학술논문
'학술논문'
에서 검색결과 305건 | 목록
1~10
Academic Journal
Chanteux, H.; Kramer, H.; Otoul, C.; Rospo, C.; De Bruyn, S.; Bani, M.; Sciberras, D.; MacPherson, M.; Okagaki, T.; Watling, M.
In: Expert Opinion on Drug Metabolism and Toxicology . (Expert Opinion on Drug Metabolism and Toxicology, 2024, 20(8):841-855)
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 19(1):97-103 Mar, 2019
Conference
Okagaki, T.; Shibutani, K.; Matsushita, H.; Ojiro, H.; Morimoto, M.; Tsukamoto, Y.; Nii, K.; Onozawa, K.
Proceedings of the 2015 International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2015 International Conference on. :141-144 Mar, 2015
Conference
Okagaki, T.; Hasegawa, T.; Takashino, H.; Fujii, M.; Tsuda, A.; Shibutani, K.; Deguchi, Y.; Yokota, M.; Onozawa, K.
2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on. :203-206 Mar, 2013
Conference
Takashino, H.; Tanizawa, M.; Okagaki, T.; Hayashi, T.; Taya, M.; Ishida, H.; Ishikawa, K.; Inoue, Y.
2011 International Conference on Simulation of Semiconductor Processes and Devices Simulation of Semiconductor Processes and Devices (SISPAD), 2011 International Conference on. :107-110 Sep, 2011
Conference
2005 International Conference On Simulation of Semiconductor Processes and Devices Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on. :199-202 2005
Conference
Okagaki, T.; Tanizawa, M.; Fujinaga, M.; Kunikiyo, T.; Yuki, H.; Ishikawa, K.; Nishikawa, Y.; Eimori, T.; Inuishi, M.; Oji, Y.
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :219-222 2005
Conference
Okagaki, T.; Takeshita, N.; Tanaka, S.; Tateishi, S.; Shibutani, K.; Tsutsui, T.; Abe, H.; Yokota, M.; Onozawa, K.
2012 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on. :95-97 Mar, 2012
Academic Journal
Takashino, H.; Tanizawa, M.; Okagaki, T.; Hayashi, T.; Taya, M.; Ishida, H.; Ishikawa, K.; Inoue, Y.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 59(12):3199-3204 Dec, 2012
Conference
Proceedings 2000. Design Automation Conference. (IEEE Cat. No.00CH37106) Asia and South Pacific design automation conference 2000 Design Automation Conference, 2000. Proceedings of the ASP-DAC 2000. Asia and South Pacific. :365-370 2000
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[AR] Okagaki, T.
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