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Bennett, G. W.; Bousquet, B.; Brown, H. N.; Bunce, G.; Carey, R. M.; Cushman, P.; Danby, G. T.; Debevec, P. T.; Deile, M.; Deng, H.; Deninger, W.; Dhawan, S. K.; Druzhinin, V. P.; Duong, L.; Efstathiadis, E.; Farley, F. J. M.; Fedotovich, G. V.; Giron, S.; Gray, F. E.; Grigoriev, D.; Grosse-Perdekamp, M.; Grossmann, A.; Hare, M. F.; Hertzog, D. W.; Huang, X.; Hughes, V. W.; Iwasaki, M.; Jungmann, K.; Kawall, D.; Kawamura, M.; Khazin, B. I.; Kindem, J.; Krienen, F.; Kronkvist, I.; Lam, A.; Larsen, R.; Lee, Y. Y.; Logashenko, I.; McNabb, R.; Meng, W.; Mi, J.; Miller, J. P.; Mizumachi, Y.; Morse, W. M.; Nikas, D.; Onderwater, C. J. G.; Orlov, Y.; Ozben, C. S.; Paley, J. M.; Peng, Q.; Polly, C. C.; Pretz, J.; Prigl, R.; Putlitz, G. zu; Qian, T.; Redin, S. I.; Rind, O.; Roberts, B. L.; Ryskulov, N.; Sedykh, S.; Semertzidis, Y. K.; Shagin, P.; Shatunov, Yu. M.; Sichtermann, E. P.; Solodov, E.; Sossong, M.; Steinmetz, A.; Sulak, L. R.; Timmermans, C.; Trofimov, A.; Urner, D.; von Walter, P.; Warburton, D.; Winn, D.; Yamamoto, A.; Zimmerman, D.
Academic Journal
Prigl, R.; Brown, H.N.; Bunce, G.; Carey, R.M.; Cushman, P.; Danby, G.T.; Debevec, P.T.; Deng, H.; Deninger, W.; Dhawan, S.K.; Druzhinin, V.P.; Duong, L.; Earle, W.; Efstathiadis, E.; Farley, F.J.M.; Fedotovich, G.V.; Giron, S.; Gray, F.; Grosse Perdekamp, M.; Grossmann, A.; Haeberlen, U.; Hare, M.; Hazen, E.S.; Hertzog, D.W.; Hughes, V.W.; Iwasaki, M.; Jungmann, K.; Kawall, D.; Kawamura, M.; Khazin, B.I.; Kindem, J.; Krienen, F.; Kronkvist, I.; Larsen, R.; Lee, Y.Y.; Liu, W.; Logashenko, I.; McNabb, R.; Meng, W.; Mi, J.-L.; Miller, D.; Miller, J.P.; Morse, W.M.; Neumayer, P.; Onderwater, C.J.G.; Orlov, Y.; Pai, C.; Polly, C.; Pretz, J.; zu Putlitz, G.; Redin, S.I.; Rind, O.; Roberts, B.L.; Ryskulov, N.; Sanders, R.; Sedykh, S.; Semertzidis, Y.K.; Serednyakov, S.; Shatunov, Yu.M.; Solodov, E.; Sossong, M.; Steinmetz, A.; Sulak, L.R.; Tanaka, M.; Timmermans, C.; Trofimov, A.; Urner, D.; Warburton, D.; Winn, D.; Yamamoto, A.; Zimmerman, D.
