부산대학교 도서관

Kjærnes, K.; Hallsteinsen, I.; Chopdekar, R. V.; Moreau, M.; Bolstad, T.; Svenum, I-H.; Selbach, S. M.; Tybell, T.

Phys. Rev. B 103, 224435 (2021)

Nan, T.; Quintela, C. X.; Irwin, J.; Gurung, G.; Shao, D. F.; Gibbons, J.; Campbell, N.; Song, K.; Choi, S. Y.; Guo, L.; Johnson, R. D.; Manuel, P.; Chopdekar, R. V.; Hallsteinsen, I.; Tybell, T.; Ryan, P. J.; Kim, J. W.; Choi, Y. S.; Radaelli, P. G.; Ralph, D. C.; Tsymba, E. Y.; Rzchowski, M. S.; Eom, C. B.

Liu Y; Department of Materials Science and Engineering, NTNU Norwegian University of Science and Technology, Trondheim, Norway.; Dale TM; Department of Physics, NTNU Norwegian University of Science and Technology, Trondheim, Norway.; van der Minne E; MESA + Institute for Nanotechnology, University of Twente, Enschede, The Netherlands.; Boucher S; Department of Physics, NTNU Norwegian University of Science and Technology, Trondheim, Norway.; Avila R; MESA + Institute for Nanotechnology, University of Twente, Enschede, The Netherlands.; Klewe C; Advanced Light Source, Lawerence Berkeley National Laboratory, Berkeley, CA, US.; Koster G; MESA + Institute for Nanotechnology, University of Twente, Enschede, The Netherlands.; Nord M; Department of Physics, NTNU Norwegian University of Science and Technology, Trondheim, Norway.; Einarsrud MA; Department of Materials Science and Engineering, NTNU Norwegian University of Science and Technology, Trondheim, Norway.; Hallsteinsen I; Department of Materials Science and Engineering, NTNU Norwegian University of Science and Technology, Trondheim, Norway.

Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE; PubMed not MEDLINE

Hallsteinsen, S.; Jorstad, I.; Thanh, D.V.

2007 Second International Conference on Systems and Networks Communications (ICSNC 2007) Systems and Networks Communications, 2007. ICSNC 2007. Second International Conference on. :68-68 Aug, 2007

Dagenborg, S.; Nord, M.; D'Alessio, A.; Brand, E.; Vitaliti, N.; Palliotto, A.; Trier, F.; Park, D.-S.; Pryds, N.; Hallsteinsen, I.

In: Physical Review Materials. (Physical Review Materials, April 2025, 9(4))

Kelly MR; Department of Materials Science and Engineering, Norwegian University of Science and Technology, NTNU, Sem Sælands vei 12, 7034 Trondheim, Norway.; Kroyan A; Department of Materials Science and Engineering, Norwegian University of Science and Technology, NTNU, Sem Sælands vei 12, 7034 Trondheim, Norway.; Hallsteinsen I; Department of Materials Science and Engineering, Norwegian University of Science and Technology, NTNU, Sem Sælands vei 12, 7034 Trondheim, Norway.; Schnell SK; Department of Materials Science and Engineering, Norwegian University of Science and Technology, NTNU, Sem Sælands vei 12, 7034 Trondheim, Norway.; Lein HL; Department of Materials Science and Engineering, Norwegian University of Science and Technology, NTNU, Sem Sælands vei 12, 7034 Trondheim, Norway.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 101691658 Publication Model: eCollection Cited Medium: Internet ISSN: 2470-1343 (Electronic) Linking ISSN: 24701343 NLM ISO Abbreviation: ACS Omega Subsets: PubMed not MEDLINE

I. Hallsteinsen; M. Moreau; R. V. Chopdekar; E. Christiansen; M. Nord; P.-E. Vullum; J. K. Grepstad; R. Holmestad; S. M. Selbach; A. Scholl; E. Arenholz; E. Folven; T. Tybell

APL Materials, Vol 5, Iss 8, Pp 086107-086107-8 (2017)

I. Hallsteinsen; E. Folven; F. K. Olsen; R. V. Chopdekar; M. S. Rzchowski; C. B. Eom; J. K. Grepstad; T. Tybell

APL Materials, Vol 3, Iss 6, Pp 062501-062501-7 (2015)

