학술논문
'학술논문'
에서 검색결과 37건 | 목록
1~10
Academic Journal
Mathur, R.; Bhargava, M.; Perry, H.; Cestero, A.; Frederick, F.; Smith, D.; Fisher, D.; Robson, N.; Cline, B.; Kulkarni, J.P.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):6731-6737 Dec, 2022
Conference
Mathur, R.; Bhargava, M.; Perry, H.; Cestero, A.; Frederick, F.; Hung, S.; Chao, C.; Smith, D.; Fisher, D.; Robson, N.; Xu, X.; Chandupatla, P.; Balachandran, R.; Sinha, S.; Cline, B.; Kulkarni, J. P.
2021 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2021 IEEE. :1-2 Apr, 2021
Conference
Sinha, S.; Hung, S; Fisher, D.; Xu, X.; Chao, C.; Chandupatla, P.; Frederick, F.; Perry, H.; Smith, D.; Cestero, A.; Safran, J.; Ayyavu, V.; Bhargava, M.; Mathur, R.; Prasad, D.; Katz, R.; Kinsbruner, A.; Garant, J.; Lubguban, J.; Knickerbocker, S.; Soler, V.; Cline, B.; Christy, R.; McLaurin, T.; Robson, N.; Berger, D.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :15.1.1-15.1.4 Dec, 2020
Conference
In: AIP Conference Proceedings , 2nd International Conference on Design, Energy, Materials and Manufacture 2021, ICDEMM 2021. (AIP Conference Proceedings, 14 March 2023, 2568)
Conference
International Test Conference, 2003. Proceedings. ITC 2003. International test conference Test Conference, 2003. Proceedings. ITC 2003. International. 1:773-782 2003
Conference
Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) International test conference 2000 Test Conference, 2000. Proceedings. International. :151-159 2000
Academic Journal
Keane, C.; Bissett, I.P.; Fearnhead, N.S.; Bordeianou, L.G.; Christensen, P.; Laurberg, S.; Espin Basany, E.; Mellgren, A.; Messick, C.; Orangio, G.R.; Verjee, A.; Wing, K.; An, V.; Bryant, A.; Byrne, C.; Chen, T.; Croft, S.; Clark, D.; Gladman, M.; Heriot, A.; Kariappa, S.; Keck, J.; Lubowski, D.; Dinning, P.; Khera, A.; Kirkwood, K.; Petersen, D.; Sloots, K.; Totten, B.; Weston, M.; Andersen, P.; Bachmann, C.; Barht, H.; Emmertsen, K.; Faaborg, P.; Gögenur, I.; Ingerslev, P.; Isaksen, D.; Iversen, H.; Iversen, L.; Jacobsen, K.; Jansen, T.; Jocobsen, I.; Juul, T.; Kjær, D.; Krogh, K.; Majgaard, M.; Mynster, A.; Neuenschwander, A.; Nielsen, C.; Nielsen, R.; Nielsen, M.; Nielsen, T.; Olsen, J.; Poulsen, B.; Rahr, H.; Snedker, B.; Sørensen, G.; Stolzenburg, T.; Vaabengaard, P.; Acheson, A.; Andreyev, J.; Bach, S.; Battersby, N.; Bradbury, J.; Brown, S.; Cecil, T.; Chapman, S.; Chapman, M.; Chave, H.; Cook, T.; Cuffy, L.; Davies, J.; Dawson, C.; Dixon, J.; Duff, S.; Edwards, C.; Geh, I.; Hamilton, C.; Hancock, L.; Harji, D.; Hill, J.; Holtham, S.; Jenkins, J.; Johnston, R.; Kapur, S.; Maxwell-Armstrong, C.; McArthur, D.; Moran, B.; Norton, C.; Nugent, K.; Pateman, L.; Perston, Y.; Rockall, T.; Sagar, P.; Saunders, M.; Sebag-Montefiore, D.; Senapati, A.; Singh, B.; Skaife, P.; Sykes, H.; Smart, N.; Taylor, C.; Thorpe, G.; Tierney, G.; Voyce, S.; Walsh, C.; Warren, O.; Wheeler, J.; Woodward, A.; Winter, D.; Abbott, S.; Beban, V.; Bennett, M.; Chadwick, T.; Collinson, R.; Corbett, S.; Dennett, E.; Eglinton, T.; Fraser, A.; Glue, J.; Hohaia, D.; Menzi, E.; O’Connor, M.; Stevenson, D.; Wells, C.; Wolyncewicz, S.; Woodfield, J.; Bence, K.; Boutros, M.; Brueseke, M.; DeKorte, J.; Floruta, C.; Francone, T.; Frederick, F.; Grasso, J.; Gurland, B.; Higgins, K.; Hull, T.; Keller, D.; Laffan, A.; Lovett, S.; Marlatt, J.; McAdams, D.; McCarthy, C.; Milch, H.; Natale, S.; Pappou, E.; Pulskamp, S.; Rich, M.; Savitt, L.; Shafi, M.; Steele, S.; Stein, S.; Tolbert, M.; Varma, M.; Vogler, S.; Vuong, T.; Wells, K.; Wexner, S.; Wo, J.; Wright, J.; Wunderlich, C.; Campbell, K.; Lim, M.; Moug, S.; Oliphant, R.; Labaka-Aretaga, I.; Ballester, C.; Belen-Bueno, A.; Vaquer-Casas, G.; Jerez, J.; Castillo, J.; Paniagua-Cayetano, G.; Codina-Cazador, A.; Blanco-Colino, R.; de la Portilla, F.; Pascual-Damieta, M.; Enriquez-Navascuez, J.M.; Martin- Fernández, M.; Araujo-Ferreiro, M.; Sanchez-García, C.; Vico-García, E.; Gallego-García, M.; Jimenez, L.M.; Martinez-Sanchez, C.; Carrillo-Moreno, J.; Muñoz, A.; Ramirez, L.; Vigorita, V.; Adams, R.; Cornish, J.; Davies, M.; Evans, M.; Torkington, J.; Turner, J.
In: ANZ Journal of Surgery . (ANZ Journal of Surgery, 1 March 2020, 90(3):300-307)
Conference
IEEE International Conference on Test, 2005. International Test Conference Test Conference, 2005. Proceedings. ITC 2005. IEEE International. :10 pp.-716 2005
Conference
In: Proceedings of the European Test Workshop , Proceedings - 2021 IEEE European Test Symposium, ETS 2021. (Proceedings of the European Test Workshop, 24 May 2021, 2021-May)
Conference
In: Proceedings of the 2019 International Conference on Industrial Engineering and Systems Management, IESM 2019 , Proceedings of the 2019 International Conference on Industrial Engineering and Systems Management, IESM 2019. (Proceedings of the 2019 International Conference on Industrial Engineering and Systems Management, IESM 2019, September 2019)
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[AR] Frederick, F.
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