학술논문

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(예 : 2010-2015)
'학술논문' 에서 검색결과 11,331건 | 목록 1~10
Academic Journal
Kanamori T; Division of Nephrology and Rheumatology, National Center for Child Health and Development, Tokyo, Japan.; Department of Pediatrics, Tokyo Medical and Dental University, Tokyo, Japan.; Kamei K; Division of Nephrology and Rheumatology, National Center for Child Health and Development, Tokyo, Japan.; Sato M; Division of Nephrology and Rheumatology, National Center for Child Health and Development, Tokyo, Japan.; Nishi K; Division of Nephrology and Rheumatology, National Center for Child Health and Development, Tokyo, Japan.; Okutsu M; Division of Nephrology and Rheumatology, National Center for Child Health and Development, Tokyo, Japan.; Department of Pediatrics, Tokyo Medical and Dental University, Tokyo, Japan.; Ishiwa S; Division of Nephrology and Rheumatology, National Center for Child Health and Development, Tokyo, Japan.; Department of Pediatrics, Faculty of Medicine, Oita University, Oita, Japan.; Ogura M; Division of Nephrology and Rheumatology, National Center for Child Health and Development, Tokyo, Japan.; Sako M; Division of Nephrology and Rheumatology, National Center for Child Health and Development, Tokyo, Japan.; Ishikura K; Division of Nephrology and Rheumatology, National Center for Child Health and Development, Tokyo, Japan.; Department of Pediatrics, Kitasato University School of Medicine, Kanagawa, Japan.; Ito S; Division of Nephrology and Rheumatology, National Center for Child Health and Development, Tokyo, Japan. itoshu@yokohama-cu.ac.jp.; Department of Pediatrics, Yokohama City University Hospital, 22-2 Seto, Kanazawa-Ku, Yokohama, Kanagawa, 236-0027, Japan. itoshu@yokohama-cu.ac.jp.
Publisher: Springer Country of Publication: Japan NLM ID: 9709923 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1437-7799 (Electronic) Linking ISSN: 13421751 NLM ISO Abbreviation: Clin Exp Nephrol Subsets: MEDLINE
Academic Journal
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 7:613-620 2019
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[검색어] Kanamori, T.
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