학술논문

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'학술논문' 에서 검색결과 389건 | 목록 30~40
Academic Journal
Jamil, A.Ziegler, T.Hufschmidt, P.Li, G.Lupin-Jimenez, L.Michel, T.Ostrovskiy, I.Retiere, F.Schneider, J.Wagenpfeil, M.Alamre, A.Albert, J.B.Anton, G.Arnquist, I.J.Badhrees, I.Barbeau, P.S.Beck, D.Belov, V.Bhatta, T.Bourque, F.Brodsky, J.P.Brown, E.Brunner, T.Burenkov, A.Cao, G.F.Cao, L.Cen, W.R.Chambers, C.Charlebois, S.A.Chiu, M.Cleveland, B.Coon, M.Cote, M.Craycraft, A.Cree, W.Dalmasson, J.Daniels, T.Darroch, L.Daugherty, S.J.Daughhetee, J.Delaquis, S.Mesrobian-Kabakian, A.D.DeVoe, R.Dilling, J.Ding, Y.Y.Dolinski, M.J.Dragone, A.Echevers, J.Fabris, L.Fairbank, D.Fairbank, W.Farine, J.Feyzbakhsh, S.Fontaine, R.Fudenberg, D.Gallina, G.Giacomini, G.Gornea, R.Gratta, G.Hansen, E.V.Harris, D.Hasan, M.Heffner, M.HoBl, J.Hoppe, E.W.House, A.Hughes, M.Ito, Y.Iverson, A.Jessiman, C.Jewell, M.J.Jiang, X.S.Karelin, A.Kaufman, L.J.Koffas, T.Kravitz, S.Krucken, R.Kuchenkov, A.Kumar, K.S.Lan, Y.Larson, A.Leonard, D.S.Li, S.Li, Z.Licciardi, C.Lin, Y.H.Lv, P.MacLellan, R.Mong, B.Moore, D.C.Murray, K.Newby, R.J.Ning, Z.Njoya, O.Nolet, F.Nusair, O.Odgers, K.Odian, A.Oriunno, M.Orrell, J.L.Ortega, G.S.Overman, C.T.Parent, S.Piepke, A.Pocar, A.Pratte, J.Qiu, D.Radeka, V.Raguzin, E.Rao, T.Rescia, S.Robinson, A.Rossignol, T.Rowson, P.C.Roy, N.Saldanha, R.Sangiorgio, S.Schmidt, S.Schubert, A.Sinclair, D.Skarpaas, K.Soma, A.K.St-Hilaire, G.Stekhanov, V.Stiegler, T.Sun, X.L.Tarka, M.Todd, J.Tolba, T.Totev, T.I.Tsang, R.Tsang, T.Vachon, F.Veenstra, B.Veeraraghavan, V.Visser, G.Vuilleumier, J.Wang, Q.Watkins, J.Weber, M.Wei, W.Wen, L.J.Wichoski, U.Wrede, G.Wu, S.X.Wu, W.H.Xia, Q.Yang, L.Yen, Y.Zeldovich, O.Zhang, X.Zhao, J.Zhou, Y.
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 65(11):2823-2833 Nov, 2018
Academic Journal
In: Zhonghua xin xue guan bing za zhi. (Zhonghua xin xue guan bing za zhi, 24 October 2020, 48(10):876-877)
Conference
Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :25-28 2004
Conference
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014 Symposium on. :1-2 Jun, 2014
Conference
2000 Power Engineering Society Summer Meeting (Cat. No.00CH37134) Power Engineering Society Summer Meeting Power Engineering Society Summer Meeting, 2000. IEEE. 3:1363-1368 vol. 3 2000
Academic Journal
IEEE Transactions on Aerospace and Electronic Systems IEEE Trans. Aerosp. Electron. Syst. Aerospace and Electronic Systems, IEEE Transactions on. 51(1):290-303 Jan, 2015
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[AR] Wu, W.H.
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