학술논문
'학술논문'
에서 검색결과 1,083건 | 목록
1~10
Conference
Horiguchi, N.; Mertens, H.; Chiarella, T.; Demuynck, S.; Vega-Gonzalez, V.; Vandooren, A.; Veloso, A.; Bardon, M. Garcia; Sisto, G.; Gupta, A.; Tokei, Z.; Biesemans, S.; Ryckaert, J.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
Veloso, A.; Jourdain, A.; Radisic, D.; Chen, R.; Arutchelvan, G.; O'Sullivan, B.; Arimura, H.; Stucchi, M.; De Keersgieter, A.; Hosseini, M.; Hopf, T.; D'have, K.; Wang, S.; Dupuy, E.; Mannaert, G.; Vandersmissen, K.; Iacovo, S.; Marien, P.; Choudhury, S.; Schleicher, F.; Sebaai, F.; Oniki, Y.; Zhou, X.; Gupta, A.; Schram, T.; Briggs, B.; Lorant, C.; Rosseel, E.; Hikavyy, A.; Loo, R.; Geypen, J.; Batuk, D.; Martinez, G.T.; Soulie, J.P.; Devriendt, K.; Chan, B.T.; Demuynck, S.; Hiblot, G.; Van der Plas, G.; Ryckaert, J.; Beyer, G.; Litta, E.D.; Beyne, E.; Horiguchi, N.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):7173-7179 Dec, 2022
Conference
Mertens, H.; Hosseini, M.; Chiarella, T.; Zhou, D.; Wang, S.; Mannaert, G.; Dupuy, E.; Radisic, D.; Tao, Z.; Oniki, Y.; Hikavyy, A.; Rosseel, R.; Mingardi, A.; Choudhury, S.; Gowda, P. Puttarame; Sebaai, F.; Peter, A.; Vandersmissen, K.; Soulie, J.P.; Keersgieter, A. De; Lima, L. Petersen Barbosa; Cavalcante, C.; Batuk, D.; Martinez, G.T.; Geypen, J.; Seidel, F.; Paulussen, K.; Favia, P.; Boemmels, J.; Loo, R.; Wong, P.; Marquez, A. Sepulveda; Chan, B.T.; Mitard, J.; Subramanian, S.; Demuynck, S.; Litta, E. Dentoni; Horiguchi, N.; Samavedam, S.; Biesemans, S.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Conference
Chiarella, T.; Kubicek, S.; Rosseel, E.; Ritzenthaler, R.; Hikavyy, A.; Eyben, P.; De Keersgieter, A.; Ragnarsson, L-A.; Kim, M.-S; Chew, S.-A; Schram, T.; Demuynck, S.; Cupak, M.; Rijnders, L.; Dehan, M.; Horiguchi, N.; Mitard, J.; Mocuta, D.; Mocuta, A.; Thean, A. V-Y.
2016 46th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2016 46th European. :131-134 Sep, 2016
Conference
Van Olmen, J.; Wu, W.; Van Hove, M.; Travaly, Y.; Brongersma, S.H.; Eyckens, B.; Maenhoudt, M.; Van Aelst, J.; Struyf, H.; Demuynck, S.; Tokei, Z.; Vervoort, I.; Sijmus, B.; Vos, I.; Ciofi, I.; Stucchi, M.; Maex, K.; Iacopi, F.
Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695) Interconnect technology Interconnect Technology Conference, 2003. Proceedings of the IEEE 2003 International. :171-173 2003
Conference
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2020 4th IEEE. :1-4 Apr, 2020
Conference
Tierno, Davide; Hosseini, M.; van der Veen, M.; Dangol, A.; Croes, K.; Demuynck, S.; Tokei, Zs.; Litta, E.D.; Horiguchi, N.
2021 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2021 IEEE International. :1-3 Jul, 2021
Academic Journal
Gupta, A.; Pedreira, O.V.; Arutchelvan, G.; Zahedmanesh, H.; Devriendt, K.; Mertens, H.; Tao, Z.; Ritzenthaler, R.; Wang, S.; Radisic, D.; Kenis, K.; Teugels, L.; Sebai, F.; Lorant, C.; Jourdan, N.; Chan, B.T.; Subramanian, S.; Schleicher, F.; Hopf, T.; Peter, A.P.; Rassoul, N.; Debruyn, H.; Demonie, I.; Siew, Y.K.; Chiarella, T.; Briggs, B.; Zhou, X.; Rosseel, E.; De Keersgieter, A.; Capogreco, E.; Litta, E.D.; Boccardi, G.; Baudot, S.; Mannaert, G.; Bontemps, N.; Sepulveda, A.; Mertens, S.; Kim, M.; Dupuy, E.; Vandersmissen, K.; Paolillo, S.; Yakimets, D.; Chehab, B.; Favia, P.; Drijbooms, C.; Cousserier, J.; Jaysankar, M.; Lazzarino, F.; Morin, P.; Altamirano, E.; Mitard, J.; Wilson, C.J.; Holsteyns, F.; Boemmels, J.; Demuynck, S.; Tokei, Z.; Horiguchi, N.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5349-5354 Dec, 2020
Conference
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-6 Apr, 2020
Academic Journal
Vincent, B.; Hathwar, R.; Kamon, M.; Ervin, J.; Schram, T.; Chiarella, T.; Demuynck, S.; Baudot, S.; Siew, Y.K.; Kubicek, S.; Litta, E.D.; Chew, S.; Mitard, J.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5374-5380 Dec, 2020
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[검색어] Demuynck, S.
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