학술논문
전자자료 공정이용 안내
우리 대학 도서관에서 구독·제공하는 모든 전자자료(데이터베이스, 전자저널, 전자책 등)는 국내외 저작권법과 출판사와의 라이선스 계약에 따라 엄격하게 보호를 받고 있습니다.
전자자료의 비정상적 이용은 출판사로부터의 경고, 서비스 차단, 손해배상 청구 등 학교 전체에 심각한 불이익을 초래할 수 있으므로, 아래의 공정이용 지침을 반드시 준수해 주시기 바랍니다.
공정이용 지침
- 전자자료는 개인의 학습·교육·연구 목적의 비영리적 사용에 한하여 이용할 수 있습니다.
- 합리적인 수준의 다운로드 및 출력만 허용됩니다. (일반적으로 동일 PC에서 동일 출판사의 논문을 1일 30건 이하 다운로드할 것을 권장하며, 출판사별 기준에 따라 다를 수 있습니다.)
- 출판사에서 제공한 논문의 URL을 수업 관련 웹사이트에 게재할 수 있으나, 출판사 원문 파일 자체를 복제·배포해서는 안 됩니다.
- 본인의 ID/PW를 타인에게 제공하지 말고, 도용되지 않도록 철저히 관리해 주시기 바랍니다.
불공정 이용 사례
- 전자적·기계적 수단(다운로딩 프로그램, 웹 크롤러, 로봇, 매크로, RPA 등)을 이용한 대량 다운로드
- 동일 컴퓨터 또는 동일 IP에서 단시간 내 다수의 원문을 집중적으로 다운로드하거나, 전권(whole issue) 다운로드
- 저장·출력한 자료를 타인에게 배포하거나 개인 블로그·웹하드 등에 업로드
- 상업적·영리적 목적으로 자료를 전송·복제·활용
- ID/PW를 타인에게 양도하거나 타인 계정을 도용하여 이용
- EndNote, Mendeley 등 서지관리 프로그램의 Find Full Text 기능을 이용한 대량 다운로드
- 출판사 콘텐츠를 생성형 AI 시스템에서 활용하는 행위(업로드, 개발, 학습, 프로그래밍, 개선 또는 강화 등)
위반 시 제재
- 출판사에 의한 해당 IP 또는 기관 전체 접속 차단
- 출판사 배상 요구 시 위반자 개인이 배상 책임 부담
'학술논문'
에서 검색결과 3,312건 | 목록
1~20
Academic Journal
IEEE Security & Privacy IEEE Secur. Privacy Security & Privacy, IEEE. 23(1):47-52 Jan, 2025
Academic Journal
Adam Round; Piere Aller; Richard J. Bean; Johan Bielecki; Agata Butryn; Nicholas Devenish; Raphael de Wijn; Thomas Dietze; Katerina Doerner; Fabio Dall'Antonia; Pontus Fischer; Gabriele Giovanetti; Sebastian Guenther; Huijong Han; Vincent Hennicke; Chan Kim; Yoonhee Kim; Marco Kloos; Jayanath C. P. Koliyadu; Gabriel Leen; Romain Letrun; Luis Lopez Morillo; Allen M. Orville; Tim Pakendorf; Marco Ramilli; Nadja Reimers; Patrick Reinke; Juan Sanchez-Weatherby; Tokushi Sato; Robin Schubert; Joachim Schulz; Cedric Signe Takem; Marcin Sikorski; Prasad Thute; Fabian Trost; Oleksii Turkot; Patrik Vagovič; Mohammad Vakili; Raul Villanueva Guerrero; Henry N. Chapman; Alke Meents; Serguei Molodtsov; Sakura Pascarelli; Thomas Tschentscher; Adrian P. Mancuso
Journal of Synchrotron Radiation, Vol 33, Iss 1, Pp 198-206 (2026)
Conference
Kloos, Carlos Delgado; Crespo Garcia, Raquel M.; Fernandez-Panadero, Carmen; Blanca Ibanez, Ma; Munoz-Organero, Mario; Pardo, Abelardo
Proceedings of the 2012 IEEE Global Engineering Education Conference (EDUCON) Global Engineering Education Conference (EDUCON), 2012 IEEE. :1-6 Apr, 2012
Academic Journal
Dmitrii Zabelskii; Ekaterina Round; Huijong Han; David von Stetten; Romain Letrun; Chan Kim; Tokushi Sato; Diogo V. M. Melo; Raphaël de Wijn; Konstantin Kharitonov; Peter Smyth; Katerina Doerner; Marco Kloos; Thomas Dietze; Luis Lopez Morillo; Richard Bean; Adam Round
Scientific Reports, Vol 15, Iss 1, Pp 1-16 (2025)
Academic Journal
IEEE Transactions on Professional Communication IEEE Trans. Profess. Commun. Professional Communication, IEEE Transactions on. 66(2):202-219 Jun, 2023
Academic Journal
Soshichiro Nagano; David von Stetten; Kaoling Guan; Peng-Yuan Chen; Chen Song; Thomas Barends; Manfred S. Weiss; Christian G. Feiler; Katerina Dörner; Iñaki de Diego Martinez; Robin Schubert; Johan Bielecki; Lea Brings; Huijong Han; Konstantin Kharitonov; Chan Kim; Marco Kloos; Jayanath C. P. Koliyadu; Faisal H. M. Koua; Ekaterina Round; Abhisakh Sarma; Tokushi Sato; Christina Schmidt; Joana Valerio; Agnieszka Wrona; Joachim Schulz; Raphael de Wijn; Romain Letrun; Richard Bean; Adrian Mancuso; Karsten Heyne; Jon Hughes