Hallsteinsen, I; Moreau, M; Grutter, A; Nord, M; Vullum, P-E; Gilbert, DA; Bolstad, T; Grepstad, JK; Holmestad, R; Selbach, SM; N’Diaye, AT; Kirby, BJ; Arenholz, E; Tybell, T

Physical Review B, vol 94, iss 20

T. Nan; C. X. Quintela; J. Irwin; G. Gurung; D. F. Shao; J. Gibbons; N. Campbell; K. Song; S. -Y. Choi; L. Guo; R. D. Johnson; P. Manuel; R. V. Chopdekar; I. Hallsteinsen; T. Tybell; P.

Nature, Nature Communications. 11(1):1-7

Anastasiia Blaginina; L. I. Ryabushko

International Journal on Algae. 23:247-256

A. D. Bang; I. Hallsteinsen; R. V. Chopdekar; F. K. Olsen; S. D. Slöetjes; K. Kjærnes; E. Arenholz; E. Folven; J. K. Grepstad

Applied Physics Letters, vol 115, iss 11

A. D. Bang; I. Hallsteinsen; F. K. Olsen; S. D. Slöetjes; S. T. Retterer; A. Scholl; E. Arenholz; E. Folven; J. K. Grepstad

Applied Physics Letters, vol 114, iss 19

F. K. Olsen; I. Hallsteinsen; E. Arenholz; T. Tybell; E. Folven

Physical Review B. 99

I. Hallsteinsen; A. Grutter; M. Moreau; S. D. Slöetjes; K. Kjærnes; E. Arenholz; T. Tybell

Physical Review Materials. 2

A. A. Blaginina; S. N. Zheleznova; E. S. Miroshnichenko; R. G. Gevorgiz; L. I. Ryabushko

Prikladnaâ biohimiâ i mikrobiologiâ. 60:301-314

I. Hallsteinsen; J. E. Boschker; M. Nord; S. Lee; M. Rzchowski; P. E. Vullum; J. K. Grepstad; R. Holmestad; C. B. Eom; T. Tybell

Journal of Applied Physics. 113

Tu S; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Ziman T; Institut Laue-Langevin, 38042, Grenoble, France.; Université de Grenobles-Alpes, and CNRS, LPMMC, 38042, Grenoble, France.; Kavli Institute for Theoretical Sciences, University of Chinese Academy of Sciences, 100190, Beijing, China.; Yu G; Department of Electrical Engineering, University of California, Los Angeles, CA, 90095, USA.; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 100190, Beijing, China.; Wan C; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 100190, Beijing, China.; Hu J; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Institute of Physics, Ecole Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland.; Wu H; Department of Electrical Engineering, University of California, Los Angeles, CA, 90095, USA.; Wang H; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Liu M; Electron Microscopy Laboratory, School of Physics, Peking University, 100871, Beijing, China.; Liu C; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Guo C; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 100190, Beijing, China.; Zhang J; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Cabero Z MA; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Shenzhen Institute for Quantum Science and Engineering (SIQSE), and Department of Physics, Southern University of Science and Technology (SUSTech), 518055, Shenzhen, China.; Zhang Y; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Gao P; Electron Microscopy Laboratory, School of Physics, Peking University, 100871, Beijing, China.; International Center for Quantum Materials, School of Physics, Peking University, 100871, Beijing, China.; Collaborative Innovation Center of Quantum Matter, 100871, Beijing, China.; Liu S; Shenzhen Institute for Quantum Science and Engineering (SIQSE), and Department of Physics, Southern University of Science and Technology (SUSTech), 518055, Shenzhen, China.; Yu D; Electron Microscopy Laboratory, School of Physics, Peking University, 100871, Beijing, China.; Shenzhen Institute for Quantum Science and Engineering (SIQSE), and Department of Physics, Southern University of Science and Technology (SUSTech), 518055, Shenzhen, China.; Han X; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 100190, Beijing, China.; Hallsteinsen I; Department of Electronic Systems, Norwegian University of Science and Technology, Trondheim, 7491, Norway.; Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.; Gilbert DA; Material Science and Engineering Department, University of Tennessee, Knoxville, TN, 37996, USA.; Matsuo M; Kavli Institute for Theoretical Sciences, University of Chinese Academy of Sciences, 100190, Beijing, China.; RIKEN Center for Emergent Matter Science (CEMS), Wako, 351-0198, Japan.; Ohnuma Y; Kavli Institute for Theoretical Sciences, University of Chinese Academy of Sciences, 100190, Beijing, China.; Wölfle P; Institute for Theory of Condensed Matter, Karlsruhe Institute of Technology, 76049, Karlsruhe, Germany.; Wang KL; Department of Electrical Engineering, University of California, Los Angeles, CA, 90095, USA.; Ansermet JP; Institute of Physics, Ecole Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland.; Maekawa S; Kavli Institute for Theoretical Sciences, University of Chinese Academy of Sciences, 100190, Beijing, China.; RIKEN Center for Emergent Matter Science (CEMS), Wako, 351-0198, Japan.; Yu H; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China. haiming.yu@buaa.edu.cn.

Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE

Tu S; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Ziman T; Institut Laue-Langevin, 38042, Grenoble, France.; Université de Grenobles-Alpes, and CNRS, LPMMC, 38042, Grenoble, France.; Kavli Institute for Theoretical Sciences, University of Chinese Academy of Sciences, 100190, Beijing, China.; Yu G; Department of Electrical Engineering, University of California, Los Angeles, CA, 90095, USA.; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 100190, Beijing, China.; Wan C; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 100190, Beijing, China.; Hu J; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Institute of Physics, Ecole Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland.; Wu H; Department of Electrical Engineering, University of California, Los Angeles, CA, 90095, USA.; Wang H; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Liu M; Electron Microscopy Laboratory, School of Physics, Peking University, 100871, Beijing, China.; Liu C; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Guo C; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 100190, Beijing, China.; Zhang J; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Cabero Z MA; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Shenzhen Institute for Quantum Science and Engineering (SIQSE), and Department of Physics, Southern University of Science and Technology (SUSTech), 518055, Shenzhen, China.; Zhang Y; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.; Gao P; Electron Microscopy Laboratory, School of Physics, Peking University, 100871, Beijing, China.; International Center for Quantum Materials, School of Physics, Peking University, 100871, Beijing, China.; Collaborative Innovation Center of Quantum Matter, 100871, Beijing, China.; Liu S; Shenzhen Institute for Quantum Science and Engineering (SIQSE), and Department of Physics, Southern University of Science and Technology (SUSTech), 518055, Shenzhen, China.; Yu D; Electron Microscopy Laboratory, School of Physics, Peking University, 100871, Beijing, China.; Shenzhen Institute for Quantum Science and Engineering (SIQSE), and Department of Physics, Southern University of Science and Technology (SUSTech), 518055, Shenzhen, China.; Han X; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 100190, Beijing, China.; Hallsteinsen I; Department of Electronic Systems, Norwegian University of Science and Technology, Trondheim, 7491, Norway.; Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.; Gilbert DA; Material Science and Engineering Department, University of Tennessee, Knoxville, TN, 37996, USA.; Matsuo M; Kavli Institute for Theoretical Sciences, University of Chinese Academy of Sciences, 100190, Beijing, China.; RIKEN Center for Emergent Matter Science (CEMS), Wako, 351-0198, Japan.; Ohnuma Y; Kavli Institute for Theoretical Sciences, University of Chinese Academy of Sciences, 100190, Beijing, China.; Wölfle P; Institute for Theory of Condensed Matter, Karlsruhe Institute of Technology, 76049, Karlsruhe, Germany.; Wang KL; Department of Electrical Engineering, University of California, Los Angeles, CA, 90095, USA.; Ansermet JP; Institute of Physics, Ecole Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland.; Maekawa S; Kavli Institute for Theoretical Sciences, University of Chinese Academy of Sciences, 100190, Beijing, China.; RIKEN Center for Emergent Matter Science (CEMS), Wako, 351-0198, Japan.; Yu H; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China. haiming.yu@buaa.edu.cn.

Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE