학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 23건 | 목록 1~10
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(1):114-125 Jan, 2024
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(2):485-490 Feb, 2021
Conference
2017 8th Annual Industrial Automation and Electromechanical Engineering Conference (IEMECON) Industrial Automation and Electromechanical Engineering Conference (IEMECON), 2017 8th Annual. :33-38 Aug, 2017
Conference
In: International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, 2023 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2023. (International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, 2023, :193-196)
Conference
In: IEEE International Reliability Physics Symposium Proceedings, 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, March 2021, 2021-March)
Conference
In: IEEE International Reliability Physics Symposium Proceedings, 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, March 2021, 2021-March)
Conference
In: IEEE International Reliability Physics Symposium Proceedings, 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, March 2021, 2021-March)
Conference
In: IEEE International Reliability Physics Symposium Proceedings, 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, March 2021, 2021-March)
Book
In: Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact. (Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact, 1 January 2021, :173-197)
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제한된 항목
[AR] Samadder, T.
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