학술논문
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Conference
Pinili, T.; Manolo, R.; Denoyo, A.; Yabut, B.; Moore, D.; Cowell, B.; Jenson, J.; Truong, K.; Gambino, J.; Watkins, R.; Qin, W.; Brizar, G.; De Clerq, J.
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-5 Jul, 2018
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis , ISTFA 2023: Proceedings of the 49th International Symposium for Testing and Failure Analysis Conference. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2023, 2023-November:452-458)
Conference
In: Conference Proceedings from the International Symposium for Testing and Failure Analysis , ISTFA 2023: Proceedings of the 49th International Symposium for Testing and Failure Analysis Conference. (Conference Proceedings from the International Symposium for Testing and Failure Analysis, 2023, 2023-November:538-549)
Academic Journal
In: Journal of Pediatric Gastroenterology and Nutrition . (Journal of Pediatric Gastroenterology and Nutrition, 1996, 23(5):624-627)
Conference
In: IIE Annual Conference and Exhibition 2004 , IIE Annual Conference and Exhibition 2004. (IIE Annual Conference and Exhibition 2004, 2004, :3643-3680)
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[AR] Yabut, B.
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