학술논문
'학술논문'
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1~10
Conference
Deixler, P.; Rodriguez, A.; De Boer, W.; Sun, H.; Colclaser, R.; Bower, D.; Bell, N.; Yao, A.; Brock, R.; Bouttement, Y.; Hurkx, G.A.M.; Tiemeijer, L.F.; Paasschens, J.C.J.; Huizing, H.G.A.; Hartskeerl, D.M.H.; Agrarwal, P.; Magnee, P.H.C.; Aksen, E.; Slotboom, J.W.
Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting. :233-236 2004
Conference
Deixler, P.; Letavic, T.; Mahatdejkul, T.; Bouttement, Y.; Brock, R.; Tan, P.C.; Saikumar, V.; Rodriguez, A.; Colclaser, R.; Kellowan, P.; Sun, H.; Bell, N.; Bower, D.; Yao, A.; van Langevelde, R.; Vanhoucke, T.; van Noort, W.D.; Hurkx, G.A.M.; Crespo, D.; Biard, C.; Bardy, S.; Slotboom, J.W.
Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Biopolar/BiCMOS Circuits and Technology Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Proceedings of the. :272-275 2005
Conference
Tiemeijer, L.F.; Havens, R.J.; de Kort, R.; Scholten, A.J.; van Langevelde, R.; Klaassen, D.B.M.; Sasse, G.T.; Bouttement, Y.; Petot, C.; Bardy, S.; Gloria, D.; Scheer, P.; Boret, S.; Van Haaren, B.; Clement, C.; Larchanche, J.-F.; Lim, I.-S.; Duvallet, A.; Zlotnicka, A.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :441-444 2004
Academic Journal
Crépel, O.; Desplats, R.; Bouttement, Y.; Perdu, P.; Goupil, C.; Descamps, P.; Beaudoin, F.; Marina, L.
In Microelectronics Reliability 2003 43(9):1809-1814
Academic Journal
In Annales d'Endocrinologie September 2020 81(4):289-290
Conference
Deixler, P.; Rodriguez, A.; De Boer, W.; Sun, H.; Colclaser, R.; Bower, D.; Bell, N.; Yao, A.; Brock, R.; Bouttement, Y.; Hurkx, G.A.M.; Tiemeijer, L.F.; Paasschens, J.C.J.; Huizing, H.G.A.; Hartskeerl, D.M.H.; Agrarwal, P.; Magnee, P.H.C.; Aksen, E.; Slotboom, J.W.
Proceedings of the 2004 Meeting Bipolar/BiCMOS Circuits & Technology, 2004; 2004, p233-236, 4p
Academic Journal
Hommel, M; Cornu, C; Boutitie, F; Boissel, JP; Viallet, F; BonnefoiKyriacou, D; Gayraud, D; Kiegel, P; Bissuel, JPB; Driencourt, JB; Ruel, H; Guillaume, L; Ruffie, C; Sirodot, M; Valon, P; MIchelBechet, L; Colin, B; Mourali, K; Olivier, P; Ziegler, B; Feissel, M; Cara, A; Faller, JP; Braun, JB; Chopard, JL; Berges, S; Berger, E; Rouanet, F; Orgogozo, JM; Devos, P; Testard, D; Bultel, J; Loubrieu, G; LeBolloch, A; Fallut, M; Bouniol, B; Pomet, E; Mocquard, Y; Rouhart, F; Diraison, P; Goas, JY; Zagnoli, F; Duriez, F; Riviere, B; Brault, JL; Colamarino, R; Claveloux, P; Deffond, D; Durieux, A; Tournilhac, M; Baldauf, E; RenglewiczDestgynder, C; Rondepierre, P; Brunet, JM; JulieCoaquette, V; Delefosse, F; Voisin, H; Alibert, M; Naviaux, S; Campagne, JB; Messin, R; Bakhache, E; Bouttement, C; Vanrenterghem, B; Masse, C; Lecat, N; Lenfant, F; Souyris, F; Lambert, P; Huttin, B; Gerard, D; Planque, E; Alexandre, JL; Gilet, B; Limousin, P; Kok, G; Lizeretti, J; Verier, A; Delisse, B; CaparrosLefebvre, D; DurieuCouade, I; Godefroy, O; Goldstein, P; Henon, H; Lestavel, P; Leys, D; Lucas, C; MounierVehier, F; Mathe, D; Clement, S; Ducluzeau, R; Meyran, S; Demaziere, J; Coppere, B; Ninet, J; Madoux, MHG; Gabollet, C; Laplace, S; Matas, O; Turkie, B; GavaudKennoz, C; Lafuma, H; Gallet, M; Lestrevel, M; Granger, J; Rozand, G; CrettetPousset, G; Savet, JF; Cavallaro, J; Mangola, B; Ribier, A; Rosolacci, T; Neuville, V; Chaussinand, JP; Chanwar, J; Courtois, S; Masson, C; Ille, O; Lees, KR; Woimant, F; Amarenco, P; Chabriat, H; Bousser, MG; Nouailhat, F; Outin, H; Merrer, J; Neau, JP; Tantot, AM; Visy, JM; Vaunaize, J; Pinel, JF; DeBrughgraeve, V; Deydier, A; Hermouet, M; AdnetBonte, C; Onnient, Y; GueganMassardier, E; Tardy, B; Bertrand, JC; Viallon, A; Lafond, P; Zeni, F; Page, Y; Cusey, I; Merienne, M; Legrand, S; Tranchant, C; Rodier, G; Faitg, R; Tavernier, D; Piot, P; Gillon, T; Sache, L; Schmidt, MH; Zerouali, Y; Feuchere, P; Chollet, F; GuiraudChaumeil, B; Saudeau, D; Devauchelle, H; Autret, A; Decombe, R; Rouques, C; Billaud, B; VanRechem, M; Kassiotis, P; LegalMeigne, B; BrunetBourgin, F; McInnes, GT; Muir, KW; Reid, JL; Semple, PF
Academic Journal
Viallet, F.; Bonnefoi-Kyriacou, D.; Gayraud, D.; Kiegel, P.; Bissuel, J.P.; Driencourt, J.B.; Ruel, H.; Guillaume, L.; Ruffie, C.; Sirodot, M.; Valon, P.; Michel-Bechet, L.; Colin, B.; Mourali, K.; Olivier, P.; Ziegler, B.; Feissel, M.; Cara, A.; Faller, J.P.; Braun, J.B.; Chopard, J.L.; Berges, S.; Berger, E.; Rouanet, F.; Orgogozo, J.M.; Devos, P.; Testard, D.; Bultel, J.; Loubrieu, G.; Le Bolloc’H, A.; Fallut, M.; Bouniol, B.; Pomet, E.; Mocquard, Y.; Rouhart, F.; Diraison, P.; Goas, J.Y.; Zagnoli, F.; Duriez, F.; Rivière, B.; Brault, J.L.; Colamarino, R.; Claveloux, P.; Deffond, D.; Durieux, A.; Tournilhac, M.; Baldauf, E.; Renglewicz-Destgynder, C.; Rondepierre, P.; Brunet, J.M.; Julié-Coaquette, V.; Delefosse, F.; Voisin, H.; Alibert, M.; Naviaux, S.; Campagne, J.B.; Messin, R.; Bakhache, E.; Bouttement, C.; Vanrenterghem, B.; Masse, C.; Lecat, N.; Lenfant, F.; Souyris, F.; Lambert, P.; Huttin, B.; Gérard, D.; Planque, E.; Alexandre, J.L.; Gilet, B.; Limousin, P.; Kok, G.; Lizeretti, J.; Verier, A.; Delisse, B.; Caparros-Lefebvre, D.; Durieu-Couade, I.; Godefroy, O.; Goldstein, P.; Henon, H.; Lestavel, P.; Leys, D.; Lucas, C.; Mounier-Vehier, F.; Mathe, D.; Clement, S.; Ducluzeau, R.; Meyran, S.; Demaziere, J.; Coppéré, B.; Ninet, J.; Madoux, M.H.G.; Gabollet, C.; Laplace, S.; Matas, O.; Turkie, B.; Gavaud-Kennoz, C.; Lafuma, H.; Gallet, M.; Lestrevel, M.; Granger, J.; Rozand, G.; Crettet-Pousset, G.; Savet, J.F.; Cavallaro, J.; Mangola, B.; Ribier, A.; Rosolacci, T.; Neuville, V.; Chaussinand, J.P.; Chanwar, J.; Courtois, S.; Masson, C.; Ille, O.; Woimant, F.; Amarenco, P.; Chabriat, H.; Bousser, M.G.; Nouailhat, F.; Outin, H.; Merrer, J.; Neau, J.P.; Tantot, A.M.; Visy, J.M.; Vaunaize, J.; Pinel, J.F.; Brughgraeve, V.D.; Deydier, A.; Hermouet, M.; Adnet-Bonte, C.; Onnient, Y.; Guegan-Massardier, E.; Tardy, B.; Bertrand, J.C.; Viallon, A.; Lafond, P.; Zeni, F.; Page, Y.; Cusey, I.; Merienne, M.; Legrand, S.; Tranchant, C.; Rodier, G.; Faitg, R.; Tavernier, D.; Piot, P.; Gillon, T.; Sache, L.; Schmidt, M.H.; Zerouali, Y.; Feuchère, P.; Chollet, F.; Guiraud-Chaumeil, B.; Saudeau, D.; Devauchelle, H.; Autret, A.; Decombe, R.; Rouques, C.; Billaud, B.; Rechem, M.V.; Kassiotis, P.; Legal-Meigne, B.; Brunet-Bourgin, F.; McInnes, G.T.; Muir, K.W.; Reid, J.L.; Semple, P.F.; Hommel, M.; Boissel, J.P.; Lees, K.R.; Cornu, C.; Gauthier, E.; Visèle, N.; Boutitie, F.; Jail-Lard, A.S.; Noëlle, B.; Perez, S.; Bataille, C.; Bogaert, M.; Rascol, A.; Überla, K.; Besson, G.; Moulin, T.; Chavot, D.; Crepin-Leblond, T.; Tatu, L.; Garnier, P.; Dumas, R.; Michel, D.; Perret, J.; Rumbach, L.; Ferry, S.; Sappori, J.M.; Descottes, J.
In: New England Journal of Medicine . (New England Journal of Medicine, 18 July 1996, 335(3):145-150)
Conference
Deixler, P.; Rodriguez, A.; De Boer, W.; Sun, H.; Colclaser, R.; Bower, D.; Bell, N.; Yao, A.; Brock, R.; Bouttement, Y.; Hurkx, G.A.M.; Tiemeijer, L.F.; Paasschens, J.C.J.; Huizing, H.G.A.; Hartskeerl, D.M.H.; Agarwal, P.; Magnee, P.H.C.; Aksen, E.; Slotboom, J.W.
In: Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting , Proceedings of the 2004 IEEE Bipolar/BiCMOS Circuits and Technology Meeting. (Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting, 2004, :233-236)
Conference
Chevrie, D.; Bunel, C.; Bouttement, Y.; Bardy, S.; Hamelin, L.; Van Grunsven, E.; Burghoorn, M.; De Samber, M.
In: 15th European Microelectronics and Packaging Conference and Exhibition, EMPC 2005 - Conference Programme and Proceedings , 15th European Microelectronics and Packaging Conference and Exhibition, EMPC 2005 - Conference Programme and Proceedings. (15th European Microelectronics and Packaging Conference and Exhibition, EMPC 2005 - Conference Programme and Proceedings, 2005, :233-238)
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[검색어] Bouttement, C.
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