학술논문

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발행년	- (예 : 2010-2015)

전체선택

On the Spatial Resolution of a Piezoresonance Probe Sensor with a Tungsten Needle

Academic Journal

Gorbenko, O.M.; Zhukov, M.V.; Lukashenko, S.Y.; Pichahchi, S.V.; Sapozhnikov, I.D.; Felshtyn, M.L.; Golubok, A.O.

In: Journal of Surface Investigation. (Journal of Surface Investigation, June 2023, 17(3):578-584)

JCR 저널정보 Scopus Find it@PNU

Behavioral Features of the Approach Curve of a Scanning Ion-Conductance Microscope

Academic Journal

Lukashenko, S.Y.; Gorbenko, O.M.; Zhukov, M.V.; Pichahchi, S.V.; Sapozhnikov, I.D.; Felshtyn, M.L.; Golubok, A.O.

In: Journal of Surface Investigation. (Journal of Surface Investigation, June 2023, 17(3):585-591)

JCR 저널정보 Scopus Find it@PNU

Resonant Mass Detector Based on Carbon Nanowhiskers with Traps for Nanoobjects Weighing

Academic Journal

Lukashenko, S.Y.; Mukhin, I.S.; Komissarenko, F.E.; Golubok, A.O.; Gorbenko, O.M.; Sapozhnikov, I.D.; Felshtyn, M.L.; Uskov, A.V.

In: Physica Status Solidi (A) Applications and Materials Science. (Physica Status Solidi (A) Applications and Materials Science, 7 November 2018, 215(21))

Full Text (Wiley Journals) Full Text (Wiley-DB) Web of Science JCR 저널정보 Scopus Find it@PNU

Scanning ion-conductance microscope with modulation of the sample position along the Z-coordinate and separate Z-axial and lateral (X, Y) scanning

Conference

Zhukov, M.V.; Lukashenko, S.Y.; Sapozhnikov, I.D.; Felshtyn, M.L.; Gorbenko, O.M.; Golubok, A.O.

In: Journal of Physics: Conference Series, 8th International School and Conference "Saint Petersburg OPEN 2021": Optoelectronics, Photonics, Engineering and Nanostructures, SPbOPEN 2021. (Journal of Physics: Conference Series, 6 December 2021, 2086(1))

Full Text (ProQuest Central) Full Text (IOP Science) Full Text (IOP) Open Access (EBSCO) Open Access (IOP) Scopus Find it@PNU

Features of combining scanning probe microscope with optical and scanning electron microscopes

Conference

Sapozhnikov, I.D.; Gorbenko, O.M.; Felshtyn, M.L.; Zhukov, M.V.; Golubok, A.O.

In: IOP Conference Series: Materials Science and Engineering, SPM�2019�RCWDFM Joint International Conference. (IOP Conference Series: Materials Science and Engineering, 16 December 2019, 699(1))

Full Text (ProQuest Central) Full Text (IOP Science) Full Text (IOP) Open Access (EBSCO) Open Access (IOP) Scopus Find it@PNU

Local diagnostics of the doping degree of a semiconductor surface using scanning microscope of electrostatic forces. Numerical simulation

Academic Journal

Felshtyn, M.L.; Golubok, A.O.

In: Surface Investigation X-Ray, Synchrotron and Neutron Techniques. (Surface Investigation X-Ray, Synchrotron and Neutron Techniques, 2000, 15(7):1011-1016)

JCR 저널정보 Scopus Find it@PNU

The combination of scanning electron and scanning probe microscopy

Conference

Sapozhnikov, I.D.; Gorbenko, O.M.; Felshtyn, M.L.; Golubok, A.O.

In: AIP Conference Proceedings, State-of-the-Art Trends of Scientific Research of Artificial and Natural Nanoobjects, STRANN 2016: Proceedings of the 5th International Conference "State-of-the-Art Trends of Scientific Research of Artificial and Natural Nanoobjects". (AIP Conference Proceedings, 17 June 2016, 1748)

Full Text (AIP) Scopus Find it@PNU

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