학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 17건 | 목록 1~10
Conference
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-3 Jul, 2018
Conference
In: 7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023, 7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023. (7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023, 2023)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, DTCO and Computational Patterning. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12052)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Design-Process-Technology Co-optimization XV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11614)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Design-Process-Technology Co-Optimization for Manufacturability XIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2019, 10962)
Conference
In: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2018, 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2018. (2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2018, 5 June 2018, :234-237)
Conference
In: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2018, 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2018. (2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2018, 5 June 2018, :121-123)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Design-Process-Technology Co-optimization for Manufacturability XI. (Proceedings of SPIE - The International Society for Optical Engineering, 2017, 10148)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Design-Process-Technology Co-Optimization for Manufacturability X. (Proceedings of SPIE - The International Society for Optical Engineering, 2016, 9781)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, 31st European Mask and Lithography Conference. (Proceedings of SPIE - The International Society for Optical Engineering, 2015, 9661)
검색 결과 제한하기
제한된 항목
[AR] Katakamsetty, U.
발행연도 제한
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