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Academic Journal
In: Revue Francaise de Psychanalyse . (Revue Francaise de Psychanalyse, 4 June 2024, 88(3):57-67)
Academic Journal
S. Petton; F. Pernet; V. Le Roy; M. Huber; S. Martin; É. Macé; Y. Bozec; S. Loisel; P. Rimmelin-Maury; É. Grossteffan; M. Repecaud; L. Quemener; M. Retho; S. Manac'h; M. Papin; P. Pineau; T. Lacoue-Labarthe; J. Deborde; L. Costes; P. Polsenaere; L. Rigouin; J. Benhamou; L. Gouriou; J. Lequeux; N. Labourdette; N. Savoye; G. Messiaen; E. Foucault; V. Ouisse; M. Richard; F. Lagarde; F. Voron; V. Kempf; S. Mas; L. Giannecchini; F. Vidussi; B. Mostajir; Y. Leredde; S. Alliouane; J.-P. Gattuso; F. Gazeau
Earth System Science Data, Vol 16, Pp 1667-1688 (2024)
Treat, Claire C.; Kleinen, Thomas; Broothaerts, Nils; Dalton, April S.; Dommain, Rene; Douglas, Thomas A.; Drexler, Judith Z.; Finkelstein, Sarah A.; Grosse, Guido; Hope, Geoffrey; Hutchings, Jack; Jones, Miriam C.; Kuhry, Peter; Lacourse, Terri; Lahteenoja, Outi; Loisel, Julie; Notebaert, Bastiaan; Payne, Richard J.; Peteet, Dorothy M.; Sannel, A. Britta K.; Stelling, Jonathan M.; Strauss, Jens; Swindles, Graeme T.; Talbot, Julie; Tarnocai, Charles; Verstraeten, Gert; Williams, Christopher J.; Xia, Zhengyu; Yu, Zicheng; Valiranta, Minna; Hättestrand, Martina; Alexanderson, Helena; Brovkin, Victor
Proceedings of the National Academy of Sciences of the United States of America. 116(11):4822-4827
Conference
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020 IEEE International Symposium on. :1-4 Oct, 2020
Conference
Maron, Y.; Bernshtam, V.; Zarnitsky, Y.; Fisher, V.; Nedostup, O.; Ampleford, D. J.; Jennings, C. A.; Jones, B.; Cuneo, M. E.; Rochau, G. A.; Dunham, G. S.; Loisel, G. P.
2022 IEEE International Conference on Plasma Science (ICOPS) Plasma Science (ICOPS), 2022 IEEE International Conference on. :1-1 May, 2022
Academic Journal
A. Valente; S. Sathyendranath; V. Brotas; S. Groom; M. Grant; T. Jackson; A. Chuprin; M. Taberner; R. Airs; D. Antoine; R. Arnone; W. M. Balch; K. Barker; R. Barlow; S. Bélanger; J.-F. Berthon; Ş. Beşiktepe; Y. Borsheim; A. Bracher; V. Brando; R. J. W. Brewin; E. Canuti; F. P. Chavez; A. Cianca; H. Claustre; L. Clementson; R. Crout; A. Ferreira; S. Freeman; R. Frouin; C. García-Soto; S. W. Gibb; R. Goericke; R. Gould; N. Guillocheau; S. B. Hooker; C. Hu; M. Kahru; M. Kampel; H. Klein; S. Kratzer; R. Kudela; J. Ledesma; S. Lohrenz; H. Loisel; A. Mannino; V. Martinez-Vicente; P. Matrai; D. McKee; B. G. Mitchell; T. Moisan; E. Montes; F. Muller-Karger; A. Neeley; M. Novak; L. O'Dowd; M. Ondrusek; T. Platt; A. J. Poulton; M. Repecaud; R. Röttgers; T. Schroeder; T. Smyth; D. Smythe-Wright; H. M. Sosik; C. Thomas; R. Thomas; G. Tilstone; A. Tracana; M. Twardowski; V. Vellucci; K. Voss; J. Werdell; M. Wernand; B. Wojtasiewicz; S. Wright; G. Zibordi
Earth System Science Data, Vol 14, Pp 5737-5770 (2022)
Academic Journal
In: Information Psychiatrique . (Information Psychiatrique, March 2022, 98(3):207-212)
Academic Journal
In Neuropsychiatrie de l'enfance et de l'adolescence May 2022 70(3):141-145
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[검색어] Loisel, Y.
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