학술논문
'학술논문'
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Academic Journal
Rowan, S.E.; Gardner, E.M.; Wyles, D.L.; Kamis, K.F.; Al-Tayyib, A.A.; Haukoos, J.; Hopkins, E.; Gravitz, S.; Lyle, C.; Galbraith, J.W.; Hsieh, Y.-H.; Rothman, R.E.; Lyons, M.S.; White, D.A.E.; Morgan, J.R.; Linas, B.P.; Sabel, A.L.; Adler, A.; Alishahi, M.; Avornu, G.D.; Becerra, A.; Becerra-Ashby, E.; Bellamy, M.; Bot, S.; Boyle, A.J.; Bracey, A.M.; Breyer, M.; Camacho, C.; Cupelo, A.; Dashler, G.; Doyle, P.; Eicher, A.; Gardner, H.; de Gruiter, C.A.; Henry, S.; Higgins, D.; Hill, T.; Houk, R.; Johnson, N.; Kile, A.; Liebl, J.; Maliszewski, B.; Maliszewski, K.; McGoey, R.; McKenzie, C.; Minturn, M.S.; Myer, D.; Neumann, K.; Ossian, C.; Peacock, R.K.; Perez, D.; Pramanick, T.; Ricketts, E.P.; Riggan, B.; Riser, S.; Roosevelt, G.; Saheed, M.; Schumacher, S.; Shy, B.; Simpson, S.; Toerper, M.F.; Trest, G.; Unsworth, M.; Waltrous, L.; Watson, B.
In: Trials . (Trials, December 2023, 24(1))
Academic Journal
Haukoos, J.S.; Hopkins, E.; Al-Tayyib, A.A.; Rowan, S.E.; Gardner, E.M.; Wyles, D.L.; Kamis, K.F.; Galbraith, J.W.; Rothman, R.E.; Hsieh, Y.-H.; Toerper, M.F.; Houk, R.A.; Morgan, J.R.; Linas, B.P.; Lyons, M.S.; Sabel, A.L.; White, D.A.E.; Adler, A.; Alishahi, M.; Avornu, G.D.; Becerra, A.; Becerra-Ashby, E.; Bot, S.; Boyle, A.J.; Bracey, A.M.; Breyer, M.; Camacho, C.; Cupelo, A.; Dashler, G.; Doyle, P.; Eicher, A.; Gardner, H.; de Gruiter, C.A.; Gravitz, S.; Henry, S.; Higgins, D.; Hill, T.; Johnson, N.; Kile, A.; Liebl, J.; Lyle, C.; Maliszewski, B.; Maliszewski, K.; McGoey, R.; McKenzie, C.; Minturn, M.S.; Myer, D.; Neumann, K.; Ossian, C.; Peacock, R.K.; Perez, D.; Pramanick, T.; Ricketts, E.P.; Riggan, B.; Riser, S.; Roosevelt, G.; Saheed, M.; Shy, B.; Simpson, S.; Trest, G.; Unsworth, M.; Waltrous, L.; Watson, B.
In: Trials . (Trials, December 2022, 23(1))
Academic Journal
In: Image and Vision Computing . (Image and Vision Computing, February 2020, 94)
Conference
Fondje, C.N.; Nikhal, K.; Peace, J.B.; Karl, R.; Riggan, B.; Lee, M.W.; Berkowitz, P.; Gramzinski, K.; Kennedy, B.; Uzuegbunam, N.; Ou, V.; Barret, T.; Arend, O.; Ming, W.; Semenova, S.
In: 2023 IEEE International Joint Conference on Biometrics, IJCB 2023 , 2023 IEEE International Joint Conference on Biometrics, IJCB 2023. (2023 IEEE International Joint Conference on Biometrics, IJCB 2023, 2023)
Conference
In: Conference Record - Asilomar Conference on Signals, Systems and Computers , 56th Asilomar Conference on Signals, Systems and Computers, ACSSC 2022. (Conference Record - Asilomar Conference on Signals, Systems and Computers, 2022, 2022-October:339-343)
Conference
In: IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops , Proceedings - 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2019. (IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, June 2019, 2019-June:980-987)
Conference
In: 2018 International Conference of the Biometrics Special Interest Group, BIOSIG 2018 , 2018 International Conference of the Biometrics Special Interest Group, BIOSIG 2018. (2018 International Conference of the Biometrics Special Interest Group, BIOSIG 2018, 10 October 2018)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Polarization: Measurement, Analysis, and Remote Sensing XIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2018, 10655)
Academic Journal
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[AR] Riggan, B.
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