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Aging measurement and empirical modeling of BTI on FPGA using 16 nm FinFETs for static and dynamic stresses
Academic Journal
Sobas, J.
;
Marc, F.
In
Microelectronics Reliability
November 2023 150
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Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA
Academic Journal
Sobas, J.
;
Airimitoaie, T.-B.
;
Marc, F.
In
Microelectronics Reliability
November 2022 138
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A statistical study into reliability of FPGA implemented circuits: Simulation and modelling
Academic Journal
Aguirre-Morales, J.D.
;
Marc, F.
In
Microelectronics Reliability
February 2021 117
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A unified aging compact model for hot carrier degradation under mixed-mode and reverse E-B stress in complementary SiGe HBTs
Academic Journal
Mukherjee, C.
;
Fischer, G.G.
;
Marc, F.
;
Couret, M.
;
Zimmer, T.
;
Maneux, C.
In
Solid State Electronics
October 2020 172
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A physical and versatile aging compact model for hot carrier degradation in SiGe HBTs under dynamic operating conditions
Academic Journal
Mukherjee, C.
;
Marc, F.
;
Couret, M.
;
Fischer, G.G.
;
Jaoul, M.
;
Céli, D.
;
Aufinger, K.
;
Zimmer, T.
;
Maneux, C.
In
Solid State Electronics
January 2020 163
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Outdoor fibre link between two telescopes and the lab of the CHARA array at 810 nm. Demonstration of the optical path servo control
Academic Journal
Julie, M.
;
Ludovic, G.
;
François, R.
;
Marc, F.
;
Laurent, D.
;
Rodolphe, K.
;
Jean-Michel, L.D.
In:
Experimental Astronomy
. (Experimental Astronomy, April 2024, 57(2))
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A Comparative Analysis of Liver Injury Markers in Post-COVID Syndrome among Elderly Patients: A Prospective Study
Academic Journal
Bota, A.V.
;
Bratosin, F.
;
Bogdan, I.
;
Razvan, D.V.
;
Ignuta, F.
;
Marincu, I.
;
Prodan, M.
;
Cotoraci, C.
;
Bandi, S.S.S.
;
Toma, A.-O.
;
Indries, M.F.
;
Csep, A.N.
;
Marc, F.
In:
Journal of Clinical Medicine
. (Journal of Clinical Medicine, February 2024, 13(4))
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Simulation and modelling of long term reliability of digital circuits implemented in FPGA
Academic Journal
Aguirre Morales, J.D.
;
Marc, F.
;
Bensoussan, A.
;
Durier, A.
In
Microelectronics Reliability
September 2018 88-90:1130-1134
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Degradation Measurement and Modelling under Ageing in a 16 nm FinFET FPGA
Academic Journal
Sobas, J.
;
Marc, F.
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Micromachines
. (Micromachines, January 2024, 15(1))
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Methodology of backside preparation applied on a MRAM to lead a logical investigation with a near-field probe
Academic Journal
Dumas, L.
;
Bascoul, G.
;
Marc, F.
;
Fremont, H.
;
Guerin, C.
;
Villeneuve-Faure, C.
In:
Microelectronics Reliability
. (Microelectronics Reliability, November 2023, 150)
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Gale Academic OneFile
(3)
JSTOR Journals
(3)
Springer Nature Journals
(3)
ACM Full-Text Collection
(2)
arXiv
(1)
Education Source
(1)
Journals@OVID
(1)
Gale General OneFile
(1)
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저널명(출판물, Title)
microelectronics reliability
(60)
osteoporosis international
(24)
microelectronic engineering
(10)
solid-state electronics
(7)
amino acids
(5)
revue de medecine interne
(5)
annales de physique
(4)
les annales de physique
(4)
international conference on autonomous agents
(3)
journal of investigative dermatology
(3)
medecine et maladies infectieuses
(3)
polymer
(3)
revue bibliographique de sinologie
(3)
zeitschrift fur analytische chemie
(3)
biochemical society transactions
(2)
cheminform
(2)
ieee transactions on device and materials reliability, device and materials reliability, ieee transactions on, ieee trans. device mater. relib.
(2)
ieee transactions on electron devices
(2)
journal of clinical densitometry
(2)
microelectronics and reliability
(2)
proceedings of the 12th international symposium on the physical & failure analysis of integrated circuits, 2005 (ipfa 2005)
(2)
proceedings of the 12th international symposium on the physical and failure analysis of integrated circuits, 2005. ipfa 2005., physical and failure analysis of integrated circuits, 2005. ipfa 2005. proceedings of the 12th international symposium on the, physical and failure analysis of integrated circuits
(2)
tetrahedron
(2)
toxicology in vitro
(2)
2000 ieee international symposium on circuits and systems (iscas), circuits and systems (iscas), 2000 ieee international symposium on, circuits and systems
(1)
2004 ieee international reliability physics symposium. proceedings, reliability physics symposium proceedings, 2004. 42nd annual. 2004 ieee international, reliability physics
(1)
2004 ieee international symposium on industrial electronics, industrial electronics, 2004 ieee international symposium on, industrial electronics
(1)
2005 ieee aerospace conference, aerospace conference, 2005 ieee, aerospace conference
(1)
2005 ieee international integrated reliability workshop, integrated reliability workshop final report, 2005 ieee international, integrated reliability workshop
(1)
2009 ieee international integrated reliability workshop final report, integrated reliability workshop final report, 2009. irw '09. ieee international
(1)
2010 22nd international symposium on computer architecture and high performance computing, computer architecture and high performance computing (sbac-pad), 2010 22nd international symposium on
(1)
2010 27th international conference on microelectronics proceedings, microelectronics proceedings (miel), 2010 27th international conference on
(1)
2010 ieee international integrated reliability workshop final report, integrated reliability workshop final report (irw), 2010 ieee international
(1)
2012 ieee 18th international on-line testing symposium (iolts), on-line testing symposium (iolts), 2012 ieee 18th international
(1)
2012 proceedings of the esscirc (esscirc), esscirc (esscirc), 2012 proceedings of the
(1)
2012 proceedings of the european solid-state device research conference (essderc), solid-state device research conference (essderc), 2012 proceedings of the european
(1)
6th international conference on signal processing, 2002., signal processing, 2002 6th international conference on, signal processing proceedings
(1)
cleo/europe - eqec 2009 - european conference on lasers and electro-optics and the european quantum electronics conference, lasers and electro-optics 2009 and the european quantum electronics conference. cleo europe - eqec 2009. european conference on
(1)
ieee instrumentation and measurement technology conference sensing, processing, networking. imtc proceedings, instrumentation and measurement technology conference, 1997. imtc/97. proceedings. sensing, processing, networking., ieee, instrumentation and measurement technology
(1)
ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices
(1)
ieee transactions on multi-scale computing systems, multi-scale computing systems, ieee transactions on, ieee trans. multi-scale comp. syst.
