학술논문

발행년
-
(예 : 2010-2015)
'학술논문' 에서 검색결과 201건 | 목록 30~40
Conference
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571) Custom integrated circuists Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004. :309-316 2004
Conference
International Conference on Microelectronic Test Structures, 2003. Microelectronic test structures Microelectronic Test Structures, 2003. International Conference on. :238-243 2003
Conference
Proceedings International Symposium on Quality Electronic Design Quality electronic design Quality Electronic Design, 2002. Proceedings. International Symposium on. :129-132 2002
Conference
Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition Design, automation and test in Europe conference Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings. :192-196 2002
Conference
Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169) Custom integrated circuits Custom Integrated Circuits, 2001, IEEE Conference on.. :271-274 2001
Conference
Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design Quality electronic design Quality Electronic Design, 2001 International Symposium on. :488-492 2001
Conference
2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550) Statistical methodology Statistical Methodology, IEEE International Workshop on, 2001 6yh.. :60-63 2001
Conference
Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) Quality electronic design Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on. :455-459 2000
Conference
2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502) Simulation of semiconductor processes and devices Simulation of Semiconductor Processes and Devices, 2000. SISPAD 2000. 2000 International Conference on. :143-146 2000
Conference
2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489 Statistical metrology Statistical Metrology, 2000 5th International Workshop on. :76-79 2000
검색 결과 제한하기
제한된 항목
[AR] Guardiani, C.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어