학술논문
'학술논문'
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Academic Journal
In Structural Change and Economic Dynamics 1999 10(1):73-97
A successful DFT tester: what will it look like? Is DFT tester a logical next step in ATE evolution?
Conference
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) VLSI test symposium VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE. :129-129 2002
Conference
Zorian, Y.; Prinetto, P.; Teixeira, J.; Teixeira, I.; Pereira, C.; Dias, O.; Semiao, J.; Muhmenthaler, P.; Radermacher, W.
Proceedings of the conference on Design, automation and test in Europe. :34-37
Conference
Zorian, Y.; Prinetto, P.; Teixeira, J.; Teixeira, I.; Pereira, C.; Dias, O.; Semiao, J.; Muhmenthaler, P.; Radermacher, W.
Proceedings of the Conference: Design, Automation & Test in Europe; 3/13/2001, p34-37, 4p
Fehlende und Fehlerhafte Daten in der Amtlichen Statistik. Neue Herausforderungen und Lösungsansätze
Academic Journal
In: Allgemeines Statistisches Archiv . (Allgemeines Statistisches Archiv, December 2006, 90(4):553-576)
Academic Journal
In: International Journal of Sustainable Development . (International Journal of Sustainable Development, 1999, 2(1):7-31)
Academic Journal
In: International Journal of Sustainable Development . (International Journal of Sustainable Development, 1999, 2(1):59-94)
Academic Journal
In: International Statistical Review . (International Statistical Review, December 1999, 67(3):339-354)
Academic Journal
In: Statistical Journal of the United Nations Economic Commission for Europe . (Statistical Journal of the United Nations Economic Commission for Europe, 1994, 11(1):35-51)
Academic Journal
In: Geo-Informations-Systeme . (Geo-Informations-Systeme, 1990, 3(4):9-15)
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제한된 항목
[AR] Radermacher, W.
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