Nature Communications, Vol 16, Iss 1, Pp 1-12 (2025)
Academic Journal
N. Oosterom; M. Fiocco; R. Q. H. Kloos; I. M. van der Sluis; R. Pieters; B. D. van Zelst; D. E. C. Smith; M. M. van den Heuvel-Eibrink; R. de Jonge; S. G. Heil
BMC Cancer, Vol 20, Iss 1, Pp 1-10 (2020)
Report
Konold, Patrick E.; You, Tong; Bielecki, Johan; Valerio, Joana; Kloos, Marco; Westphal, Daniel; Bellisario, Alfredo; Varma, Tej; Wolter, August; Koliyadu, Jayanath C. P.; Koua, Faisal H. M.; Letrun, Romain; Round, Adam; Sato, Tokushi; Mésźaros, Petra; Monrroy, Leonardo; Mutisya, Jennifer; Bódizs, Szabolcs; Larkiala, Taru; Nimmrich, Amke; Alvarez, Roberto; Bean, Richard; Ekeberg, Tomas; Kirian, Richard A.; Westenhoff, Sebastian; Maia, Filipe R. N. C.
IUCrJ 10, 662-670 (2023)
Academic Journal
Wickering L; Lautwein C; Fiegler A; Allerdißen L; Kloos T; Schneider M; Hechler T; Arbeitseinheit Klinische Psychologie des Kindes- und Jugendalters, Universität Münster, Fliednerstr. 21, 48149, Münster, Deutschland. tanja.hechler@uni-muenster.de.
Publisher: Springer-Verlag Country of Publication: Germany NLM ID: 8906258 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1432-2129 (Electronic) Linking ISSN: 0932433X NLM ISO Abbreviation: Schmerz Subsets: MEDLINE
Academic Journal
Tabuenca, B.; Serrano-Iglesias, S.; Martin, A.C.; Villa-Torrano, C.; Dimitriadis, Y.; I. Asensio-Perez, J.; Alario-Hoyos, C.; Gomez-Sanchez, E.; L. Bote-Lorenzo, M.; Martinez-Mones, A.; Kloos, C.D.
IEEE Transactions on Learning Technologies IEEE Trans. Learning Technol. Learning Technologies, IEEE Transactions on. 14(2):129-145 Apr, 2021
Conference
Proceedings of the 2012 IEEE Global Engineering Education Conference (EDUCON) Global Engineering Education Conference (EDUCON), 2012 IEEE. :1-2 Apr, 2012
Academic Journal
Sofia M. Kapetanaki; Nicolas Coquelle; David von Stetten; Martin Byrdin; Ronald Rios-Santacruz; Richard Bean; Johan Bielecki; Mohamed Boudjelida; Zsuzsana Fekete; Geoffrey W. Grime; Huijong Han; Caitlin Hatton; Sravya Kantamneni; Konstantin Kharitonov; Chan Kim; Marco Kloos; Faisal H. M. Koua; Iñaki de Diego Martinez; Diogo Melo; Lukas Rane; Adam Round; Ekaterina Round; Abhisakh Sarma; Robin Schubert; Joachim Schulz; Marcin Sikorski; Mohammad Vakili; Joana Valerio; Jovana Vitas; Raphael de Wijn; Agnieszka Wrona; Ninon Zala; Arwen Pearson; Katerina Dörner; Giorgio Schirò; Elspeth F. Garman; András Lukács; Martin Weik
IUCrJ, Vol 11, Iss 6, Pp 991-1006 (2024)
Academic Journal
Poston, Lauren M., MD; Bassiri, Aria, MD; Kloos, Jacqueline, MD; Linden, Jessica, BA; Jiang, Boxiang, MD; Sinopoli, Jillian, DO; Tapias Vargas, Leonidas, MD; Towe, Christopher W., MD
Journal of Surgical Research. 301:154-162
Conference
Kloos, Carlos Delgado; Alario-Hoyos, Carlos; Munoz-Merino, Pedro J.; Ibanez, Maria-Blanca; Estevez-Ayres, Iria; Crespo-Garcia, Raquel M.
