학술논문
'학술논문'
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Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A.; Delannoy, A. G.; Dierlamm, A.; Dragicevic, M.; Gholami, A.; Gomez, G.; Guthoff, M.; Haranko, M.; Homna, A.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmáros, B.; Liu, W. H.; Lokhovitskiy, A.; Loos, R.; Mallows, S.; Michel, J.; Myronenko, V.; Pásztor, G.; Pari, M.; Schwandt, J.; Sedghi, M.; Shevelev, A.; Shibin, K.; Steinbrueck, G.; Stickland, D.; Ujvari, B.; Wegrzyn, G. J.
Conference
2017 2nd International Conference for Convergence in Technology (I2CT) Convergence in Technology (I2CT), 2017 2nd International Conference for. :867-872 Apr, 2017
Conference
Aleksandrowicz, G.; Arbel, E.; Bloem, R.; Ter Braak, T.; Devadze, S.; Fey, G.; Jenihhin, M.; Jutman, A.; Kerkhoff, H.G.; Konighofer, R.; Malburg, J.; Moran, S.; Raik, J.; Rauwerda, G.; Riener, H.; Rock, F.; Shibin, K.; Sunesen, K.; Wan, J.; Zhao, Y.
2016 Forum on Specification and Design Languages (FDL) Specification and Design Languages (FDL), 2016 Forum on. :1-8 Sep, 2016
Conference
2011 Proceedings of the 22nd EAEEIE Annual Conference (EAEEIE) EAEEIE Annual Conference (EAEEIE), 2011 Proceedings of the 22nd. :1-6 Jun, 2011
Academic Journal
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 30(5):26-35 Oct, 2013
Conference
2015 16th Latin-American Test Symposium (LATS) Test Symposium (LATS), 2015 16th Latin-American. :1-6 Mar, 2015
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, July 2023, 146)
Academic Journal
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 34(6):27-35 Dec, 2017
Academic Journal
Shibin, K.; Gunasekaran, Angappa; Papadopoulos, Thanos; Childe, Stephen; Dubey, Rameshwar; Singh, Tripti
Conference
In: Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT , 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT, 2023)
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[AR] Shibin, K.
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