학술논문
'학술논문'
에서 검색결과 22건 | 목록
1~10
Conference
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Conference
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023. :1-6 Apr, 2023
Conference
Munger, Benjamin; Wilcox, Kathy; Sniderman, Jeshuah; Tung, Chuck; Johnson, Brett; Schreiber, Russell; Henrion, Carson; Gillespie, Kevin; Burd, Tom; Fair, Harry; Johnson, David; White, Jonathan; McLelland, Scott; Bakke, Steven; Olson, Javin; McCracken, Ryan; Pickett, Matthew; Horiuchi, Aaron; Nguyen, Hien; Jackson, Tim H
2023 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2023 IEEE International. :38-39 Feb, 2023
Conference
2009 10th International Workshop on Microprocessor Test and Verification Microprocessor Test and Verification (MTV), 2009 10th International Workshop on. :107-113 Dec, 2009
Conference
Grenat, Aaron; Sundaram, Sriram; Kosonocky, Stephen; Rachala, Ravinder; Sambamurthy, Sriram; Liepe, Steven; Rodriguez, Miguel; Burd, Tom; Clark, Adam; Austin, Michael; Naffziger, Samuel
2016 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2016 IEEE International. :74-75 Jan, 2016
Conference
2008 IEEE/ACM International Conference on Computer-Aided Design Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on. :797-802 Nov, 2008
Conference
2012 Symposium on VLSI Technology (VLSIT) VLSI Technology (VLSIT), 2012 Symposium on. :147-148 Jun, 2012
Conference
Proceedings of the 1998 international symposium on Low power electronics and design. :76-81
Academic Journal
Sundaram, Sriram; Grenat, Aaron; Naffziger, Samuel; Burd, Tom; Kosonocky, Stephen; Liepe, Steve; Rachala, Ravinder; Rodriguez, Miguel; Austin, Michael; Sambamurthy, Sriram
IEEE Journal of Solid-State Circuits; Jan2017, Vol. 52 Issue 1, p89-97, 9p
Academic Journal
Munger, Benjamin; Akeson, David; Arekapudi, Srikanth; Burd, Tom; Fair, Harry R.; Farrell, Jim; Johnson, Dave; Krishnan, Guhan; McIntyre, Hugh; McLellan, Edward; Naffziger, Samuel; Schreiber, Russell; Sundaram, Sriram; White, Jonathan; Wilcox, Kathryn
IEEE Journal of Solid-State Circuits; Jan2016, Vol. 51 Issue 1, p105-116, 12p
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[AR] Burd, Tom
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