학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 27건 | 목록 1~10
Academic Journal
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 71:1-11 2022
Academic Journal
In: Acta IMEKO. (Acta IMEKO, 2023, 12(1))
Academic Journal
In: Sensors (Switzerland). (Sensors (Switzerland), 2 September 2020, 20(18):1-13)
Conference
In: Conference Record - IEEE Instrumentation and Measurement Technology Conference, I2MTC 2023 - 2023 IEEE International Instrumentation and Measurement Technology Conference: Rising Above Covid-19, Proceedings. (Conference Record - IEEE Instrumentation and Measurement Technology Conference, 2023, 2023-May)
Conference
In: Conference Record - IEEE Instrumentation and Measurement Technology Conference, I2MTC 2023 - 2023 IEEE International Instrumentation and Measurement Technology Conference: Rising Above Covid-19, Proceedings. (Conference Record - IEEE Instrumentation and Measurement Technology Conference, 2023, 2023-May)
Conference
In: 2022 IEEE International Workshop on Metrology for Automotive, MetroAutomotive 2022 - Proceedings, 2022 IEEE International Workshop on Metrology for Automotive, MetroAutomotive 2022 - Proceedings. (2022 IEEE International Workshop on Metrology for Automotive, MetroAutomotive 2022 - Proceedings, 2022, :116-121)
Conference
In: 2022 IEEE International Workshop on Metrology for Automotive, MetroAutomotive 2022 - Proceedings, 2022 IEEE International Workshop on Metrology for Automotive, MetroAutomotive 2022 - Proceedings. (2022 IEEE International Workshop on Metrology for Automotive, MetroAutomotive 2022 - Proceedings, 2022, :122-127)
Conference
In: 2022 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd 4.0 and IoT 2022 - Proceedings, 2022 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd 4.0 and IoT 2022 - Proceedings. (2022 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd 4.0 and IoT 2022 - Proceedings, 2022, :354-359)
Conference
In: 2022 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd 4.0 and IoT 2022 - Proceedings, 2022 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd 4.0 and IoT 2022 - Proceedings. (2022 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd 4.0 and IoT 2022 - Proceedings, 2022, :360-365)
검색 결과 제한하기
제한된 항목
[AR] Fedullo, T.
발행연도 제한
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