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발행년	- (예 : 2010-2015)

전체선택

Effects of magnetic seed-layers on the structural and magnetic properties of Co2MnSi Heusler alloy

Academic Journal

Bae, Taejin; Lee, Sangho; Hong, Jongill; Lee, Dong Ryeol; Roh, Jaesung

In Materials Chemistry and Physics 15 October 2012 136(2-3):577-581

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

The Effect of Tunnel Barrier at Resistive Switching Device for Low Power Memory Applications

Conference

Choi, Hyejung; Yi, Jaeyun; Hwang, Sangmin; Lee, Sangkeum; Song, Seokpyo; Lee, Seunghwan; Lee, Jaeyeon; Son, Donghee; Park, Jinwon; Kim, Suk-Ju; Kim, Ja-Yong; Lee, Sunghoon; Moon, Jiwon; Kim, Choidong; Park, Jungwoo; Joo, Moonsig; Roh, JaeSung; Park, Sungki; Chung, Sung-Woong; Rhee, Junghoon; Hong, Sung Joo

2011 3rd IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2011 3rd IEEE International. :1-4 May, 2011

Full Text (IEEE) Find it@PNU

Highly reliable and fast nonvolatile hybrid switching ReRAM memory using thin Al2O3 demonstrated at 54nm memory array

Conference

Yi, Jaeyun; Choi, Hyejung; Lee, Seunghwan; Lee, Jaeyeon; Son, Donghee; Lee, Sangkeum; Hwang, Sangmin; Song, Seokpyo; Park, Jinwon; Kim, Sookjoo; Kim, Wangee; Kim, Ja-Yong; Lee, Sunghoon; Moon, Jiwon; You, Jinju; Joo, Moonsig; Roh, JaeSung; Park, Sungki; Chung, Sung-Woong; Lee, Junghoon; Hong, Sung-Joo

2011 Symposium on VLSI Technology - Digest of Technical Papers VLSI Technology (VLSIT), 2011 Symposium on. :48-49 Jun, 2011

Full Text (IEEE) Find it@PNU

Requirements of bipolar switching ReRAM for 1T1R type high density memory array

Conference

Yi, Jaeyun; Choi, Hyejung; Song, Seokpyo; Son, Donghee; Lee, Sangkeum; Park, Jinwon; Kim, Wangee; Sung, Mingyu; Lee, Sunghoon; Moon, Jiwon; Kim, Choidong; Park, Jungwoo; Joo, Moonsig; Roh, JaeSung; Park, Sungki; Chung, Sung-Woong; Jeong, Jaegoan; Hong, Sung-Joo; Park, Sung-Wook

Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications VLSI Technology, Systems and Applications (VLSI-TSA), 2011 International Symposium on. :1-2 Apr, 2011

Full Text (IEEE) Find it@PNU