학술논문
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Conference
2023 31st International Symposium on Modeling, Analysis, and Simulation of Computer and Telecommunication Systems (MASCOTS) Modeling, Analysis, and Simulation of Computer and Telecommunication Systems (MASCOTS), 2023 31st International Symposium on. :1-8 Oct, 2023
Academic Journal
Mirian, C; Jensen, LR; Juratli, TA; Maier, AD; Torp, SH; Shih, HA; Morshed, RA; Young, JS; Magill, ST; Bertero, L; Stummer, W; Spille, DC; Brokinkel, B; Oya, S; Miyawaki, S; Saito, N; Proescholdt, M; Kuroi, Y; Gousias, K; Simon, M; Moliterno, J; Prat-Acin, R; Goutagny, S; Prabhu, VC; Tsiang, JT; Wach, J; Guresir, E; Yamamoto, J; Kim, YZ; Lee, JH; Koshy, M; Perumal, K; Baskaya, MK; Cannon, DM; Shrieve, DC; Suh, CO; Chang, JH; Kamenova, M; Straumann, S; Soleman, J; Eyupoglu, IY; Catalan, T; Lui, AS; Theodosopoulos, PV; Mcdermott, MW; Wang, F; Guo, FY; Goes, P; Neto, MAD; Jamshidi, A; Komotar, R; Ivan, M; Luther, E; Souhami, L; Guiot, MC; Csonka, T; Endo, T; Barrett, OC; Jensen, R; Gupta, T; Patel, AJ; Klisch, TJ; Kim, JW; Maiuri, F; Barresi, V; Tabernero, MD; Skyrman, S; Broechner, A; Bach, MJ; Law, I; Scheie, D; Kristensen, BW; Munch, TN; Meling, T; Fugleholm, K; Blanche, P; Mathiesen, T
Journal of neuro-oncology. 166(3):503-511
Academic Journal
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 59(5):1521-1531 May, 2024
Report
Adamski, S.; Ahn, M.; Barbeau, P. S.; Belov, V.; Bernardi, I.; Bock, C.; Bolozdynya, A.; Bouabid, R.; Browning, J.; Cabrera-Palmer, B.; Cedarblade-Jones, N.; Rivera, J. Colón; Conley, E.; da Silva, V.; Daughhetee, J.; Detwiler, J.; Ding, K.; Durand, M. R.; Efremenko, Y.; Elliott, S. R.; Erlandson, A.; Fabris, L.; Galindo-Uribarri, A.; Green, M. P.; Hakenmüller, J.; Heath, M. R.; Hedges, S.; Jeong, H.; Johnson, B. A.; Johnson, T.; Jones, H.; Khromov, A.; Konovalov, A.; Kozlova, E.; Kumpan, A.; Kyzylova, O.; Lee, Y.; Li, G.; Li, L.; Link, J. M.; Liu, J.; Luxnat, M.; Major, A.; Mann, K.; Markoff, D. M.; Mattingly, J.; Moye, J.; Mueller, P. E.; Newby, J.; Ogoi, N.; O'Reilly, J.; Parno, D. S.; Pérez-Loureiro, D.; Pershey, D.; Prior, C. G.; Queen, J.; Rapp, R.; Ray, H.; Razuvaeva, O.; Reyna, D.; Rich, G. C.; Rudik, D.; Runge, J.; Salvat, D. J.; Sander, J.; Scholberg, K.; Shakirov, A.; Simakov, G.; Snow, W. M.; Sosnovtsev, V.; Stringer, M.; Subedi, T.; Suh, B.; Sur, B.; Tayloe, R.; Tellez-Giron-Flores, K.; Tsai, Y. -T.; van Nieuwenhuizen, E. E.; Virtue, C. J.; Visser, G.; Walkup, K.; Ward, E. M.; Wongjirad, T.; Yang, Y.; Yoo, J.; Yu, C. -H.; Zaalishvili, A.
Academic Journal
Taylor, C; Dodwell, D; McGale, P; Hills, RK; Berry, R; Bradley, R; Braybrooke, J; Clarke, M; Gray, R; Holt, F; Liu, Z; Pan, H; Peto, R; Straiton, E; Bergh, J; Coles, C; Duane, F; Hennequin, C; Jones, G; Kuhn, T; Oliveros, S; Overgaard, J; Pritchard, K; Suh, CO; Swain, S; Whelan, T; Poortmans, P
Lancet (London, England). 402(10416):1991-2003
Academic Journal
IEEE Access Access, IEEE. 12:46690-46703 2024
Academic Journal
IEEE Access Access, IEEE. 12:41499-41516 2024
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