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 48(2):182-185 Apr, 1999
Academic Journal
Sichtermann, EP; Bennett, GW; Bousquet, B; Brown, HN; Bunce, G; Carey, RM; Cushman, P; Danby, GT; Debevec, PT; Deile, M; Deng, H; Deninger, W; Dhawan, SK; Druzhinin, VP; Duong, L; Efstathiadis, E; Farley, FJM; Fedotovich, GV; Giron, S; Gray, FE; Grigoriev, D; Grosse‐Perdekamp, M; Grossmann, A; Hare, MF; Hertzog, DW; Huang, X; Hughes, VW; Iwasaki, M; Jungmann, K; Kawall, D; Khazin, BI; Kindem, J; Krienen, F; Kronkvist, I; Lam, A; Larsen, R; Lee, YY; Logashenko, I; McNabb, R; Meng, W; Mi, J; Miller, JP; Morse, WM; Nikas, D; Onderwater, CJG; Orlov, Y; Özben, CS; Paley, JM; Peng, Q; Polly, CC; Pretz, J; Prigl, R; Putlitz, G zu; Qian, T; Redin, SI; Rind, O; Roberts, BL; Ryskulov, N; Shagin, P; Semertzidis, YK; Shatunov, Yu M; Solodov, E; Sossong, M; Steinmetz, A; Sulak, LR; Trofimov, A; Urner, D; von Walter, P; Warburton, D; Yamamoto, A
AIP Conference Proceedings. 675(1)
Conference
Prigl, R.; Brown, H.N.; Bunce, G.; Carey, R.M.; Cushman, P.; Danby, G.T.; Debevec, P.T.; Deng, H.; Deninger, W.; Dhawan, S.K.; Druzhinin, V.P.; Duong, L.; Earle, W.; Efstathiadis, E.; Farley, F.J.M.; Fedotovich, G.V.; Giron, S.; Grosse Perdekamp, M.; Grossmann, A.; Haeberlen, U.; Hare, M.; Hazen, E.S.; Hertzog, D.W.; Hughes, V.W.; Iwasaki, M.; Jungmann, K.; Kawall, D.; Kawamura, M.; Khazin, B.I.; Kindem, J.; Kinoshita, T.; Krienen, F.; Larsen, R.; Lee, Y.Y.; Logashenko, I.; McNabb, R.; Meng, W.; Mi, J.-L.; Miller, D.; Miller, J.P.; Morse, W.M.; Orlov, Y.; Pai, C.; Polly, C.; zu Putlitz, G.; Redin, S.I.; Rind, O.; Roberts, B.L.; Ryskulov, N.; Sanders, R.; Sato, T.; Sedykh, S.; Semertzidis, Y.K.; Serednyakov, S.; Shatunov, Yu.M.; Solodov, E.; Sulak, L.R.; Timmermans, C.; Trofimov, A.; Urner, D.; Warburton, D.; Winn, D.; Yamamoto, A.; Zimmerman, D.
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Precision electromagnetic measurements Precision Electromagnetic Measurements Digest, 1998 Conference on. :10-11 1998
Academic Journal
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 19(3):2877-2881 Jun, 2009
Academic Journal
Hatzistergos, M.S.; Efstathiadis, H.; Lifshin, E.; Kaloyeros, A.E.; Reeves, J.L.; Selvamanickam, V.; Allen, L.P.; MacCrimmon, R.
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 13(2):2470-2473 Jun, 2003
Conference
2009 34th IEEE Photovoltaic Specialists Conference (PVSC) Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE. :001118-001122 Jun, 2009
Academic Journal
Gopal G. Pethuraja; John W. Zeller; Roger E. Welser; Ashok K. Sood; Harry Efstathiadis; Pradeep Haldar; Priyalal S. Wijewarnasuriya; Nibir K. Dhar
Sensors & Transducers, Vol 214, Iss 7, Pp 46-52 (2017)
Academic Journal
Pethuraja, Gopal G.; Welser, Roger E.; Zeller, John W.; Puri, Yash R.; Sood, Ashok K.; Efstathiadis, Harry; Haldar, Pradeep; Harvey, Jennifer L.
MRS Online Proceedings Library. 1771(1):67-72
Academic Journal
Pethuraja, Gopal G.; Welser, Roger E.; Zeller, John W.; Puri, Yash R.; Sood, Ashok K.; Efstathiadis, Harry; Haldar, Pradeep; Harvey, Jennifer L.
MRS Online Proceedings Library. 1771(1):145-150
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[검색어] Efstathiadis, E
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