학술논문
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Tao J; School of Information Science and Technology, Northeast Normal University, 2555 Jingyue Jilin, 130117, Changchun, China.; Zhao W; School of Information Science and Technology, Northeast Normal University, 2555 Jingyue Jilin, 130117, Changchun, China. zhaow577@nenu.edu.cn.; Zhang Y; Center for Studies of Education and Psychology of Ethnic Minorities in Southwest China, Southwest University, 2 Tiansheng, Beibei, 400715, Chongqing, China.; Guo Q; School of Information Science and Technology, Northeast Normal University, 2555 Jingyue Jilin, 130117, Changchun, China.; Min B; School of Information Science and Technology, Northeast Normal University, 2555 Jingyue Jilin, 130117, Changchun, China.; Instruction Center of Practice Skills for Primary and Secondary Schools in Dalian China, 52 Qingchun, 116300, Dalian, China.; Xu X; School of Information Science and Technology, Northeast Normal University, 2555 Jingyue Jilin, 130117, Changchun, China.; Liu F; School of Information Science and Technology, Northeast Normal University, 2555 Jingyue Jilin, 130117, Changchun, China. liufj06@126.com.; School of Educational Science, Shaanxi University of Technology, 1 Dongyi, Hanzhong, 723001, Shaanxi, China. liufj06@126.com.
Publisher: Springer Country of Publication: United States NLM ID: 101244316 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1554-3528 (Electronic) Linking ISSN: 1554351X NLM ISO Abbreviation: Behav Res Methods Subsets: MEDLINE
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Zhang, Qi (1-CAR) AMS Author Profile; Pan, Xinghong (PRC-NAA) AMS Author Profile
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In: Zhongguo Zhongyao Zazhi . (Zhongguo Zhongyao Zazhi, July 2024, 49(13):3493-3504)
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In: Journal of Physics D: Applied Physics . (Journal of Physics D: Applied Physics, 20 September 2024, 57(37))
Academic Journal
Experimental Mechanics: An International Journal Integrating Experimental Methods with the Mechanical Behavior of Materials and Structures. 61(8):1215-1215
Academic Journal
Wei, J; Alleman, C; Ao, H; Arend, B; Barofsky, D; Beher, S; Bollen, G; Bultman, N; Casagrande, F; Chang, W; Choi, Y; Cogan, S; Cole, P; Compton, C; Cortesi, M; Curtin, J; Davidson, K; Di Carlo, S; Du, X; Elliott, K; Ewert, B; Facco, A; Fila, A; Fukushima, K; Ganni, V; Ganshyn, A; Ginter, T; Glasmacher, T; Gonzalez, A; Hao, Y; Hartung, W; Hasan, N; Hausmann, M; Holland, K; Hseuh, HC; Ikegami, M; Jager, D; Jones, S; Joseph, N; Kanemura, T; Kim, SH; Knowles, C; Konomi, T; Kortum, B; Kulkarni, N; Kwan, E; Lange, T; Larmann, M; Larter, T; Laturkar, K; LaVere, M; Laxdal, RE; LeTourneau, J; Li, Z-Y; Lidia, S; Machicoane, G; Magsig, C; Manwiller, P; Marti, F; Maruta, T; Metzgar, E; Miller, S; Momozaki, Y; Mugerian, M; Morris, D; Nesterenko, I; Nguyen, C; Ostroumov, P; Patil, M; Plastun, A; Popielarski, L; Portillo, M; Powers, A; Priller, J; Rao, X; Reaume, M; Rodriguez, S; Rogers, S; Saito, K; Sherrill, BM; Smith, MK; Song, J; Steiner, M; Stolz, A; Tarasov, O; Tousignant, B; Walker, R; Wang, X; Wenstrom, J; West, G; Witgen, K; Wright, M; Xu, T; Yamazaki, Y; Zhang, T; Zhao, Q; Zhao, S; Hurh, P; Prestemon, S; Shen, T
Journal of Instrumentation. 19(05)
Academic Journal
In: Nanophotonics . (Nanophotonics, 1 August 2024, 13(18):3373-3384)
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