학술논문
'학술논문'
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Academic Journal
Thesberg, M.; Stanojevic, Z.; Baumgartner, O.; Kernstock, C.; Leonelli, D.; Barci, M.; Wang, X.; Zhou, X.; Jiao, H.; Donadio, G.L.; Garbin, D.; Witters, T.; Kundu, S.; Hody, H.; Delhougne, R.; Kar, G.; Karner, M.
In Solid State Electronics January 2023 199
Academic Journal
Barci, M.; Leonelli, D.; Zhou, X.; Wang, X.; Garbin, D.; Jayakumar, G.; Witters, T.; Vergel, N.F.; Kundu, S.; Palayam, S.V.; Jiao, H.; Wu, H.; Kar, G.S.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(11):6106-6112 Nov, 2022
Report
Thesberg, M.; Stanojevic, Z.; Baumgartner, O.; Kernstock, C.; Leonelli, D.; Barci, M.; Wang, X.; Zhou, X.; Jiao, H.; Donadio, G. L.; Garbin, D.; Witters, T.; Kundu, S.; Hody, H.; Delhougne, R.; Kar, G.; Karner, M.
Solid-State Electronics, Volume 199, January 2023, 108504
Conference
Molas, G.; Piccolboni, G.; Barci, M.; Traore, B.; Guy, J.; Palma, G.; Vianello, E.; Blaise, P.; Portal, J. M.; Bocquet, M.; Levisse, A.; Giraud, B.; Noel, J. P.; Harrand, M.; Bernard, M.; Roule, A.; De Salvo, B.; Perniola, L.
2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) VLSI Technology, Systems and Application (VLSI-TSA), 2016 International Symposium on. :1-2 Apr, 2016
Academic Journal
Barci, M.; Molas, G.; Cagli, C.; Vianello, E.; Bernard, M.; Roule, A.; Toffoli, A.; Cluzel, J.; De Salvo, B.; Perniola, L.
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 4(5):314-320 Sep, 2016
Conference
Molas, G.; Vianello, E.; Dahmani, F.; Barci, M.; Blaise, P.; Guy, J.; Toffoli, A.; Bernard, M.; Roule, A.; Pierre, F.; Licitra, C.; De Salvo, B.; Perniola, L.
2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :6.1.1-6.1.4 Dec, 2014
Conference
Barci, M.; Guy, J.; Molas, G.; Vianello, E.; Toffoli, A.; Cluzel, J.; Roule, A.; Bernard, M.; Sabbione, C.; Perniola, L.; De Salvo, B.
2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :5E.3.1-5E.3.4 Jun, 2014
Conference
Barci, M.; Fantini, A.; Redolfi, A.; Kundu, S.; Belmonte, A.; Devulder, W.; Opsomer, K.; Delhougne, R.; Goux, L.; Sankar Kar, G.; Witters, T.
In: 2018 IEEE 10th International Memory Workshop, IMW 2018 , 2018 IEEE 10th International Memory Workshop, IMW 2018. (2018 IEEE 10th International Memory Workshop, IMW 2018, 19 June 2018, :1-4)
Conference
Barci, M.; Molas, G.; Toffoli, A.; Bernard, M.; Roule, A.; Cagli, C.; Cluzel, J.; Vianello, E.; De Salvo, B.; Perniola, L.
In: 2015 IEEE 7th International Memory Workshop, IMW 2015 , 2015 IEEE 7th International Memory Workshop, IMW 2015. (2015 IEEE 7th International Memory Workshop, IMW 2015, 2 July 2015)
Conference
Molas, G.; Vianello, E.; Barci, M.; Blaise, P.; Guy, J.; Toffoli, A.; Bernard, M.; Roule, A.; Pierre, F.; Licitra, C.; De Salvo, B.; Perniola, L.; Dahmani, F.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2014 IEEE International Electron Devices Meeting, IEDM 2014. (Technical Digest - International Electron Devices Meeting, IEDM, 20 February 2015, 2015-February(February):6.1.1-6.1.4)
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[AR] Barci, M.
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