학술논문
'학술논문'
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Academic Journal
Marsh JM; The Procter & Gamble Company, Mason Business Center, 8700 Mason-Montgomery Road, Mason, Ohio 45040, United States.; Mamak M; The Procter & Gamble Company, Mason Business Center, 8700 Mason-Montgomery Road, Mason, Ohio 45040, United States.; Wireko F; The Procter & Gamble Company, Mason Business Center, 8700 Mason-Montgomery Road, Mason, Ohio 45040, United States.; Lebron A; The Procter & Gamble Company, Mason Business Center, 8700 Mason-Montgomery Road, Mason, Ohio 45040, United States.; Cambron T; The Procter & Gamble Company, Mason Business Center, 8700 Mason-Montgomery Road, Mason, Ohio 45040, United States.; Huber D; Center for Electron Microscopy and Analysis, The Ohio State University, 1305 Kinnear Road, Columbus, Ohio 43212, United States.; Boona I; Center for Electron Microscopy and Analysis, The Ohio State University, 1305 Kinnear Road, Columbus, Ohio 43212, United States.; Williams REA; Center for Electron Microscopy and Analysis, The Ohio State University, 1305 Kinnear Road, Columbus, Ohio 43212, United States.; McComb DW; Center for Electron Microscopy and Analysis, The Ohio State University, 1305 Kinnear Road, Columbus, Ohio 43212, United States.
Publisher: ACS Publications Country of Publication: United States NLM ID: 101729147 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2576-6422 (Electronic) Linking ISSN: 25766422 NLM ISO Abbreviation: ACS Appl Bio Mater Subsets: PubMed not MEDLINE; MEDLINE
Academic Journal
Adloff, C.; Blaha, J.; Blaising, J. -J.; Drancourt, C.; Espargiliere, A.; Gaglione, R.; Geffroy, N.; Karyotakis, Y.; Prast, J.; Vouters, G.; Bilki, B.; Francis, K.; Repond, J.; Smith, J.; Xia, L.; Baldolemar, E.; Li, J.; Park, S. T.; Sosebee, M.; White, A. P.; Yu, J.; Buanes, T.; Eigen, G.; Mikami, Y.; Watson, N. K.; Mavromanolakis, G.; Thomson, M. A.; Ward, D. R.; Yan, W.; Benchekroun, D.; Hoummada, A.; Khoulaki, Y.; Benyamna, M.; Carloganu, C.; Fehr, F.; Gay, P.; Manen, S.; Royer, L.; Blazey, G. C.; Boona, S.; Chakraborty, D.; Dyshkant, A.; Hedin, D.; Lima, J. G. R.; Powell, J.; Rykalin, V.; Scurti, N.; Smith, M.; Tran, N.; Zutshi, V.; Hostachy, J. -Y.; Morin, L.; Cornett, U.; David, D.; Dietrich, J.; Falley, G.; Gadow, K.; Goettlicher, P.; Guenter, C.; Hermberg, B.; Karstensen, S.; Krivan, F.; Lucaci-Timoce, A. -I.; Lu, S.; Lutz, B.; Marchesini, I.; Morozov, S.; Morgunov, V.; Reinecke, M.; Sefkow, F.; Smirnov, P.; Terwort, M.; Vargas-Trevino, A.; Feege, N.; Garutti, E.; Eckert, P.; Kaplan, A.; Schultz-Coulon, H. -Ch; Shen, W.; Stamen, R.; Tadday, A.; Norbeck, E.; Onel, Y.; Wilson, G. W.; Kawagoe, K.; Uozumi, S.; Dauncey, P. D.; Magnan, A. -M.; Bartsch, V.; Wing, M.; Salvatore, F.; Calvo Alamillo, E.; Fouz, M. -C.; Puerta-Pelayot, J.; Bobchenko, B.; Chadeeva, M.; Danilov, M.; Epifantsev, A.; Markin, O.; Mizuk, R.; Novikov, E.; Rusinov, V.; Tarkovsky, E.; Kirikova, N.; Kozlov, V.; Soloviev, Y.; Buzhan, P.; Dolgoshein, B.; Ilyin, A.; Kantserov, V.; Kaplin, V.; Karakash, A.; Popova, E.; Smirnov, S.; Frey, A.; Kiesling, C.; Seidel, K.; Simon, F.; Soldner, C.; Weuste, L.; Bonis, J.; Bouquet, B.; Callier, S.; Cornebise, P.; Doublet, Ph; Dulucq, F.; Giannelli, M. Faucci; Fleury, J.; Li, H.; Martin-Chassard, G.; Richard, F.; de la Taille, Ch; Poeschl, R.; Raux, L.; Seguin-Moreau, N.; Wicek, F.; Anduze, M.; Boudry, V.; Brient, J-C.; Jeans, D.; de Freitas, P. Mora; Musat, G.; Reinhard, M.; Ruan, M.; Videau, H.; Bulanek, B.; Zacek, J.; Cvach, J.; Gallus, P.; Havranek, M.; Janata, M.; Kvasnicka, J.; Lednicky, D.; Marcisovsky, M.; Polak, I.; Popule, J.; Tomasek, L.; Tomasek, M.; Ruzicka, P.; Sicho, P.; Smolik, J.; Vrba, V.; Zalesak, J.; Belhorma, B.; Ghazlane, H.; Takeshita, T.; CALICE Collaboration
Academic Journal
Burnett, T. L.; Winiarski, B.; Kelley, R.; Zhong, X. L.; Boona, I. N.; McComb, D. W.; Mani, K.; Burke, M. G.; Withers, P. J.
Microscopy Today; May2016, Vol. 24 Issue 3, p32-39, 8p
Conference
Simon, J.; Mun, N.; George, A.; Baur, J.; Busch, J.; Meadows, C.; Liszewski, K.; Boona, I.; Wickey, K.; Kent, T.; Kimura, A.; McCue, J.; Via, G.D.; Dupaix, B.
In: Proceedings of the 2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021 , Proceedings of the 2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021. (Proceedings of the 2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021, 2021)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis , ISTFA 2021: Proceedings from the 47th International Symposium for Testing and Failure Analysis Conference. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2021, 2021-October:418-422)
Academic Journal
Sola, A.; Basso, V.; Kuepferling, M.; Pasquale, M.; Heremans, J.; Pearson, J.E.; Ne Meier, D.C.; Reiss, G.; Kuschel, T.; Kikkawa, T.; Uchida, K.-I.; Saitoh, E.; Jin, H.; Watzman, S.J.; Boona, S.; Jungfleisch, M.B.; Zhang, W.; Hoffmann, A.; Schumacher, H.W.
In: IEEE Transactions on Instrumentation and Measurement . (IEEE Transactions on Instrumentation and Measurement, June 2019, 68(6):1765-1773)
Conference
Sola, A.; Basso, V.; Kuepferling, M.; Pasquale, M.; Meier, D.; Reiss, G.; Kuschel, T.; Kikkawa, T.; Uchida, K.-I.; Saitoh, E.; Jin, H.; Boona, S.; Watzman, S.; Heremans, J.; Hoffmann, A.; Schumacher, H.W.
In: CPEM 2018 - Conference on Precision Electromagnetic Measurements , CPEM 2018 - Conference on Precision Electromagnetic Measurements. (CPEM 2018 - Conference on Precision Electromagnetic Measurements, 19 October 2018)
Periodical
CFO, The Magazine for Senior Financial Executives. May, 2006, Vol. 22 Issue 6, p13, 2 p.
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[검색어] Boona, I.
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