학술논문
'학술논문'
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Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(2):287-301 Jun, 2024
Academic Journal
IEEE Signal Processing Magazine IEEE Signal Process. Mag. Signal Processing Magazine, IEEE. 40(5):40-53 Jul, 2023
Academic Journal
IEEE Geoscience and Remote Sensing Letters IEEE Geosci. Remote Sensing Lett. Geoscience and Remote Sensing Letters, IEEE. 20:1-5 2023
Academic Journal
IEEE Geoscience and Remote Sensing Letters IEEE Geosci. Remote Sensing Lett. Geoscience and Remote Sensing Letters, IEEE. 20:1-5 2023
Academic Journal
IEEE Geoscience and Remote Sensing Letters IEEE Geosci. Remote Sensing Lett. Geoscience and Remote Sensing Letters, IEEE. 20:1-5 2023
Academic Journal
J.Y. Tsao; R.G. Abbott; D.C. Crowder; S. Desai; R.P.M. Dingreville; J.E. Fowler; A. Garland; P.P. Iyer; J. Murdock; S.T. Steinmetz; K.A. Yarritu; C.M. Johnson; D.J. Stracuzzi
Journal of Creativity, Vol 34, Iss 2, Pp 100077- (2024)
Academic Journal
IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing IEEE J. Sel. Top. Appl. Earth Observations Remote Sensing Selected Topics in Applied Earth Observations and Remote Sensing, IEEE Journal of. 15:4640-4652 2022
Academic Journal
IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 59(9):7817-7830 Sep, 2021
Academic Journal
IEEE Geoscience and Remote Sensing Letters IEEE Geosci. Remote Sensing Lett. Geoscience and Remote Sensing Letters, IEEE. 18(5):871-875 May, 2021
Academic Journal
Tsao, J.Y.; Abbott, R.G.; Crowder, D.C.; Desai, S.; Dingreville, R.P.M.; Fowler, J.E.; Garland, A.; Iyer, P.P.; Murdock, J.; Steinmetz, S.T.; Yarritu, K.A.; Johnson, C.M.; Stracuzzi, D.J.
In Journal of Creativity August 2024 34(2)
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[검색어] Fowler, J.E.
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