학술논문
'학술논문'
에서 검색결과 159건 | 목록
1~10
Academic Journal
Oudard, Stéphane; Hadaschik, Boris; Saad, Fred; Cella, David; Basch, Ethan; Graff, Julie N.; Uemura, Hiroji; Dibaj, Shiva; Li, Susan; Brookman-May, Sabine D.; De Porre, Peter; Bevans, Katherine B.; Trudeau, Jeremiah J.; Small, Eric J.; Smith, Matthew R.
In European Urology Focus July 2022 8(4):958-967
Academic Journal
Saad, Fred ; Efstathiou, Eleni; Attard, Gerhardt; Flaig, Thomas W; Franke, Fabio; Goodman, Oscar B, Jr; Oudard, Stéphane; Steuber, Thomas; Suzuki, Hiroyoshi; Wu, Daphne; Yeruva, Kesav; De Porre, Peter; Brookman-May, Sabine; Li, Susan; Li, Jinhui; Thomas, Shibu; Bevans, Katherine B; Mundle, Suneel D; McCarthy, Sharon A; Rathkopf, Dana E
In The Lancet Oncology November 2021 22(11):1541-1559
Conference
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-7 Jul, 2023
Academic Journal
Fizazi, Karim; Tran, NamPhuong; Fein, Luis; Matsubara, Nobuaki; Rodriguez-Antolin, Alfredo; Alekseev, Boris Y; Özgüroğlu, Mustafa; Ye, Dingwei; Feyerabend, Susan; Protheroe, Andrew; Sulur, Giri; Luna, Yesenia; Li, Susan; Mundle, Suneel; Chi, Kim N
In The Lancet Oncology May 2019 20(5):686-700
Conference
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2022 IEEE International Symposium on the. :1-4 Jul, 2022
Conference
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2021 IEEE International Symposium on the. :1-4 Sep, 2021
Academic Journal
Zhi, Wanqing Iris; Dreyfus, Nechama; Lessing, Alexie; Galantino, Marylou; Piulson, Lauren; Kot, Kevin Liu; Li, Susan; Bao, Ting
The Oncologist. July, 2023, Vol. 28 Issue 7, p604, 5 p.
Academic Journal
Basch, Ethan; Autio, Karen; Ryan, Charles J; Mulders, Peter; Shore, Neal; Kheoh, Thian; Fizazi, Karim; Logothetis, Christopher J; Rathkopf, Dana; Smith, Matthew R; Mainwaring, Paul N; Hao, Yanni; Griffin, Thomas; Li, Susan; Meyers, Michael L; Molina, Arturo; Cleeland, Charles
In Lancet Oncology November 2013 14(12):1193-1199
Conference
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2020 IEEE International Symposium on the. :1-5 Jul, 2020
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[AR] Li, Susan
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