fuentes, Santiago Navarro; Neilsen, Joseph; Neri, Roberto; Ni, Chunchong; Noutsos, Aristeidis; Nowak, Michael A.; Oh, Junghwan; Okino, Hiroki; Olivares, Hector; Ortiz-Leon, Gisela N.; Oyama, Tomoaki; Ozel, Feryal; Palumbo, Daniel C. M.; Paraschos, Georgios Filippos; Park, Jongho; Parsons, Harriet; Patel, Nimesh; Pen, U. L.; Pesce, Dominic W.; Pietu, Vincent; Plambeck, Richard; PopStefanija, Aleksandar; Porth, Oliver; Potzl, Felix M.; Ben Prather; Preciado-Lopez, Jorge A.; Psaltis, Dimitrios; Pu, Hung-Yi; Ramakrishnan, Venkatessh; Rao, Ramprasad; Rawlings, Mark G.; Raymond, Alexander W.; Rezzolla, Luciano; Ricarte, Angelo; Ripperda, Bart; Roelofs, Freek; Rogers, Alan; Ros, Eduardo; Romero-Canizales, Cristina; Roshanineshat, Arash; Rottmann, Helge; Roy, Alan L.; Ruiz, Ignacio; Ruszczyk, Chet; Rygl, Kazi L. J.; Sanchez, Salvador; Sanchez-Arguelles, David; Sanchez-Portal, Miguel; Sasada, Mahito; Satapathy, Kaushik; Savolainen, Tuomas; Schloerb, F. Peter; Schonfeld, Jonathan; Schuster, Karl-Friedrich; Shao, Lijing; Shen, Zhiqiang; Des Small; Sohn, Bong Won; SooHoo, Jason; Souccar, Kamal; Sun, He; Tazaki, Fumie; Tetarenko, Alexandra J.; Tiede, Paul; Tilanus, Remo P. J.; Titus, Michael; Torne, Pablo; Traianou, Efthalia; Trent, Tyler; Trippe, Sascha; Turk, Matthew; van Bemmel, Ilse; van Langevelde, Huib Jan; van Rossum, Daniel R.; Vos, Jesse; Wagner, Jan; Ward-Thompson, Derek; Wardle, John; Weintroub, Jonathan; Wex, Norbert; Wharton, Robert; Wielgus, Maciek; Wiik, Kaj; Witzel, Gunther; Wondrak, Michael F.; Wong, George N.; Wu, Qingwen; Yamaguchi, Paul; Yoon, Doosoo; Young, Andre; Young, Ken; Younsi, Ziri; Yuan, Feng; Yuan, Ye-Fei; Zensus, J. Anton; Zhang, Shuo; Zhao, Guang-Yao; Zhao, Shan-Shan; Chan, Tin Lok; Qiu, Richard; Ressler, Sean; White, Chris

Astrophysical Journal Letters. 930(2)

Xu, K.; Xu, C.; Deng, J.; Zhu, Y. X.; Guo, W. L.; Mao, M. M.; Zheng, L.; Sun, Jie, 1977

Applied Physics Letters. 102(16)

Rao, Weidong; Li, Zhiwei; Mao, Shuyu; Wei, Xianlong

2025 38th International Vacuum Nanoelectronics Conference (IVNC) Vacuum Nanoelectronics Conference (IVNC), 2025 38th International. :1-2 Jul, 2025

Liu, M.; Liu, D.; Liao, X.; Cheng, H.; Jiao, Y.; Wang, X.; Mao, M.; Yin, Z.; Liu, C.; Zhang, Q.; Tang, Z.; Zhao, D.; Peng, C.; Hu, K.; Pang, Z.; Huang, W.; Liu, Y.; Song, K.; Zhao, D.

In: Advanced Functional Materials. (Advanced Functional Materials, 2025)

Han, J.; Tang, S.; Guan, J.; Mao, Y.; Zhu, K.; Li, Y.; Li, P.

In: Ceramics International. (Ceramics International, 1 December 2024, 50(23):49066-49084)

Gao, X.; Zhou, Z.; Mao, J.; Holtz, F.; Breiter, K.; Romer, R.L.; Cook, N.J.

In: Scientific Reports. (Scientific Reports, December 2024, 14(1))

Kong, L.; Li, Z.; Zhu, Z.; Dong, H.; Shu, H.; Hu, Q.; Yang, W.; Mao, H.-K.; Liu, G.; Gong, J.; Liu, X.; Zhu, Y.; Spanopoulos, I.; Kanatzidis, M.G.; Yan, S.