2019 IEEE Global Engineering Education Conference (EDUCON) Global Engineering Education Conference (EDUCON), 2019 IEEE. :1480-1487 Apr, 2019
Academic Journal
Reinke PYA; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Schubert R; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Oberthür D; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Galchenkova M; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Rahmani Mashhour A; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Günther S; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Chretien A; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Round A; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Seychell BC; Institute of Physical Chemistry, Department of Chemistry, Universität Hamburg, Grindelallee 117, 20146, Hamburg, Germany.; Norton-Baker B; Max Plank Institute for the Structure and Dynamics of Matter, Luruper Chaussee 149, 22761, Hamburg, Germany.; Department of Chemistry, University of California at Irvine, Irvine, CA, 92697-2025, USA.; Kim C; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Schmidt C; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Koua FHM; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Tolstikova A; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Ewert W; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Peña Murillo GE; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Department of Physics, Universität Hamburg, Luruper Chaussee 149, 22761, Hamburg, Germany.; Mills G; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Kirkwood H; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Brognaro H; Institute of Biochemistry and Molecular Biology, Laboratory for Structural Biology of Infection and Inflammation, Department of Chemistry, Universität Hamburg, Build. 22a, c/o DESY, Notkestr. 85, 22607, Hamburg, Germany.; Han H; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Koliyadu J; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Schulz J; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Bielecki J; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Lieske J; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Maracke J; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Knoska J; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Department of Physics, Universität Hamburg, Luruper Chaussee 149, 22761, Hamburg, Germany.; Lorenzen K; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Brings L; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Sikorski M; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Kloos M; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Vakili M; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Vagovic P; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Middendorf P; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; de Wijn R; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Bean R; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Letrun R; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Han S; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Gwangju Institute of Science and Technology, 123 Cheomdangwagi-ro, Buk-gu, Gwangju, 61005, Republic of Korea.; Falke S; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Geng T; Sosei Heptares, Steinmetz Building, Granta Park, Great Abington, CB21 6DG, Cambridge, UK.; Sato T; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Srinivasan V; Institute of Biochemistry and Molecular Biology, Laboratory for Structural Biology of Infection and Inflammation, Department of Chemistry, Universität Hamburg, Build. 22a, c/o DESY, Notkestr. 85, 22607, Hamburg, Germany.; Kim Y; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Yefanov OM; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Gelisio L; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; Beck T; Institute of Physical Chemistry, Department of Chemistry, Universität Hamburg, Grindelallee 117, 20146, Hamburg, Germany.; The Hamburg Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761, Hamburg, Germany.; Doré AS; Sosei Heptares, Steinmetz Building, Granta Park, Great Abington, CB21 6DG, Cambridge, UK.; CHARM Therapeutics Ltd., B900 Babraham Research Campus, CB22 3AT, Cambridge, UK.; Mancuso AP; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.; La Trobe Institute for Molecular Science, Department of Chemistry and Physics, La Trobe University, Melbourne, VIC, 3086, Australia.; Diamond Light Source, Harwell Science and Innovation Campus, OX11 0DE, Didcot, UK.; Betzel C; Institute of Biochemistry and Molecular Biology, Laboratory for Structural Biology of Infection and Inflammation, Department of Chemistry, Universität Hamburg, Build. 22a, c/o DESY, Notkestr. 85, 22607, Hamburg, Germany.; The Hamburg Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761, Hamburg, Germany.; Bajt S; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; The Hamburg Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761, Hamburg, Germany.; Redecke L; Institute of Biochemistry, Universität zu Lübeck, Ratzeburger Allee 160, 23562, Lübeck, Germany.; Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Chapman HN; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Department of Physics, Universität Hamburg, Luruper Chaussee 149, 22761, Hamburg, Germany.; The Hamburg Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761, Hamburg, Germany.; Meents A; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.; Turk D; Jožef Stefan Institute, Jamova cesta 39, 1000, Ljubljana, Slovenia.; Centre of Excellence for Integrated Approaches in Chemistry and Biology of Proteins Jamova 39, 1000, Ljubljana, Slovenia.; Hinrichs W; Universität Greifswald, Institute of Biochemistry, Felix-Hausdorff-Str. 4, 17489, Greifswald, Germany.; Lane TJ; Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany. thomas.lane@desy.de.; The Hamburg Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761, Hamburg, Germany. thomas.lane@desy.de.; CHARM Therapeutics Ltd., B900 Babraham Research Campus, CB22 3AT, Cambridge, UK. thomas.lane@desy.de.
Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE
Conference
Newman, Bonna K.; Carr, Anna J.; Jansen, Mark J.; Goma, Elias Garcia; Kloos, Mario J. H.; de Groot, Koen M.; van Aken, Bas B.
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) Photovoltaic Energy Conversion (WCPEC), 2018 IEEE 7th World Conference on. :3593-3597 Jun, 2018
Academic Journal
EPJ Data Science, Vol 13, Iss 1, Pp 1-13 (2024)
검색 결과 제한하기
제한된 항목
[검색어] Kloos, M.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어