부산대학교 도서관

Brennan C; Department of Physics and Astronomy, College of Charleston, 58 Coming Street, Charleston, South Carolina 29424, United States.; Joly AG; Physical Sciences Division, Pacific Northwest National Laboratory, P.O. Box 999, Richland, Washington 99352, United States.; Wang CF; Physical Sciences Division, Pacific Northwest National Laboratory, P.O. Box 999, Richland, Washington 99352, United States.; Xie T; Department of Electrical and Computer Engineering and Quantum Technology Center, University of Maryland, College Park, Maryland 20742, United States.; O'Callahan BT; Physical Sciences Division, Pacific Northwest National Laboratory, P.O. Box 999, Richland, Washington 99352, United States.; Crampton K; Environmental Molecular Sciences Division, Pacific Northwest National Laboratory, P.O. Box 999, Richland, Washington 99352, United States.; Teklu A; Department of Physics and Astronomy, College of Charleston, 58 Coming Street, Charleston, South Carolina 29424, United States.; Shi L; Department of Engineering, College of Charleston, 81 St. Philips Street, Charleston, South Carolina 29424, United States.; Hu M; Department of Mechanical Engineering, University of South Carolina, 541 Main Street, Columbia, South Carolina 29208, United States.; Zhang Q; Department of Engineering, College of Charleston, 81 St. Philips Street, Charleston, South Carolina 29424, United States.; Kuthirummal N; Department of Engineering, College of Charleston, 81 St. Philips Street, Charleston, South Carolina 29424, United States.; Arachchige HS; Department of Physics and Astronomy, The University of Tennessee, Knoxville, Tennessee 37996, United States.; Chaturvedi A; Center for Programmable Materials, School of Materials Science and Engineering, Nanyang Technological University, Singapore 639798.; Zhang H; Department of Chemistry, City University of Hong Kong, Hong Kong 999077, China.; Hong Kong Institute for Clean Energy, City University of Hong Kong, Hong Kong 999077, China.; Hong Kong Branch of National Precious Metals Material Engineering Research Center (NPMM), City University of Hong Kong, Hong Kong 999077, China.; Shenzhen Research Institute, City University of Hong Kong, Shenzhen 518057, China.; Mandrus D; Department of Materials Science and Engineering, The University of Tennessee, Knoxville, Tennessee 37996, United States.; Gong C; Department of Electrical and Computer Engineering and Quantum Technology Center, University of Maryland, College Park, Maryland 20742, United States.; Gong Y; Department of Physics and Astronomy, College of Charleston, 58 Coming Street, Charleston, South Carolina 29424, United States.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 101526034 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1948-7185 (Electronic) Linking ISSN: 19487185 NLM ISO Abbreviation: J Phys Chem Lett Subsets: MEDLINE

K. LINGAM; J. REPPERT; D. DICKEL; R. PODILA; P. PUNEET; E. SHEFTIC; N. KUTHIRUMMAL; M. SKOVE; J. HE; A. M. RAO

NANO, 7(2), pp.116-125 Apr, 2012

Gong, Y.; Teklu, A.; Kern, N.; Brennan, C.; Kuthirummal, N.; Cetin, J.; Zhang, Q.; Yang, Z.; Hu, M.; Xie, T.; Gong, C.; May, A.F.; McGuire, M.; Guo, E.-J.

In: Ultrafast Science. (Ultrafast Science, 2024, 4)

Yoosuf, S.; Chennikkad, R.; Nanakkal, R.; Begum Tharayil, S.; Rajan, A.; Chatanathodi, R.; Kuthirummal, N.

In: Materials Science and Engineering: B. (Materials Science and Engineering: B, August 2023, 294)

Manayath GJ; Department of Vitreo-Retina, Aravind Eye Hospital and Postgraduate Institute of Ophthalmology, Coimbatore, India .; Kuthirummal N; Ranjan R; Verghese S; Venkatapathy N

Publisher: Wolters Kluwer Health Country of Publication: United States NLM ID: 101298744 Publication Model: Print Cited Medium: Internet ISSN: 1937-1578 (Electronic) Linking ISSN: 19351089 NLM ISO Abbreviation: Retin Cases Brief Rep Subsets: MEDLINE

Muthukumar, V. Sai; Reppert, J.; Sandeep, C.S. Suchand; Krishnan, S. Siva Rama; Podila, R.; Kuthirummal, N.; Sai, S. Siva Sankara; Venkataramaniah, K.; Philip, R.; Rao, A.M.

In Optics Communications 2010 283(20):4104-4107

Gong Y; Department of Physics and Astronomy, College of Charleston, 58 Coming Street, Charleston, South Carolina 29424, United States.; Bi X; Department of Physical Sciences, Charleston Southern University, 9200 University Blvd, Charlest on, South Carolina 29485, United States.; Chen N; Department of Chemistry and Biochemistry, College of Charleston, 66 George Street, Charleston, South Carolina 29424, United States.; Forconi M; Department of Chemistry and Biochemistry, College of Charleston, 66 George Street, Charleston, South Carolina 29424, United States.; Kuthirummal N; Department of Physics and Astronomy, College of Charleston, 58 Coming Street, Charleston, South Carolina 29424, United States.; Teklu A; Department of Physics and Astronomy, College of Charleston, 58 Coming Street, Charleston, South Carolina 29424, United States.; Gao B; Department of Physics and Astronomy, Hunter College, City University of New York, New York, New York 10065, United States.; Koenemann J; Department of Physics and Astronomy, College of Charleston, 58 Coming Street, Charleston, South Carolina 29424, United States.; Harris N; Department of Physics and Astronomy, College of Charleston, 58 Coming Street, Charleston, South Carolina 29424, United States.; Brennan C; Department of Physics and Astronomy, College of Charleston, 58 Coming Street, Charleston, South Carolina 29424, United States.; Thomas M; Department of Physical Sciences, Charleston Southern University, 9200 University Blvd, Charlest on, South Carolina 29485, United States.; Barnes T; Department of Physical Sciences, Charleston Southern University, 9200 University Blvd, Charlest on, South Carolina 29485, United States.; Hu M; Department of Mechanical Engineering, University of South Carolina, 541 Main Street, Columbia, South Carolina 29208, United States.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 101157530 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1520-5207 (Electronic) Linking ISSN: 15205207 NLM ISO Abbreviation: J Phys Chem B Subsets: MEDLINE

Gong, Y.; Harris, N.; Teklu, A.; Kuthirummal, N.; koenemann, J.; McLoud, W.; Hu, M.; Yang, Z.; Xie, T.; Gong, C.; Xu, X.; Cheong, S.-W.

In: npj 2D Materials and Applications. (npj 2D Materials and Applications, December 2022, 6(1))

Yates-Alston S; Department of Plastic and Reconstructive Surgery, Wake Forest University Health Sciences, Winston-Salem, North Carolina, USA.; Sarkar S; Department of Plastic and Reconstructive Surgery, Wake Forest University Health Sciences, Winston-Salem, North Carolina, USA.; Cochran M; Department of Plastic and Reconstructive Surgery, Wake Forest University Health Sciences, Winston-Salem, North Carolina, USA.; Kuthirummal N; Department of Physics and Astronomy, College of Charleston, Charleston, SC, USA.; Levi N; Department of Plastic and Reconstructive Surgery, Wake Forest University Health Sciences, Winston-Salem, North Carolina, USA. Electronic address: nlevi@wakehealth.edu.

Publisher: Elsevier Biomedical Country of Publication: Netherlands NLM ID: 8306883 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1872-8359 (Electronic) Linking ISSN: 01677012 NLM ISO Abbreviation: J Microbiol Methods Subsets: MEDLINE

Nikhil Kuthirummal; Murugesan Vanathi; Ritika Mukhija; Noopur Gupta; Rachna Meel; Rohit Saxena; Radhika Tandon

Indian Journal of Ophthalmology, Vol 68, Iss 1, Pp 59-64 (2020)