부산대학교 도서관

Hwang HY; Clarendon Laboratory, Department of Physics, University of Oxford, Oxford OX1 3PU, United Kingdom.; Baek H; Department of Physics, Sogang University, Seoul 04107, Republic of Korea.; Yi GC; Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul 08826, Republic of Korea.; Jho YD; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, Gwangju 61005, Republic of Korea.

Publisher: IOP Pub Country of Publication: England NLM ID: 101241272 Publication Model: Electronic Cited Medium: Internet ISSN: 1361-6528 (Electronic) Linking ISSN: 09574484 NLM ISO Abbreviation: Nanotechnology Subsets: PubMed not MEDLINE; MEDLINE

Park SH; Lee S; Ishioka K; Stanton CJ; Kee CS; Beyer A; Höfer U; Stolz W; Volz K; Jho YD

Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: PubMed not MEDLINE; MEDLINE

Jeong WL; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, 123 Cheomdangwagi-ro, Gwangju 61005, Korea.; Park SH; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, 123 Cheomdangwagi-ro, Gwangju 61005, Korea.; Jho YD; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, 123 Cheomdangwagi-ro, Gwangju 61005, Korea.; Joo SK; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, 123 Cheomdangwagi-ro, Gwangju 61005, Korea.; Lee DS; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, 123 Cheomdangwagi-ro, Gwangju 61005, Korea.

Publisher: MDPI Country of Publication: Switzerland NLM ID: 101555929 Publication Model: Electronic Cited Medium: Print ISSN: 1996-1944 (Print) Linking ISSN: 19961944 NLM ISO Abbreviation: Materials (Basel) Subsets: PubMed not MEDLINE

Sun B; Division of Engineering and Applied Science, California Institute of Technology, Pasadena, CA, 91125, USA.; Tsinghua-Berkeley Shenzhen Institute and Tsinghua Shenzhen International Graduate School, Guangdong Provincial Key Laboratory of Thermal Management Engineering and Materials, Tsinghua University, 518055, Shenzhen, Guangdong, China.; Niu S; Mork Family Department of Chemical Engineering and Materials Science, University of Southern California, Los Angeles, CA, 90089, USA.; School of Earth, Energy and Environmental Sciences, Stanford University, Stanford, CA, 94305, USA.; Hermann RP; Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.; Moon J; Division of Engineering and Applied Science, California Institute of Technology, Pasadena, CA, 91125, USA.; Shulumba N; Division of Engineering and Applied Science, California Institute of Technology, Pasadena, CA, 91125, USA.; Page K; Neutron Scattering Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.; Zhao B; Mork Family Department of Chemical Engineering and Materials Science, University of Southern California, Los Angeles, CA, 90089, USA.; Thind AS; Institute of Materials Science and Engineering, Washington University in St. Louis, St. Louis, MO, 63130, USA.; Mahalingam K; Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson AFB, Dayton, OH, USA.; Milam-Guerrero J; Department of Chemistry, University of Southern California, Los Angeles, CA, 90089, USA.; Haiges R; Department of Chemistry, University of Southern California, Los Angeles, CA, 90089, USA.; Loker Hydrocarbon Research Institute, University of Southern California, Los Angeles, CA, 90089, USA.; Mecklenburg M; Core Center of Excellence in Nano Imaging, University of Southern California, Los Angeles, CA, 90089, USA.; Melot BC; Department of Chemistry, University of Southern California, Los Angeles, CA, 90089, USA.; Jho YD; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, Gwangju, 61005, South Korea.; Howe BM; Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson AFB, Dayton, OH, USA.; Mishra R; Institute of Materials Science and Engineering, Washington University in St. Louis, St. Louis, MO, 63130, USA.; Department of Mechanical Engineering and Materials Science, Washington University in St. Louis, St. Louis, MO, 63130, USA.; Alatas A; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, 60439, USA.; Winn B; Neutron Scattering Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.; Manley ME; Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA. manleyme@ornl.gov.; Ravichandran J; Mork Family Department of Chemical Engineering and Materials Science, University of Southern California, Los Angeles, CA, 90089, USA. jayakanr@usc.edu.; Ming Hsieh Department of Electrical Engineering, University of Southern California, Los Angeles, CA, 90089, USA. jayakanr@usc.edu.; Minnich AJ; Division of Engineering and Applied Science, California Institute of Technology, Pasadena, CA, 91125, USA. aminnich@caltech.edu.

Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: PubMed not MEDLINE; MEDLINE

Kim I; School of Electrical and Computer Science, Gwangju Institute of Science and Technology (GIST), Gwangju 61005, Korea.; Jung JE; Department of Chemistry, Korea University, Seoul 02841, Korea.; Lee W; Department of Optics & Mechatronics Engineering, Pusan National University, Busan 46241, Korea.; Park S; Department of Optics & Mechatronics Engineering, Pusan National University, Busan 46241, Korea.; Kim H; School of Physics, Northeast Normal University, Changchun 130024, China.; Jho YD; School of Electrical and Computer Science, Gwangju Institute of Science and Technology (GIST), Gwangju 61005, Korea.; Woo HY; Department of Chemistry, Korea University, Seoul 02841, Korea.; Kyhm K; Department of Optics & Mechatronics Engineering, Pusan National University, Busan 46241, Korea. kskyhm@pusan.ac.kr.

Publisher: MDPI Country of Publication: Switzerland NLM ID: 101545357 Publication Model: Electronic Cited Medium: Internet ISSN: 2073-4360 (Electronic) Linking ISSN: 20734360 NLM ISO Abbreviation: Polymers (Basel) Subsets: PubMed not MEDLINE

Park JE; Jeong TY; Jho YD; Kim GH; Yee KJ

Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: PubMed not MEDLINE

Guo R; Division of Engineering and Applied Science, California Institute of Technology, Pasadena, California 91125, USA. aminnich@caltech.edu.; Jho YD; Minnich AJ

Publisher: RSC Pub Country of Publication: England NLM ID: 101525249 Publication Model: Print Cited Medium: Internet ISSN: 2040-3372 (Electronic) Linking ISSN: 20403364 NLM ISO Abbreviation: Nanoscale Subsets: PubMed not MEDLINE

Naveen Kumar Reddy B; Department of Physics, Jawaharlal Technological University, Anantapur, Andhra Pradesh, India.; Sailaja S; Department of Humanities and Basic Sciences, G. Pulla Reddy Engineering College (Autonomous), Kurnool, Andhra Pradesh, India.; Thyagarajan K; Department of Physics, JNTUA College of Engineering, Pulivendula, Andhra Pradesh, India.; Jho YD; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, Gwangju, Republic of Korea.; Sudhakar Reddy B; Department of Physics, S.V.Degree College, Kadapa, Andhra Pradesh, India.; Department of Physics, SKR&SKR Government Degree College for Women (Autonomous), Kadapa, Andhra Pradesh, India.

Publisher: Wiley & Sons Country of Publication: England NLM ID: 100889025 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1522-7243 (Electronic) Linking ISSN: 15227235 NLM ISO Abbreviation: Luminescence Subsets: MEDLINE

Bae SY; Institute of Materials and Systems for Sustainability (IMaSS), Nagoya University, Nagoya, 464-8603, Japan.; Min JW; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), Gwangju, 61005, Republic of Korea.; Hwang HY; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), Gwangju, 61005, Republic of Korea.; Lekhal K; Institute of Materials and Systems for Sustainability (IMaSS), Nagoya University, Nagoya, 464-8603, Japan.; Lee HJ; Department of Electrical Engineering and Computer Science, Nagoya University, Nagoya, 464-8603, Japan.; Jho YD; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), Gwangju, 61005, Republic of Korea.; Lee DS; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), Gwangju, 61005, Republic of Korea.; Lee YT; School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), Gwangju, 61005, Republic of Korea.; Ikarashi N; Institute of Materials and Systems for Sustainability (IMaSS), Nagoya University, Nagoya, 464-8603, Japan.; Honda Y; Institute of Materials and Systems for Sustainability (IMaSS), Nagoya University, Nagoya, 464-8603, Japan.; Amano H; Institute of Materials and Systems for Sustainability (IMaSS), Nagoya University, Nagoya, 464-8603, Japan.; Akasaki Research Center (ARC), Nagoya University, Nagoya, 464-8603, Japan.

Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: PubMed not MEDLINE

Jho, YD; Wang, XM; Kono, J; Reitze, DH; Wei, X; Belyanin, AA; Kocharovsky, VV; Solomon, GS

PHYSICAL REVIEW LETTERS; JUN 16 2006, 96 23, p237401 4p.