학술논문
'학술논문'
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IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 70(11):11078-11086 Nov, 2023
Academic Journal
IEEE Geoscience and Remote Sensing Letters IEEE Geosci. Remote Sensing Lett. Geoscience and Remote Sensing Letters, IEEE. 20:1-4 2023
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(10):5858-5864 Oct, 2022
Academic Journal
In: International Journal of Advanced Manufacturing Technology . (International Journal of Advanced Manufacturing Technology, October 2023, 128(9-10):4579-4592)
Academic Journal
In: Annals of Hepato-Biliary-Pancreatic Surgery . (Annals of Hepato-Biliary-Pancreatic Surgery, August 2023, 27(3):287-291)
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(1):333-339 Jan, 2022
Academic Journal
Sahu, M.; Shah, M.; Pullikanti, B.; Mallela, V.R.; Boorugu, H.K.; Punjani, A.A.R.; Bongu, V.K.; Kamalesh, A.; Kola, V.R.; Kumar, R.V.; Kumar, S.; Manusrut, M.; Kumar, S.C.R.; Sahoo, P.R.; Rathod, R.; Babu, D.M.; Gonuguntla, H.K.; Yedlapati, G.K.; Mallu, G.R.; Reddy, Y.S.; Nagaraju, B.; Reddy, V.V.; Alwala, S.; Kumar, R.N.K.; Jaishetwar, G.S.; Bagapally, R.S.; Srinivas, J.S.; Balasubramaniam, A.; Rajagopalan, B.K.; Prakasham, S.P.; Nimmala, P.; Vaswani, B.A.; Mishra, P.K.; Nemmaniwar, T.R.; Naidu, V.Y.; Dhananjay, K.; Gurunath, J.M.; Rao, B.K.; Yamjala, N.; Ram, B.; Mamidi, P.R.; Babu, P.; Agrawal, V.; Satish, K.S.; Marda, S.; Srivastav, S.K.; Komandla, S.R.; Babu, V.S.; Anandh, U.; Gudelli, M.; Radhika, T.K.; Darapureddy, A.K.; Chirumamilla, H.; Reddy, N.; Chaudhuri, J.R.; Kambhapati, S.V.S.S.R.K.; Seshikiran, K.; Haritha, M.; Reddy, G.K.M.; Reddy, P.V.G.; Balasubramaniam, V.; Ingle, A.; Punjani, T.A.
In: Infection . (Infection, April 2023, 51(2):407-416)
Academic Journal
Krishna, A.V.; Reddy, V.V.; Rosen, B.-G.; Dexter, D.W.; Wälivaara, D.-I.; Abrahamsson, P.; Anderud, J.
In: Surface Topography: Metrology and Properties . (Surface Topography: Metrology and Properties, March 2023, 11(1))
Academic Journal
In: Surface Topography: Metrology and Properties . (Surface Topography: Metrology and Properties, March 2023, 11(1))
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[AR] Reddy, V.V.
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