In: Advanced Functional Materials. (Advanced Functional Materials, 12 November 2024, 34(46))

Liu B; CAS Key Laboratory of Soil Environment and Pollution Remediation, Institute of Soil Science, Chinese Academy of Sciences, 210008, Nanjing, China.; University of Chinese Academy of Sciences, 100049, Beijing, China.; Tian K; CAS Key Laboratory of Soil Environment and Pollution Remediation, Institute of Soil Science, Chinese Academy of Sciences, 210008, Nanjing, China. tiank@issas.ac.cn.; Huang B; CAS Key Laboratory of Soil Environment and Pollution Remediation, Institute of Soil Science, Chinese Academy of Sciences, 210008, Nanjing, China.; Zhang X; Key Laboratory of Integrated Regulation and Resources Development of Shallow Lakes of Ministry of Education, College of Environment, Hohai University, 210098, Nanjing, China.; Bian Z; Key Laboratory of Regional Environment and Eco-Remediation, Ministry of Education, Shenyang University, 110044, Shenyang, China.; Mao Z; Key Laboratory of Integrated Regulation and Resources Development of Shallow Lakes of Ministry of Education, College of Environment, Hohai University, 210098, Nanjing, China.; Yuan X; Key Laboratory of Integrated Regulation and Resources Development of Shallow Lakes of Ministry of Education, College of Environment, Hohai University, 210098, Nanjing, China.; Fu J; Faculty of Environmental Science and Engineering, Kunming University of Science and Technology, 650500, Kunming, China.; Wu L; CAS Key Laboratory of Soil Environment and Pollution Remediation, Institute of Soil Science, Chinese Academy of Sciences, 210008, Nanjing, China.

Publisher: Springer Verlag Country of Publication: United States NLM ID: 0046021 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1432-0800 (Electronic) Linking ISSN: 00074861 NLM ISO Abbreviation: Bull Environ Contam Toxicol Subsets: MEDLINE

Bian Z; Key Laboratory of Regional Environment and Eco-Remediation (Shenyang University), Ministry of Education, Shenyang, 110044, China.; CAS Key Laboratory of Soil Environment and Pollution Remediation, Institute of Soil Science, Chinese Academy of Sciences, Nanjing, 210008, China.; Sun L; Key Laboratory of Regional Environment and Eco-Remediation (Shenyang University), Ministry of Education, Shenyang, 110044, China.; Tian K; CAS Key Laboratory of Soil Environment and Pollution Remediation, Institute of Soil Science, Chinese Academy of Sciences, Nanjing, 210008, China. tiank@issas.ac.cn.; Liu B; CAS Key Laboratory of Soil Environment and Pollution Remediation, Institute of Soil Science, Chinese Academy of Sciences, Nanjing, 210008, China.; Zhang X; CAS Key Laboratory of Soil Environment and Pollution Remediation, Institute of Soil Science, Chinese Academy of Sciences, Nanjing, 210008, China.; Key Laboratory of Integrated Regulation and Resources Development of Shallow Lakes of the Ministry of Education, College of Environment, Hohai University, Nanjing, 210098, China.; Mao Z; CAS Key Laboratory of Soil Environment and Pollution Remediation, Institute of Soil Science, Chinese Academy of Sciences, Nanjing, 210008, China.; Key Laboratory of Integrated Regulation and Resources Development of Shallow Lakes of the Ministry of Education, College of Environment, Hohai University, Nanjing, 210098, China.; Huang B; CAS Key Laboratory of Soil Environment and Pollution Remediation, Institute of Soil Science, Chinese Academy of Sciences, Nanjing, 210008, China.; Wu L; CAS Key Laboratory of Soil Environment and Pollution Remediation, Institute of Soil Science, Chinese Academy of Sciences, Nanjing, 210008, China.

Publisher: Springer Verlag Country of Publication: United States NLM ID: 0046021 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1432-0800 (Electronic) Linking ISSN: 00074861 NLM ISO Abbreviation: Bull Environ Contam Toxicol Subsets: MEDLINE

Luan, H.F.; Lee, S.J.; Lee, C.H.; Song, S.C.; Mao, Y.L.; Senzaki, Y.; Roberts, D.; Kwong, D.L.

International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :141-144 1999

Zhao, Z.; Sun, M.; Yuan, C.; Yang, Y.; Hu, Q.; Ji, Y.; He, L.; Mao, K.; Xu, J.; Huang, Z.; Chen, W.; Xiao, Z.; Ding, H.; Li, Y.; Zhu, J.; Yang, Y.; Wei, J.; Paritmongkol, W.; Abate, A.

In: Nano Letters. (Nano Letters, 8 May 2024, 24(18):5513-5520)

Chen, X.; Mao, K.; Yang, W.; Yang, W.; Yan, J.; Li, P.; Jiang, H.

In: Dizhi Xuebao/Acta Geologica Sinica. (Dizhi Xuebao/Acta Geologica Sinica, November 2023, 97(11):3846-3860)

Bian, H.; Gu, J.; Song, Z.; Gong, H.; Zhang, Z.; Mao, W.; Bao, K.

In: Journal of Materials Science: Materials in Electronics. (Journal of Materials Science: Materials in Electronics, September 2023, 34(26))

Mao, M.-M.; Xu, C.; Xie, Y.-Y.; Kan, Q.; Xun, M.; Xu, K.; Wang, J.; Ren, H.-Q.; Chen, H.-D.

IEEE Photonics Journal IEEE Photonics J. Photonics Journal, IEEE. 5(6):1502606-1502606 Dec, 2013

Xiao, B.; Wu, G.; Wang, T.; Wei, Z.; Sui, Y.; Shen, B.; Qi, J.; Wei, F.; Meng, Q.; Ren, Y.; Xue, X.; Zheng, J.; Mao, J.; Dai, K.; Yan, Q.

In: Ceramics International. (Ceramics International, 15 January 2022, 48(2):2118-2123)