학술논문
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Conference
Lin, C.W.; Tsao, P.C.; Yang, Y.L.; Sun, C.C.; Huang, C.C.; Chen, C.W.; Chang, C.K.; Ting, Y.J.; Koh, K.; Lee, Ross; Chen, W.C.; Huang, Y.S.; Lee, M.Z.; Lai, C.T.; Lee, T.H.
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-5 Apr, 2024
Conference
Liao, S.; Yang, L.; Chiu, T.K.; You, W.X.; Wu, T.Y.; Yang, K.F.; Woon, W.Y.; Ho, W.D.; Lin, Z.C.; Hung, H.Y.; Huang, J.C.; Huang, S.T.; Tsai, M.C.; Yu, C.L.; Chen, S.H.; Hu, K.K.; Shih, C.C.; Chen, Y.T.; Liu, C.Y.; Lin, H.Y.; Chung, C.T.; Su, L.; Chou, C.Y.; Shen, Y.T.; Chang, C.M.; Lin, Y.T.; Lin, M.Y.; Lin, W.C.; Chen, B.H.; Hou, C.S.; Lai, F.; Chen, X.; Wu, J.; Lin, C.K.; Cheng, Y.K.; Lin, H.T.; Ku, Y.C.; Lin, S.S.; Lu, L.C.; Jang, S.M.; Cao, M.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Maes, S.L.; Dietrich, J.; Midolo, G.; Schwieger, S.; Kummu, M.; Vandvik, V.; Aerts, R.; Althuizen, I.H.J.; Biasi, C.; Björk, R.G.; Böhner, H.; Carbognani, M.; Chiari, G.; Christiansen, C.T.; Clemmensen, K.E.; Cooper, E.J.; Cornelissen, J.H.C.; Elberling, B.; Faubert, P.; Fetcher, N.; Forte, T.G.W.; Gaudard, J.; Gavazov, K., 1983; Guan, Z.; Guðmundsson, J.; Gya, R.; Hallin, S.; Hansen, B.B.; Haugum, S.V.; He, J.-S.; Hicks Pries, C.; Hovenden, M.J.; Jalava, M.; Jónsdóttir, I.S.; Juhanson, J.; Jung, J.Y.; Kaarlejärvi, E.; Kwon, M.J.; Lamprecht, R.E.; Le Moullec, M.; Lee, H.; Marushchak, M.E.; Michelsen, A.; Munir, T.M.; Myrsky, E.M.; Nielsen, C.S.; Nyberg, M.; Olofsson, J.; Óskarsson, H.; Parker, T.C.; Pedersen, E.P.; Petit Bon, M.; Petraglia, A.; Raundrup, K.; Ravn, N.M.R.; Rinnan, R.; Rodenhizer, H.; Ryde, I.; Schmidt, N.M.; Schuur, E.A.G.; Sjögersten, S.; Stark, S.; Strack, M.; Tang, J.; Tolvanen, A.; Töpper, J.P.; Väisänen, M.K.; van Logtestijn, R.S.P.; Voigt, C.; Walz, J.; Weedon, J.T.; Yang, Y.; Ylänne, H.; Björkman, M.P.; Sarneel, J. M.; Dorrepaal, E.
Nature. 629(8010):105-113
Conference
Chang, H.K.; Huang, H.Y.; Lo, T.Y; Lee, S.K.; Yang, K.W.; Tang, C.L.; Liu, Gary; Wu, C.T.; Lin, M.H.; Chu, W.C.; Kuo, T.J.; Fu, S.K.; Tien, H.W.; Tsai, C.H.; Wei, Megan; Chen, H.P.; Lee, M.H.; Lu, C.W.; Shue, Winston S.; Cao, Min
2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) Advanced Metallization Conference (MAM)(IITC/MAM), 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for. :1-4 May, 2023
Conference
Yang, Y.L.; Tsao, P.C.; Lin, C.W.; Lee, Ross; Ni, Olivia; Chen, T.T.; Ting, Y.J.; Lai, C.T.; Yeh, Jason; Yang, Arnold; Huang, Wayne; Chen, Peng; Tsai, Charly; Yang, Ryan; Huang, Y.S.; Hsu, B.C.; Lee, M.Z.; Lee, T.H.; Huang, Michael; Chen, Coming; Chu, Liham; Kao, H.W.; Tsai, N.S.
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023
Academic Journal
Yang, Joshua; Rosenmöller, Boudewijn R.A.M.; van Riet, Tom C.T.; Tan, Misha L.; Jamaludin, Faridi S.; Ho, Jean-Pierre T.F.; de Lange, Jan
Sleep and Breathing: International Journal of the Science and Practice of Sleep Medicine. :1-9
Conference
2022 IEEE 25th International Conference on Intelligent Transportation Systems (ITSC) Intelligent Transportation Systems (ITSC), 2022 IEEE 25th International Conference on. :4017-4023 Oct, 2022
Academic Journal
Yang, C.Y.; Wu, J.H.; Chung, C.H.; You, J.Y.; Yu, T.C.; Ma, C.J.; Lee, C.T.; Ueda, D.; Hsu, H.T.; Chang, E.Y.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):6644-6649 Dec, 2022
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 22(2):276-281 Jun, 2022
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