학술논문
'학술논문'
에서 검색결과 680건 | 목록
1~10
Academic Journal
Nibhanupudi, S.S.T.; Prasad, D.; Das, S.; Zografos, O.; Robinson, A.; Gupta, A.; Spessot, A.; Debacker, P.; Verkest, D.; Ryckaert, J.; Hellings, G.; Myers, J.; Cline, B.; Kulkarni, J.P.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(8):4453-4459 Aug, 2022
Academic Journal
Saito, D.; Doevenspeck, J.; Cosemans, S.; Oh, H.; Perumkunnil, M.; Papistas, I.A.; Belmonte, A.; Rassoul, N.; Delhougne, R.; Kar, G.; Debacker, P.; Mallik, A.; Verkest, D.; Na, M.H.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(11):4616-4620 Nov, 2020
Conference
Degraeve, R.; Mallik, A.; Garbin, D.; Doevenspeck, J.; Fantini, A.; Rodopoulos, D.; Roussel, Ph.; Govoreanu, B.; Hendrickx, P.; Di Piazza, L.; Stuijt, J.; Schaafsma, S.; Debacker, P.; Donadio, G.; Hody, H.; Goux, L.; Kar, G. S.; Furnemont, A.; Mocut, A.; Verkest, D.
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-5 Jul, 2018
Conference
Doevenspeck, J.; Garello, K.; Rao, S.; Yasin, F.; Couet, S.; Jayakumar, G.; Mallik, A.; Cosemans, S.; Debacker, P.; Verkest, D.; Lauwereins, R.; Dehaene, W.; Kar, G.S.
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Academic Journal
DeBacker, J. R.; McMillan, G. P.; Martchenke, N.; Lacey, C. M.; Stuehm, H. R.; Hungerford, M. E.; Konrad-Martin, D.
Journal of Cancer Survivorship: Research and Practice. 17(1):82-100
Conference
Doevenspeck, J.; Garello, K.; Verhoef, B.; Degraeve, R.; Van Beek, S.; Crotti, D.; Yasin, F.; Couet, S.; Jayakumar, G.; Papistas, I. A; Debacker, P.; Lauwereins, R.; Dehaene, W.; Kar, G. S.; Cosemans, S.; Mallik, A.; Verkest, D.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Conference
Chen, R.; Weckx, P.; Salahuddin, S. M.; Kim, S.-W.; Sisto, G.; Van der Plas, G.; Stucchi, M.; Baert, R.; Debacker, P.; Na, M.H.; Ryckaert, J.; Milojevic, D.; Beyne, E.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :15.2.1-15.2.4 Dec, 2020
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[검색어] DeBacker, G
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