(1)
ieee/wic international conference on intelligent agent technology, 2003. iat 2003., intelligent agent technology, 2003. iat 2003. ieee/wic international conference on, intelligent agent technology
(1)
iprm 2011 - 23rd international conference on indium phosphide and related materials, compound semiconductor week (csw/iprm), 2011 and 23rd international conference on indium phosphide and related materials
(1)
kansas teacher & western school journal
(1)
molecular and general genetics mgg
(1)
pain practice
(1)
proceedings of the second international joint conference on autonomous agents and multiagent systems
(1)
proceedings of the third international joint conference on autonomous agents and multiagent systems - volume 1
(1)
proceedings of the third international joint conference on autonomous agents and multiagent systems, 2004. aamas 2004., autonomous agents and multiagent systems, 2004. aamas 2004. proceedings of the third international joint conference on
(1)
proceedings. ieee/wic/acm international conference on intelligent agent technology, 2004. (iat 2004)., intelligent agent technology, 2004. (iat 2004). proceedings. ieee/wic/acm international conference on, intelligent agent technology
(1)
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출판사(Publisher)
ieee
(48)
elsevier ltd
(37)
elsevier b.v.
(27)
springer london ltd
(24)
pergamon-elsevier science ltd
(13)
institute of electrical and electronics engineers inc.
(10)
mdpi
(6)
association for computing machinery
(5)
multidisciplinary digital publishing institute (mdpi)
(4)
springer-verlag
(4)
elsevier france-editions scientifiques medicales elsevier
(3)
oxford univ press
(3)
springer nature
(3)
edp sciences
(2)
edp sciences s a
(2)
elsevier inc.
(2)
elsevier masson sas
(2)
ieee computer society
(2)
romanian society for pharmaceutical sciences
(2)
springer science and business media deutschland gmbh
(2)
springer verlag
(2)
syscom 18 srl
(2)
wiley-blackwell
(2)
american chemical society
(1)
american marketing association
(1)
american physical society
(1)
american scientific publishers
(1)
asm international
(1)
biomed central ltd.
(1)
editions frontieres
(1)
elsevier
(1)
elsevier sas
(1)
elsevier sci ltd
(1)
elsevier science inc
(1)
frontiers media sa
(1)
institute of electrical and electronics engineers, inc.
(1)
instituto de ecologia, a.c.
(1)
lavoisier abonnements
(1)
optical society of america
(1)
optical society of america (osa)
(1)
spie
(1)
springer
(1)
springer science and business media b.v.
(1)
springer wien
(1)
state forest products research inst
(1)
statny drevarsky vyskumny ustav
(1)
taylor & francis ltd
(1)
taylor and francis ltd
(1)
taylor and francis ltd.
(1)
wiley-blackwell publishing, inc
(1)
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자료유형(Source Type)
Academic Journals
(211)
Conference Materials
(101)
Magazines
(16)
Reviews
(6)
Books
(3)
Reports
(1)
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재검색
주제어
reliability
(27)
aging
(19)
components, circuits, devices and systems
(17)
degradation
(13)
fpga
(13)
compact model
(10)
computing and processing
(10)
engineered materials, dielectrics and plasmas
(10)
simulation
(10)
stress
(10)
cmos
(9)
communication, networking and broadcast technologies
(9)
hci
(8)
hot carriers
(8)
hot-carrier degradation
(8)
modelling
(8)
circuit simulation
(7)
computational modeling
(7)
integrated circuit modeling
(7)
sorbic acid
(7)
electronic circuits
(6)
failure analysis
(6)
hot carrier injection
(6)
indium phosphide
(6)
inp hbt
(6)
ring oscillator
(6)
safe operating area
(6)
sige hbts
(6)
elderly
(5)
fields, waves and electromagnetics
(5)
power, energy and industry applications
(5)
reliability in engineering
(5)
thermostability
(5)
transistors
(5)
voltage
(5)
administration
(4)
amines
(4)
automata
(4)
digital circuits
(4)
drugs
(4)
electronics
(4)
general topics for engineers
(4)
integrated circuit reliability
(4)
multiagent systems
(4)
nbti
(4)
power consumption
(4)
vlsi
(4)
3d test
(3)
ageing
(3)
aging tests
(3)
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재검색
언어
english
(266)
french
(23)
german
(3)
spanish; castilian
(1)
undetermined
(1)
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