학술논문
'학술논문'
에서 검색결과 263건 | 목록
1~10
Academic Journal
Mazzetta, I.; Viti, L.; Rigoni, F.; Quaranta, S.; Gasparotto, A.; Barucca, G.; Palma, F.; Riello, P.; Cattaruzza, E.; Asgari, M.; Vitiello, M.; Irrera, F.
In Materials & Design May 2022 217
Academic Journal
In Solid State Electronics December 2021 186
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, April 2024, 155)
Academic Journal
Irrera, F.; Gazzanti Pugliese di Cotrone, M.A.; Gumiero, A.; Della Torre, L.; Picozzi, N.; Zampogna, A.; Patera, M.; Suppa, A.; Boscari, F.; Avogaro, A.
In: Sensors . (Sensors, March 2024, 24(5))
Academic Journal
In Microelectronics Reliability August-September 2015 55(9-10):1446-1449
Academic Journal
Lorenzi, P.; Rao, R.; Romano, G.; Kita, A.; Serpa, M.; Filesi, F.; Parisi, R.; Suppa, A.; Bologna, M.; Berardelli, A.; Irrera, F.
In Procedia Engineering 2015 120:324-327
Conference
2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2020 Joint International EUROSOI Workshop and International Conference on. :1-4 Sep, 2020
Conference
Manzini, A.; Inglese, P.; Caldi, L.; Cantoro, R.; Carnevale, G.; Coppetta, M.; Giltrelli, M.; Mautone, N.; Irrera, F.; Ullmann, R.; Bernardi, P.
2019 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2019 IEEE European. :1-6 May, 2019
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(5):2022-2027 May, 2020
Performance and Reliability Degradation of CMOS Image Sensors in Back-Side Illuminated Configuration
Academic Journal
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 8:765-772 2020
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[AR] Irrera, F.
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